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Pre-owned Fab Metrology , Inspection & QC Equipment for sale by fabsurplus.com

Please find below a list of Used Fab Metrology , Inspection and QC Equipment for sale by fabsurplus.com .Click on any listed item of Fab Metrology , Inspection and QC Equipment to see further data. Semiconductor metrology and wafer defect detection are vital in the semiconductor fabrication process. They provide the means to monitor and control the quality of each step in a sub-microscopic manufacturing sequence which can have hundreds of steps and a processing time of several weeks.


SDI ID Manufacturer Model Description Version Vintage Q. ty Sales Conditions Lead Time
113948 4D Technology AccuFiz Fizeau Laser Interferometer 1 inquire
103225 ADE NanoMapper FA Nano-Defects Inspection System 300 mm 1 inquire immediately
108791 ADE 5810 Non-Contact Capacitance Gauging Module with 2ea ADE 2248 Probes 1 inquire
108792 ADE 6033 Wafer Thickness Tester 1 inquire
108793 ADE 6033T Wafer Thickness Tester 1 inquire
109554 ADE NANOMAPPER Phase Shift nano defect inspection system 300 mm 01.11.2001 1 as is where is immediately
113388 ADE 9350 Film stress measurement 150 mm 01.06.1993 1 as is where is
114043 ADE AFS-3220 Wafer Characterization 300 mm 1 as is where is
112643 Anatech Ltd Hummer 6.6T Sputter Coater for sample prep 1 as is where is
83514 Applied Materials Opal 7830i Enhanced CD MEASUREMENT SEM FOR 200 mm / 150 mm wafers 100 mm to 200 mm 01.05.1997 1 as is where is immediately
93395 Applied Materials UVision 600SP DUV Brightfield Wafer Defect Inspection System 300 mm 01.06.2008 1 as is where is immediately
108556 Applied Materials Uvision 600SP Brightfield Inspection System 300 mm 01.05.2008 1 as is where is immediately
109088 Applied Materials SEMVISION G3 Lite Defect Review SEM 300 mm 01.08.2007 1 as is where is 4 months
109112 Applied Materials Verity-2 CD MEASUREMENT SEM 200 mm 01.06.2004 1 3 months
110661 APPLIED MATERIALS UVISION 5 Bright Field Inspection 300 mm 01.06.2011 1 as is where is immediately
110684 Applied Materials Sting Dark Field Defect Inspection 300 mm 01.06.2009 1 as is where is immediately
110687 Applied Materials Aera 2 Photomask Inspection System 300 mm 01.06.2009 1 as is where is immediately
111655 Applied Materials VeritySEM 4i SEM - Critical Dimension (CD) Measurement 300mm 1 as is where is
112111 Applied Materials Orbot WF720 Wafer Inspection system 125 mm 1 as is where is
112119 Applied Materials SEMVision G3 Lite Metrology DR-SEM 300 mm 01.06.2007 1 as is where is
112120 Applied Materials UVision 4 Metrology Bright Field 300 mm 01.06.2009 1 as is where is
112121 Applied Materials UVision 4 Metrology Bright Field 300 mm 1 as is where is
113185 Applied Materials Verity 6i CD-SEM 300 mm 01.06.2014 1 as is where is 2 months
113206 Applied Materials VeritySEM 4i+ CD SEM 300 mm 1 as is where is
113283 Applied Materials Verity 6i CD-SEM 200 mm 01.06.2014 1 as is where is 2 months
114057 Applied Materials ComPLUS MP Darkfield Inspection 200 mm 1 as is where is
114058 Applied Materials ComPLUS MP Darkfield Inspection 200 mm 1 as is where is
114076 Applied Materials VeritySEM 4i+ SEM - Critical Dimension (CD) Measurement 300 mm 1 as is where is
114077 Applied Materials VeritySEM 4i+ SEM - Critical Dimension (CD) Measurement 300 mm 1 as is where is
114078 Applied Materials VeritySEM 4i+ SEM - Critical Dimension (CD) Measurement 300 mm 1 as is where is
114226 Applied Materials Semvision CX Review SEM 300 mm 01.06.2000 1 inquire
114227 Applied Materials Verity SEM CD SEM 300 mm 01.06.2005 1 inquire
114228 Applied Materials Semvision Review SEM 300 mm 01.06.2001 1 inquire
114229 Applied Materials Semvision G3 Lite Review SEM 300 mm 01.06.2006 1 inquire
114230 Applied Materials Semvision GX Review SEM 300 mm 01.06.2007 1 inquire
114231 Applied Materials Semvision GX Review SEM 300 mm 01.06.2007 1 inquire
114232 Applied Materials Semvision G2 Review SEM 200 mm SMIF 01.06.2002 1 inquire
114233 Applied Materials Reticle NanoSEM 3D Reticle Inspection SEM Reticle 01.06.2004 1 inquire
114234 Applied Materials Semvision CX Review SEM 200 mm 1 inquire
114235 Applied Materials Semvision G2 FIB FIB SEM 300 mm 01.06.2004 1 inquire
114236 Applied Materials Semvision CX / Opal 9300 Review SEM 200 mm 01.06.2001 1 inquire
114237 Applied Materials Semvision GX Review SEM 300 mm 01.06.2009 1 inquire
114238 Applied Materials Semvision G2 Review SEM 300 mm 01.06.2003 1 inquire
109159 ASML YieldStar S-250 Overlay Measurement System 300 mm 1 as is where is immediately
111668 ASML YieldStar S-250 Overlay Measurement System 300mm 1 as is where is
114085 ASML YieldStar S-100B Overlay Measurement System 300 mm 1 as is where is
114086 ASML YieldStar S-250 Overlay Measurement System 300 mm 1 as is where is
108153 ATI OAK-1 Auto Scope Inspection 01.06.2013 1 as is where is
98447 August 3DI-8000 wafer bump inspection 300 mm 1 as is where is immediately
98448 August NSX-95 2D Auto inspection system / Macro defect inspection system 200 mm 4 as is where is immediately
101818 August NSX-105 Wafer Bumping Inspection System / Macro defect inspection 200 mm 1 as is where is immediately
108734 Bio-Rad Q8 Overlay Metrology 1 as is all rebuilt 1 month
108735 Bio-Rad QS-1200 FT-IR Spectrometer 100-200 mm 01.05.2004 1 as is where is immediately
108736 Bio-Rad QS-300 FT-IR Spectrometer 1 as is where is immediately
108800 BIO-RAD ECN4900PC Profilers, 2ea Available - Parts Only 1 inquire
108801 BIO-RAD Q7 Overlay Metrology Tool 1 inquire
108802 BIO-RAD Q8 Overlay Metrology / CD Measurement Tool for up to 200mm Wafers 1 inquire
108737 BIORAD Q5 Overlay Metrology Tool 200 mm 2 as is where is immediately
113452 Biorad QS 2200 M Boron and phosphor dopant measurement 150 mm 01.06.1998 1 as is where is
113453 Biorad QS 2200 M Boron and phosphor dopant measurement 150 mm 01.06.1999 1 as is where is
108025 BRUKER VERTEX 80V FT-IR Spectrometer 1 as is where is
110694 BRUKER D8 Fabline X-Ray Diffraction wafer measurement 300 mm 01.06.2008 1 as is where is immediately
113312 Bruker Contour GT-K0 3D Optical PROFILER microscope 200 mm 01.06.2012 1 as is where is immediately
113454 Bruker Dimension Icon Atomic force microscope 150 mm 01.03.2014 1 as is where is immediately
113455 Bruker GT-X Contour Profiler measurement 3D Microscope 150 mm 01.06.2013 1 as is where is immediately
113456 Bruker QC3 XRD measurement 150 mm 1 as is where is
106645 CAMECA EX300 Secondary Ion Mass Spectrometer 300 mm 1 as is where is immediately
114087 CAMECA EX-300 Implant Dosing Measurement 300 mm 1 as is where is
112137 Camtek EM3i Metrology Macro Inspection 300 mm 1 as is where is
112019 CDE Resmap 463 Resistivity measurement 300 mm 01.06.2010 2 as is where is immediately
112150 CDE RESMAP 168 Resistivity Measurement 150 mm 1 as is where is
113474 CDE 463 Resistivity Measurement 150 mm 01.06.2001 1 as is where is
113954 CDE ResMap 473 Resistivity Mapping System 300 mm 1 inquire
109533 Creative Design Engineering (CDE) ResMap 178 Resistivity Mapping System Up to 200 mm 01.06.2012 1 as is where is immediately
113043 CYBER OPTICS CYBERSCAN C212/110 Laser Measure 200 mm 1 as is where is
110675 Dektak 3ST Stylus Profileometer 150 mm 1 as is all rebuilt immediately
112718 Denton DESK II Sputter Coater for sample prep 1 as is where is
106200 EDAX Eagle 2 Micro-probe EDX analyser Laboratory 01.06.2000 1 as is where is immediately
111383 FEI Quanta 200 3D Dual-Beam FIB SEM with Omniprobe, LMIS, BSD Laboratory 01.06.2005 1 as is where is immediately
112180 FEI DB835 Dual beam Fib SEM 300 mm 1 as is where is
112181 FEI Tecnai G2 F30 Metrology TEM electron microscope 300 mm 1 as is where is immediately
113295 FEI Altura 855 Dual beam FIB SEM 200 mm 1 as is where is immediately
114102 FEI Helios NanoLab 400 Focused Ion Beam (FIB) 300 mm 1 as is where is
108710 Fogale DeepProbe 300M Low Coherence IR wafer interferometry 200 mm and 300 mm 01.06.2014 1 inquire
108817 FOUR DIMENSIONS CV92A Semi Auomatic Mercury Probe CV Plotter up to 200 mm 01.06.1998 1 inquire immediately
110723 Four Dimensions CVMAP 3092-A Wafer CV mapper - Mercury Probe 100-200 MM 01.06.2005 1 as is where is immediately
93084 FSM SYMPHONYMC Life Time 300 MM 1 as is where is
113774 FSM 8800 Wafer Stress measurement 150 mm 1 as is where is
96543 Gaertner L115C-8 Ellipsometer, cassette to cassette 100-200 mm 28.02.1995 1 as is where is immediately
112766 Gaertner L116B Ellipsometer 1 as is where is
112767 Gaertner L2W16E.1550 Ellipsometer 150 mm 1 as is where is
113775 Gaertner L116 Ellipsometer 150 mm 01.06.1987 1 as is where is
108751 GCA TROPEL 9000 Wafer Flatness Analyzer 1 as is where is
71907 Hamamatsu C7103 PC Controlled IC Back-side Lapping and Wafer Grinding System 200 mm and packages 01.09.2001 1 as is where is immediately
112769 Hiden Analytical HPR-20 QIC Atmospheric/Chamber Gas Analysis System Facilities 1 as is where is
52166 Hitachi 545-5515 DC power supply module for CD SEM spares 1 as is where is immediately
52167 Hitachi 6280H Power Supply Module 4channels spares 1 as is where is immediately
52168 Hitachi 545-5540 Power Supply unit for CD SEM Spares 1 as is where is immediately
52312 Hitachi 545-5522 VG board for CD SEM spares 31.05.1994 1 as is where is immediately
52339 Hitachi 545-5521 EVAC PCB FOR HITACHI CD-SEM spares 31.05.1994 1 as is where is immediately
52340 Hitachi 545-5537 IP-PC2 for cd-sem spares 31.05.1994 1 as is where is immediately
52343 Hitachi 377-7592 Power Supply Module for CD SEM spares 31.05.1994 1 as is where is immediately
53054 HITACHI 6280H (SPARES) SORD Computer for cd sem system spares 1 as is where is immediately
60939 HITACHI S4160 Scanning electron microscope 31.05.1996 1 as is where is
74794 Hitachi S5200 FE SEM with EDX Inspection 31.05.2005 1 as is where is immediately
83849 Hitachi S4500 Type I FE SEM Laboratory 01.05.1995 1 inquire immediately
91397 HITACHI IS2700SE Dark Field inspection 1 as is where is
91403 HITACHI S-5000 FE SEM 150 mm,200 mm 1 as is where is
91404 HITACHI S-5000 FE SEM 150 mm,200 mm 1 as is where is
91405 HITACHI S-5000 FE SEM 150 mm,200 mm 1 as is where is
91407 HITACHI S-5000 FE SEM 150 mm,200 mm 1 as is where is
91408 HITACHI S-5000 FE SEM 150 mm,200 mm 1 as is where is
98269 HITACHI RS 4000 Defect Review SEM 300 mm 01.05.2003 1 as is where is immediately
98270 HITACHI RS 4000 Defect Review SEM 300 mm 01.05.2003 1 as is where is immediately
103525 HITACHI S4700-l Scanning Electron Microscope Laboratory 31.05.2004 1 as is where is immediately
103526 HITACHI S4700-ll FE Sem with Horriba EMAX EDX Laboratory 31.05.2001 1 as is where is immediately
106663 HITACHI IS3000SE E-beam wafer inspection 300 mm 01.06.2006 1 as is where is immediately
106665 HITACHI LS9000 Wafer Surface Inspection 300 mm 01.06.2010 1 as is where is
108027 HITACHI N-6000 NANO PROBER Laboratory 01.09.2007 1 as is where is
108072 Hitachi S-6280H CD SEM 1 as is where is
108159 HITACHI S4700II FE SEM with EDAX (Detecting Unit) 1 as is where is
108568 HITACHI LS9000 Wafer Surface Inspection System 300mm 01.06.2010 1 as is where is immediately
108752 HITACHI S7000 CD SEM 150 mm 01.05.1989 1 as is where is immediately
109287 Hitachi SU 8010 Ultra High Resolution Field Emission Scanning Electron Microscope 100 mm 01.06.2007 1 as is where is immediately
109555 Hitachi IS3000 DARK FIELD INSPECTION 300 mm 01.05.2007 1 as is where is
109556 Hitachi HD2300 STEM (Scanning Transmission Electron Microscope) Laboratory 01.06.2006 1 as is where is immediately
109561 Hitachi S5500 HIGH RESOLUTION INSPECTION SEM Laboratory 01.06.2014 1 as is where is immediately
109568 Hitachi CG-4100 Critical Dimension (CD) Measurement SEM 300 mm 01.06.2012 1 as is where is immediately
109569 Hitachi CG-4000 Critical Dimension (CD) Measurement SEM 300 mm 01.06.2010 1 as is where is immediately
110766 Hitachi S-9260A CD Measurement SEM 1 as is where is immediately
110781 Hitachi S-7840 High Resolution Imaging and CD-SEM 150 mm to 200 mm 01.09.2000 1 inquire immediately
111745 Hitachi S-4800 FE SEM 300mm 01.06.0220 1 as is where is immediately
111747 Hitachi S-5500 FE SEM 300mm 1 as is where is
111748 Hitachi S-5500 FE SEM 300mm 1 as is where is
112183 Hitachi CG4100 Metrology CD SEM 300 mm 01.06.2008 1 as is where is
112184 Hitachi CG4100 Metrology CD SEM 300 mm 01.06.2011 1 as is where is
112185 Hitachi HD2300 Metrology STEM 300 mm 01.06.2006 1 as is where is
112186 Hitachi IS3200SE Metrology Dark field inspection 300 mm 01.06.2010 1 as is where is
112187 Hitachi IS3200SE Metrology Dark Field Inspection 300 mm 01.06.2010 1 as is where is
112188 Hitachi IS3200SE Metrology Dark Field Inspection 300 mm 01.06.2010 1 as is where is
112190 Hitachi RS5000 Metrology Resistivity Measurement 300 mm 01.06.2007 1 as is where is
112191 Hitachi RS6000 Metrology Resistivity Measurement 300 mm 01.06.2014 1 as is where is
112192 Hitachi RS6000 Metrology Resistivity Measurement 300 mm 01.06.2014 1 as is where is
112193 Hitachi S-5200 Metrology FE-SEM 200 mm 01.06.2001 1 as is where is
112194 Hitachi S-5500 Metrology FE-SEM 300 mm 01.06.2006 1 as is where is
112195 Hitachi S-5500 Metrology FE-SEM 300 mm 01.06.2006 1 as is where is
113064 HITACHI IS3200SE Wafer E-BEAM Inspection System 300 mm 01.06.2010 1 as is where is immediately
113066 HITACHI NB-5000 FIB Sem N/A 01.06.2011 1 as is where is
113068 HITACHI S-5000 FE Sem 150 mm,200 mm 01.06.1996 1 as is where is
113069 HITACHI S-5500 FE Sem N/A 1 as is where is
113070 HITACHI S-5500 FE Sem 300 mm 1 as is where is
113282 Hitachi S-9300 High Resolution CD-SEM Fully Refurbished and Operational 200 MM OR 300 MM 1 inquire immediately
113296 Hitachi S-8840 CD SEM - For spares use 1 as is where is immediately
113306 Hitachi S5500 High Resolution FE SEM Laboratory 1 as is where is immediately
113319 Hitachi S-4700 Scanning Electron Microscope 01.06.2001 1 as is where is immediately
113513 Hitachi S 9220 CD measurement SEM 150 mm 01.06.2000 1 as is where is immediately
113779 HITACHI Hitachi 8840 Metrology CD Measurement CD-SEM 150 mm 01.06.1997 1 as is where is
113780 HITACHI Hitachi 8840 Metrology CD Measurement CD-SEM 150 mm 01.06.1997 1 as is where is immediately
114106 Hitachi S-9220 Critical Dimension (CD) Measurement Scanning Electron Microscope 150 mm 01.02.2002 1 as is where is immediately
109114 HMI EScan 400XP E-Beam wafer inspection system 300 mm 01.06.2010 2 as is where is immediately
109115 HMI EScan EP3 E-Beam wafer inspection system 300 mm 01.06.2010 2 as is where is immediately
114025 HMI eScan 400 E-beam Defect Inspection 300 MM 01.06.2011 1 as is where is
112196 Horiba PR-PD2 Metrology Reticle Inspection 300 mm 01.06.2013 1 as is where is
108161 HP 4145B CV Measurement 1 as is where is
112770 HYBOND 616-001 Ultrasonic Peg Bonder ASSEMBLY 01.06.1997 1 as is where is
108819 HYPERVISION Visionary 2 Emmission Microscope with Karl Suss PM-8 Analytical Prober 1 inquire
112771 Inficon QUADREX 200 Residual Gas Analyzer Facilities 1 as is where is
112772 Inficon Transpector CIS Residual Gas Analyzer Facilities 1 as is where is
112773 Inficon TRANSPECTOR CIS2 Residual Gas Analyzer Facilities 1 as is where is
106504 Irvine Optical Auto Wafer Loader Microscope Inspection WAFER INSPECTION MICROSCOPE WITH AUTOLOADER 200 mm 01.06.1990 1 as is where is immediately
91419 J.A Woollam VUV-VASE (Gen II) Ellipsometer 300 mm 1 as is where is
91420 J.A Woollam VUV-VASE VU302 (Gen I) Ellipsometer 200 mm 31.05.2001 1 as is where is
113072 J.A Woollam VUV-VASE (Gen II) Spectroscopic Ellipsometers 300 mm 1 as is where is
91424 JEOL JSM-6700F FE SEM 1 as is where is
108164 JEOL JSM-6340F FE Sem 1 as is where is
108822 JEOL JSM-6600F Scanning Electron Microscope 1 inquire
108907 JEOL JEM3200FS High Resolution TEM Laboratory 01.05.2006 1 as is where is immediately
109185 JEOL JEM-2010F TEM Laboratory 1 as is where is
109558 JEOL JSM-7500F SEM Laboratory 01.05.2009 1 as is where is immediately
110627 JEOL JSM-6460LV Scanning Electron Microscope Laboratory 1 as is where is
113073 JEOL JSM-5600 CD Sem N/A 01.06.1999 1 as is where is
113074 JEOL JSM-6340F FE Sem N/A 1 as is where is
113075 JEOL JWS-7500E SEM 200 mm 1 as is where is
113076 JEOL JWS-7515 SEM N/A 1 as is where is
113313 JEOL JWS7550 SEM Wafer inspection 1 as is where is immediately
114026 JEOL JWS-7515 Wafer Inspection System 200 MM 1 as is where is
114107 JEOL JFS-9815 Focused Ion Beam System 200 mm 1 as is where is
114108 JEOL JFS-9855S Focused Ion Beam System 200 mm 1 as is where is
114109 JEOL JWS-7555 SEM - Defect Review (DR) 200 mm 1 as is where is
114110 JEOL JWS-7555S SEM - Defect Review (DR) 200 mm 1 as is where is
91427 Jordan Valley JVX 6200 X-ray metrology (X-Ray Reflectivity) 300 mm 1 as is where is
99830 JORDAN VALLEY JVX6200I X-ray Metrology System 300 mm 28.02.2011 1 as is where is immediately
100917 Jordan Valley JVX6200 X-Ray Inspection System 300 mm 31.05.2010 1 as is where is
113782 JORDAN VALLEY 5200 Metrology XRF 150 mm 01.06.2003 1 as is where is
114111 Jordan Valley JVX 7200 X-ray Fluorescence Spectrometer 300 mm 1 as is where is
101693 KLA ASET-F5x Thin Film Measurement System 150 mm / 200 MM / 300 MM 01.06.2003 1 as is where is immediately
106865 KLA 2830 (PARTS) EFEM ONLY with Yaskawa XURCM9206 robot 300 mm 01.02.2010 1 as is where is immediately
106968 KLA SP2 (spare parts) Complete set of calibration standard wafers for a KLA SP2 200 mm 01.11.2022 1 inquire immediately
108009 KLA UV1250SE Wafer Film measurement / Ellipsometer 200 mm 01.10.1996 1 as is where is immediately
108569 KLA 2131 Inspection System 200 mm 01.05.1995 1 as is where is immediately
108775 KLA AlphaStep 300 Profilometer 1 inquire
109106 KLA Surfscan AIT 3 Wafer particle Inspection 200 mm 01.06.2005 1 as is where is immediately
110659 KLA UV1250SE Thin film meansurement system 125 mm - 200 mm 01.08.1998 1 as is where is immediately
110660 KLA 7700 Surfscan wafer particle detection system 100 - 200 mm 1 as is where is immediately
110668 KLA UV1280SE Thin Film Thickness Measurement System / Ellipsometer Up to 200 mm 01.01.2000 1 as is where is immediately
110679 KLA Surfscan 6400 Unpatterned wafer surface particle inspection system 100-200 MM 01.06.1994 1 inquire immediately
110686 KLA eDR-5200 PLUS Defect Review Sem WITH DEFECT CLASSIFICATION CAPABILITY 300 mm 01.06.2009 1 as is where is immediately
110751 KLA OP 2600 THIN FILM MEASUREMENT 200 mm 1 as is where is immediately
110786 KLA SP1-TBI Wafer Particle Detection System (Surfscan) 200 mm 1 inquire immediately
110787 KLA SP1-TBI Wafer Particle Detection System (Surfscan) 200 mm / 300 mm 1 inquire immediately
110788 KLA SP1-TBI Wafer Particle Detection System (Surfscan) 200 mm 1 inquire immediately
111346 KLA Quantox XP Electrical Measurement 300 mm 01.10.2006 1 as is where is immediately
111348 KLA P16 Plus Profileometer 200 mm 01.06.2005 1 as is where is immediately
111450 KLA ZETA 20 3D Optical Profiling Microscope 200 mm 01.08.2022 1 as is where is immediately
111561 KLA Spectra-FX100 Thin Film Measurement System 300 mm 01.06.2012 3 as is where is immediately
111565 KLA Spectra-CD-100 Thin Film Measurement System 300 mm 01.12.2004 1 as is where is immediately
111567 KLA Archer 500 LCMU Overlay Measurement System 300 mm 01.01.2016 1 as is where is immediately
111597 KLA Surfscan 6220 Wafer Particle Detection System 200 mm 01.07.1997 1 as is where is immediately
111598 KLA AlphaStep 500 Stylus Profilometer 150 MM 01.08.1997 1 as is where is immediately
111752 KLA Opti-Probe 5240 Film Thickness Measurement System 200mm 1 as is where is
111753 KLA UV-1250SE Film Thickness Measurement System 200mm 1 as is where is
112197 KLA 5100 Overlay Measurement System 200 mm 01.06.1995 1 as is where is
112198 KLA 8100XP Metrology CD SEM 200 mm 01.06.1999 1 as is where is
112199 KLA 8100XP Metrology CD SEM 200 mm 01.06.1999 1 as is where is
112200 KLA 8250 Metrology CD SEM 200 mm 01.06.2001 1 as is where is
112201 KLA 8250XP Metrology CD SEM 200 mm 01.06.2000 1 as is where is
112202 KLA Aleris CX Metrology Film Thickness Measurement 300 mm 01.06.2007 1 as is where is
112203 KLA Aleris CX Metrology FilmThickness Mesuarement 300 mm 01.06.2007 1 as is where is
112204 KLA Aleris CX Metrology FilmThickness Mesuarement 300 mm 01.06.2007 1 as is where is
112205 KLA Aleris HX8500 Metrology Aleris Ellipsometer Thin Film Measurement System 300 mm 01.06.2008 1 as is where is
112206 KLA Archer 200 AIM Metrology Overlay 300 mm 01.06.2010 1 as is where is
112207 KLA EDR5210 Metrology DRSEM 300 mm 1 as is where is
112208 KLA EDR5210 Metrology DRSEM 300 mm 01.06.2010 1 as is where is
112209 KLA HRP-340 Metrology Surface Profilometer 300 mm 01.06.2003 1 as is where is
112210 KLA NANOMAPPER Metrology Nanotopography 300 mm 01.06.2006 1 as is where is
112211 KLA NANOMAPPER Metrology Nanotopography 300 mm 1 as is where is
112212 KLA NANOMAPPER Metrology Nanotopography 300 mm 1 as is where is
112213 KLA NANOMAPPER Metrology Nanotopography 300 mm 1 as is where is
112214 KLA 6200 (For spares use) darkfield wafer inspection (Frame only) 200 mm 1 as is where is
112215 KLA 7700 Surfscan wafer particle inspection 125 mm 01.02.1996 1 as is where is
112216 KLA SP1 (Parts) Dual Foup 300 mm EFEM only 300 mm 01.06.2004 1 as is where is
112217 KLA SP3 Metrology Particle counter 300 mm 01.06.2014 1 as is where is
112218 KLA Spectra FX200 Metrology Film Thickness Measurement 300 mm 01.06.2006 1 as is where is
112219 KLA SpectraShape 8660 Metrology OCD Measurement 300 mm 01.06.2012 1 as is where is
112220 KLA SpectraShape 8660 Metrology OCD Measurement 300 mm 01.06.2012 1 as is where is
113078 KLA Viper 2430 Macro Defect Inspection 300 mm 01.06.2004 1 as is where is
113079 KLA Viper 2435 Macro Defect Inspection 300 mm 01.06.2004 1 as is where is
113080 KLA Viper 2435XP Macro Defect Inspection 300 mm 01.06.2004 1 as is where is
113307 KLA Candela CS10 Compound Wafer Particle Inspection 100 mm 1 as is where is immediately
113314 KLA Surfscan SP3+ Darkfield Wafer Particle Detection System 300 mm 01.10.2017 1 as is where is immediately
113517 KLA AIT XP PLUS Wafer Particle Detection 150 mm 01.06.2004 1 as is where is
113518 KLA ALPHA-STEP 200 Profiler measurement 150 mm 01.06.1993 1 as is where is
113519 KLA P2-H Profiler measurement 150 mm 01.06.1992 1 as is where is
113520 KLA AIT 1 Wafer Particle Detection 150 mm 01.12.1997 1 as is where is
113521 KLA ALTAIR 8920 Defect inspection system 150 mm 01.06.2017 1 as is where is
113522 KLA FT-700 Thickness measurement 150 mm 01.06.1992 1 as is where is
113523 KLA FT-700 Thickness measurement 150 mm 01.06.1995 1 as is where is
113524 KLA FT-700 Thickness measurement 150 mm 01.06.1995 1 as is where is
113525 KLA RS 35C Resistivity measurment 150 mm 01.06.1992 1 as is where is
113526 KLA RS 35C Resistivity measurment 150 mm 01.06.1990 1 as is where is
113527 KLA SURFSCAN 6200 Defect inspection system 150 mm 01.06.1992 1 as is where is
113528 KLA SURFSCAN 6220 Defect inspection system 150 mm 01.06.1992 1 as is where is
113529 KLA SURFSCAN 6220 Defect inspection system 200 mm 01.06.1992 1 as is where is
113530 KLA SURFSCAN 7700 Defect inspection system 150 mm 01.06.1996 1 as is where is
113531 KLA SURFSCAN 7700 Defect inspection system 150 mm 01.06.1995 1 as is where is
113532 KLA SURFSCAN 7700 Defect inspection system 150 mm 01.06.1996 1 as is where is
113533 KLA uv1280 Thickness measurement 150 mm 01.06.1995 1 as is where is
113534 KLA uv1280 Thickness measurement 200 mm 01.06.1997 1 as is where is
113535 KLA uv1280 Thickness measurement 150 mm 01.06.1999 1 as is where is
113791 KLA Alpha Step 500 Metrology Thickness Measurement 150 mm 01.06.1994 1 as is where is
113792 KLA Alpha Step 500 Metrology Thickness Measurement 150 mm 01.06.1994 1 as is where is
113793 KLA 2133 Metrology Defect inspection (Bright Field) 150 mm 01.06.1995 1 as is where is
113794 KLA 5200XP Metrology Alignment \ Overlay Measurement 150 mm 01.06.1996 1 as is where is
113795 KLA 5200XP Metrology Alignment \ Overlay Measurement 150 mm 01.06.1996 1 as is where is
113796 KLA RS-35 Metrology Sheet resistance OMNP 150 mm 01.06.1991 1 as is where is
113797 KLA RS-35 Metrology Sheet resistance OMNP 150 mm 01.06.1991 1 as is where is
113798 KLA Surfscan 6400 Metrology Particles measurement (laser) INSP.TOOLS 150 mm 01.06.1992 1 as is where is
113799 KLA 2410 Macro defect inspection system 150 mm 01.06.2008 1 as is where is
113800 KLA 6420 Metrology Particles measurement (laser) INSP.TOOLS 150 mm 01.06.1995 1 as is where is
114027 KLA PROMETRIX FT750 Film Thickness Measurement 200 MM 1 as is where is
114113 KLA AIT UV Darkfield Inspection 300 mm 1 as is where is
114114 KLA Archer 500 Overlay Measurement System 300 mm 1 as is where is
114115 KLA ASET-F5x Film Thickness Measurement System 300 mm 1 as is where is
114116 KLA eDR-5210 SEM - Defect Review (DR) 300 mm 1 as is where is
114117 KLA eDR-5210 SEM - Defect Review (DR) 300 mm 1 as is where is
114118 KLA eS805 E-beam Inspection 300 mm 1 as is where is
114248 KLA Candela 8720 Wafer Inspection System 150 mm / 200 mm 01.12.2017 1 as is where is immediately
113287 KLA -TENCOR 259 with RIA 2 Reticle Inspection system with die to database computer up to 7 inch 01.03.1991 1 inquire immediately
32230 KLA TENCOR SFS6400 MECHANICAL CALIBRATION Document Number 238 WAFERSURFACE ANALYSIS SYSTEM CUSTOMER MAINTENANCE REFERENCE MANUAL 1 as is where is immediately
32231 KLA TENCOR Surfscan 64X0 Calibration Procedure Surfscan 64X0 Calibration Procedure MANUAL 1 as is where is immediately
32232 KLA TENCOR surfscan 64XX optical alignments Document Number 236 WAFER SURFACE ANALYSIS SYSTEM MAINTENANCE REFERENCE MANUAL 1 as is where is immediately
32233 KLA TENCOR SFS6x00 MECHANICAL CALIBRATION Document number 200 WAFER SURFACE ANALYSIS SYSTEM MAINTENANCE REFERENCE MANUAL 1 as is where is immediately
106481 KLA Tencor AIT I Patterned Surface Inspection System 150 mm/200 mm 01.06.1995 1 as is where is immediately
106674 KLA TENCOR Viper 2430 Macro Defect Inspection 300 mm 01.06.2004 1 as is where is immediately
106675 KLA TENCOR Viper 2435 Macro Defect Inspection 300 mm 01.06.2004 1 as is where is
106676 KLA TENCOR Viper 2435XP Macro Defect Inspection 300 mm 01.06.2004 1 as is where is
108075 KLA Tencor 2131 Wafer Defect Inspection 150 mm 1 as is where is
108165 KLA TENCOR Surfscan 7200 Surfscan wafer particle detection 150 mm,200 mm 01.06.1991 1 as is where is
108166 KLA TENCOR Surfscan 7200 Surfscan wafer particle detection 150 mm,200 mm 01.06.1990 1 as is where is
111524 KLA TENCOR SURFSCAN AIT Surfscan Wafer particle Detection System (missing Parts) 200 MM 01.06.1999 1 as is where is immediately
1691 KLA-TENCOR 259 (spare parts) Reticle Inspection - SPARE PARTS up to 7 inch 01.12.1991 1 inquire immediately
52151 KLA-Tencor Hamamatsu R1924A Photomultiplier spares 01.03.2007 1 as is where is immediately
53035 KLA-Tencor 2132 (8 inch Wafer Chuck Assembly) Ceramic Wafer chuck, 8" spares 1 as is where is immediately
53036 KLA-Tencor Compumotor M575L11 Stepping motor drive spares 1 as is where is immediately
71632 KLA-TENCOR 2122 Brightfield Wafer Defect Inspection System 200 mm 01.04.1996 1 as is where is immediately
91435 KLA-Tencor AIT Particle Review 200 mm 31.05.1997 1 as is where is
91464 KLA-Tencor PROMETRIX FT750 Film Thickness Measurement 200 mm 1 as is where is immediately
91466 KLA-Tencor PROMETRIX FT750 Film Thickness Measurement 1 as is where is
96998 KLA-Tencor Surfscan AIT Patterned Wafer Inspection 200 mm 01.05.1997 1 as is where is immediately
108760 KLA-Tencor Surfscan 4500 Wafer Particle Inspection System 2 to 6 inch 01.05.1986 1 as is where is immediately
109107 KLA-Tencor PROMETRIX FT-650 WAFER FILM THICKNESS MEASUREMENT SYSTEM 01.06.1991 1 as is where is immediately
109598 KLA-Tencor Surfscan 5500 Wafer Particle Detection 200 mm 1 inquire
109613 KLA-Tencor AIT Surfscan wafer particle detection system 150 mm 1 inquire
111425 KLA-Tencor Archer 500 AIM Overlay Measurement System 300 mm 01.12.2013 1 as is where is immediately
111426 KLA-Tencor Archer 500 AIM Overlay Measurement System 300 mm 01.08.2015 1 as is where is immediately
111429 KLA-Tencor VisEdge Cv300R Wafer Edge Defect Inspection 300 mm 01.08.2010 1 as is where is immediately
111559 KLA-Tencor Archer 300+ AIM Overlay Measurement System 300 mm 01.06.2012 2 as is where is immediately
113083 KLA-TENCOR 2132 (mainbody only) Wafer Inspection System 150 mm,200 mm 01.06.1995 1 as is where is
113084 KLA-TENCOR AIT I Surfscan Wafer Inspection 150 mm,200 mm 01.06.1997 1 as is where is
113085 KLA-TENCOR P-12 Profileometer 150 mm,200 mm 1 as is where is
113086 KLA-TENCOR P-2 Profileometer 150 mm,200 mm 01.06.1996 1 as is where is immediately
113216 KLA-Tencor Archer 500 Overlay Measurement 300 mm 1 as is where is
113217 KLA-Tencor ASET-F5X / Spectra CD 100 Thin film measurement 300 mm 1 as is where is immediately
113959 KLA-Tencor 6200 Surfscan Particle Inspection Tool 200 mm 1 inquire
113960 KLA-Tencor 6420 Surfscan Particle Inspection Tool 200 mm 1 inquire
113961 KLA-Tencor Alpha Step 200 Automatic Step Profileometer 1 inquire
113962 KLA-Tencor Alpha Step 200 Automatic Step Profileometer 1 inquire
113963 KLA-Tencor Alpha Step IQ Automatic Step Profileometer 1 inquire
113964 KLA-Tencor Altair 8920 Patterned Wafer Inspection System 200/300 mm 1 inquire
113965 KLA-Tencor Altair 8935 Patterned Wafer Inspection System Various 1 inquire
113966 KLA-Tencor Archer AIM+ Overlay Measurement 200/300 mm 1 inquire
113967 KLA-Tencor Archer XT+ Overlay Measurement 200/300 mm 1 inquire immediately
113968 KLA-Tencor FLX2320 Wafer Stress measurement 200 mm 1 as is all rebuilt immediately
113969 KLA-Tencor RS55TC Prometrix Four Point Probe Resistivity Mapping System 200 mm 1 inquire
113970 KLA-Tencor UV-1280SE Thin Film Measurement – Ellipsometer 200 mm 1 inquire
113971 KLA-Tencor UV1050 Thin Film Measurement System 200 mm 1 inquire
108837 KOKUSAI VR70 Resistivity Test Tool 1 inquire
112225 Kokusai VR-120SD Metrology Resistivity Measurement 300 mm 1 as is where is
113089 KOKUSAI VR120_SD Resistivity Test System 300 mm 01.06.2007 1 as is where is
94475 LASERTEC BGM300 Wafer Surface Analyzing and VIsualization System 200 mm 31.05.2008 1 as is where is
113092 LASERTEC BGM300 Wafer Inspection System 300 mm 01.06.2014 1 as is where is immediately
111451 Leica INS 3000 Microscope Inspection station 200 mm 01.01.1998 1 as is where is immediately
112785 Leica INM 100 Microscope,Bright & Dark,Reflected Light 1 as is where is
112786 Leica INM20 Microscope, BF/DF/DIC 200 1 as is where is
112787 Leica POLYLITE 88 Microscope, BF/DF/DIC 200 1 as is where is
112788 Leica POLYLITE 88 Microscope, Bright & Dark 200 1 as is where is
112789 Leica POLYLITE 88 Microscope, Bright & Dark 200 1 as is where is
112790 Leica Polylite 88 Microscope,Bright & Dark,Reflected Light 2 as is where is
112791 Leica Polylite 88 Microscope,Bright & Dark,Reflected Light 1 as is where is
112792 Leica POLYLITE88 Microscope,BF/DF/DIC,Reflected Light 1 as is where is
113563 Leica Mis 200 Wafer Inspection Microscope 150 mm 01.06.1995 1 as is where is
113564 Leica Mis 200 Wafer Inspection Microscope 150 mm 01.06.1995 1 as is where is
113837 LEICA INM200 Metrology Defect Inspection – Wafer Inspection Microscope 150 mm 1 as is where is
113838 LEICA ERGOLUX 200 Metrology Defect Inspection – Wafer Inspection Microscope 150 mm 01.06.1990 1 as is where is
113839 LEICA ERGOLUX 200 Metrology Defect Inspection – Wafer Inspection Microscope 150 mm 01.06.1995 1 as is where is
113840 LEICA ERGOLUX 200 Metrology Defect Inspection – Wafer Inspection Microscope 150 mm 01.06.1995 1 as is where is
113841 LEICA ERGOLUX 200 Metrology Defect Inspection – Wafer Inspection Microscope 150 mm 01.06.1995 1 as is where is
113842 LEICA ERGOLUX 200 Metrology Defect Inspection – Wafer Inspection Microscope 150 mm 01.06.1995 1 as is where is
113843 LEICA ERGOLUX 200 Metrology Defect Inspection – Wafer Inspection Microscope 150 mm 01.06.1995 1 as is where is
113844 LEICA ERGOLUX 200 Metrology Defect Inspection – Wafer Inspection Microscope 150 mm 01.06.1995 1 as is where is
113845 LEICA ERGOLUX 200 Metrology Defect Inspection – Wafer Inspection Microscope 150 mm 01.06.1995 1 as is where is
113846 LEICA ERGOLUX 200 Metrology Defect Inspection – Wafer Inspection Microscope 150 mm 01.06.1995 1 as is where is
113847 LEICA ERGOLUX 200 Metrology Defect Inspection – Wafer Inspection Microscope 150 mm 01.06.1995 1 as is where is
113848 LEICA ERGOLUX 200 Metrology Defect Inspection – Wafer Inspection Microscope 150 mm 01.06.1995 1 as is where is
113849 LEICA ERGOLUX 200 Metrology Defect Inspection – Wafer Inspection Microscope 150 mm 01.06.1995 1 as is where is
113850 LEICA ERGOLUX 200 Metrology Defect Inspection – Wafer Inspection Microscope 150 mm 01.06.1995 1 as is where is
113851 LEICA ERGOLUX 200 Metrology Defect Inspection – Wafer Inspection Microscope 150 mm 01.06.1995 1 as is where is
113852 LEICA ERGOLUX 200 Metrology Defect Inspection – Wafer Inspection Microscope 150 mm 01.06.1990 1 as is where is
113853 LEICA ERGOLUX 200 Metrology Defect Inspection – Wafer Inspection Microscope 150 mm 01.06.1995 1 as is where is
113854 LEICA ERGOLUX 200 Metrology Defect Inspection – Wafer Inspection Microscope 150 mm 01.06.1990 1 as is where is
113855 LEICA ERGOLUX 200 Metrology Defect Inspection – Wafer Inspection Microscope 150 mm 01.06.1990 1 as is where is
113856 LEICA ERGOLUX 200 Metrology Defect Inspection – Wafer Inspection Microscope 150 mm 01.06.1995 1 as is where is
113857 LEICA ERGOLUX 200 Metrology Defect Inspection – Wafer Inspection Microscope 150 mm 01.06.1995 1 as is where is
113858 LEICA ERGOLUX 200 Metrology Defect Inspection – Wafer Inspection Microscope 150 mm 01.06.1995 1 as is where is
112793 Leitz 060-680-014 Microscope, Reflected Light 1 as is where is
112794 Leitz Ergolux Microscope,Bright & Dark,Ref/Trans Light 1 as is where is
112795 Leitz Ergolux Microscope,Bright & DarkReflected Light 1 as is where is
112796 Leitz Laborlux 12 HL Microscope,BF/DF/DICRef/Trans Light 1 as is where is
112797 Leitz Secolux 6X6 Microscope,Brightfield,Reflected Light 1 as is where is
113093 LG SEMICON CLS-9002 3rd Optical Inspection N/A 01.06.1997 1 as is where is
113094 LINDA IV5_HI N/A 1 as is where is
114141 Metryx Mentor DF3 Mass Measurement 300 mm 1 as is where is
108848 MINATO MM-6600 Wafer Mobility Tester with MECS UX-1000 Wafer Robot, 2ea Available 1 inquire
108029 MSP CORP. 2300XP1 Particle Depositioning 300 mm 1 as is where is
113101 N&K ANALYZER 5700-CDRT Wafer Inspection System N/A 1 as is where is
113102 NANO OPTICS HAZE 2 Wafer Inspection System 200 mm 1 as is where is
91526 NANOMETRICS Caliper Mosaic Overlay 300 mm 31.05.2003 1 as is where is immediately
91529 NANOMETRICS Caliper Mosaic Overlay 300 mm 28.02.2010 1 as is where is immediately
98289 NANOMETRICS CALIPER ULTRA Mask & Wafer Inspection 300 mm 31.05.2005 1 as is where is
98290 NANOMETRICS CALIPER ULTRA Mask & Wafer Inspection 300 mm 31.05.2005 1 as is where is
98291 NANOMETRICS CALIPER ULTRA Mask & Wafer Inspection 300 mm 30.06.2006 1 as is where is immediately
98480 Nanometrics 8000X film thickness measurement 150 mm 2 as is where is immediately
98481 Nanometrics 8000Xse film thickness measurement 200 mm 2 as is where is immediately
101585 NANOMETRICS CALIPER ULTRA Optical Overlay Measurement 300 mm 01.06.2006 1 as is where is immediately
103544 NANOMETRICS CALIPER ELAN Overlay 300 mm 31.05.2004 1 as is where is
106179 Nanometrics 9000 Nanospec Wafer Metrology film thickness measurement tool 200 mm 01.06.2005 1 as is all rebuilt immediately
106302 Nanometrics SIPHER PL Mapping 300 mm 01.06.2002 1 as is where is immediately
106823 Nanometrics Nanospec 9100 Oxide film thickness measurement (PC missing) 200 mm 01.03.2003 1 as is where is immediately
107027 NANOMETRICS Caliper Mosaic Overlay measurement System 300 mm 01.08.2010 1 inquire immediately
108467 Nanometrics Tevet Trajectory T3 Film Thickness Measurement System 300 mm 1 as is where is
109113 Nanometrics LynX 9010T Optical CD Measurement (Scatterometry) system 300 mm 01.09.2008 1 as is where is immediately
112242 Nanometrics Atlas II+ Metrology Film Thickness Measurement 300 mm 1 as is where is
112243 Nanometrics Caliper Elan Metrology Overlay 200 mm 01.06.2005 1 as is where is
112244 Nanometrics Caliper Mosaic Metrology Overlay 300 mm 01.06.2009 1 as is where is
112245 Nanometrics Caliper Mosaic Metrology Overlay 300 mm 01.06.2011 1 as is where is
112246 Nanometrics Caliper Mosaic Metrology Overlay 300 mm 01.06.2009 1 as is where is
112247 Nanometrics Caliper Mosaic Metrology Overlay 300 mm 01.06.2009 1 as is where is
112248 Nanometrics Caliper Mosaic Metrology Overlay 300 mm 01.06.2011 1 as is where is
112249 Nanometrics Caliper Mosaic Metrology Overlay 300 mm 01.06.2011 1 as is where is
112250 Nanometrics NanoSpec AFT 180 Metrology Thickness measurement 150 mm 1 as is where is
113103 NANOMETRICS CALIPER_MOSAIC Optical Overlay measurement 300 mm 01.06.2003 1 as is where is
113104 NANOMETRICS CALIPER_MOSAIC Optical Overlay measurement 300 mm 01.06.2001 1 as is where is immediately
113105 NANOMETRICS CALIPER_MOSAIC Optical Overlay measurement 300 mm 1 as is where is
113107 NANOMETRICS CALIPER-ULTRA Optical Overlay measurement 300 mm 01.06.2006 1 as is where is immediately
113109 NANOMETRICS NANOSPEC 8000 Film Thickness Measurement System N/A 01.06.1996 1 as is where is
113579 Nanometrics RPM Blue Photoluminescence measurement 150 mm 1 as is where is
113875 NANOMETRICS 210 Metrology Thickness Measurement NANO 150 mm 01.06.1988 1 as is where is
113876 NANOMETRICS 8000XSE Metrology Thickness Measurement NANO 150 mm 01.06.1988 1 as is where is
113877 NANOMETRICS 8000XSE Metrology Thickness Measurement NANO 150 mm 01.06.1988 1 as is where is
113878 NANOMETRICS 8000XSE Metrology Thickness Measurement NANO 150 mm 01.06.1988 1 as is where is
113879 NANOMETRICS 8000XSE Metrology Thickness Measurement NANO 150 mm 01.06.1997 1 as is where is
113880 NANOMETRICS 8000XSE Metrology Thickness Measurement NANO 150 mm 01.06.1997 1 as is where is
108853 NICOLET Avatar 370 DTGS FT-IR Spectrometer 1 inquire
112866 Nicolet NEXUS 470 FT-IR with Spectra-Tech Continuum Scope and TGA Interface 1 as is where is
113582 Nidek / Leitz Nidek waferloader + Leitz microscope Manual inspection system 150 mm 01.06.1992 1 as is where is
98484 Nikon ECLIPSE L150 Microscope 100/150mm 1 as is where is immediately
106503 Nikon Auto Wafer Loader for Microscope Inspection WAFER INSPECTION MICROSCOPE 150 mm/200 mm 1 as is where is immediately
106708 NIKON AMI-3300 Wafer Inspection System 300 mm 1 as is where is
108092 Nikon OPTIPHOT-200 Wafer inspection microscope 200 mm 3 as is where is
108093 Nikon OPTIPHOT-300 Wafer inspection microscope 300 mm 1 as is where is
108094 Nikon OPTIPHOT-88-AC IN Wafer inspection microscope 200 mm 1 as is where is
108772 Nikon Optistation 3 Wafer Inspection System 150 mm 01.05.1994 1 as is where is immediately
108784 Nikon Optistation 3A Automatic Wafer Inspection Station 200 mm 01.05.1997 1 as is where is immediately
108785 NIKON Optiphot 200 (For spares use) Wafer Inspection Microscope (Parts Tool Only) 200 mm 1 as is where is immediately
108789 Nikon Optiphot 200 Wafer Inspection Microscope 200 mm 1 as is all rebuilt immediately
108790 NIKON Optiphot 88 Wafer Inspection Microscope 200 mm 1 as is where is immediately
108854 NIKON NWL-860 Automatic Microscope Wafer Loader for up to 200mm Wafers 1 inquire
108855 NIKON Optiphot 200 Wafer Inspection Microscope, B/Dfield & DIC Microscopy, Motorized Turret with 5ea Objectives, Prior ProScan Programmable Stage, 200mm X 200mm XY Travel, Color CCD Camera & More 1 inquire
110610 NIKON OptiStation 3 Wafer Inspection Microscope 200 mm 1 as is where is immediately
110618 NIKON Optistation 3 Wafer Inspection Microscope 01.07.1994 1 as is where is immediately
110695 Nikon NWL 860 TMB Wafer Inspection Microscope with wafer autoloader 150 mm, 200 mm 1 as is where is immediately
110791 Nikon OptiStation 3200 Fully Automated Wafer Inspection Microscope 300 mm 3 as is where is immediately
112867 Nikon Eclipse ME600L Microscope,BF/DF/DIC,Reflected Light 1 as is where is
112871 Nikon OPTIPHOT 200 Microscope, Bright & Dark 1 as is where is
112872 Nikon Optiphot 200 Microscope,Bright & Dark,Reflected Light 3 as is where is
113111 NIKON AMI-3300 Wafer Inspection System 300 mm 1 as is where is
113975 Nikon L200N Microscope w/ TH200 Wafer Loader 200 mm 1 inquire
113583 Nikon / Eclipse Nikon NWL200 waferloader + Eclipse L200N microscope Manual inspection system 150 mm 1 as is where is
113584 Nikon / Eclipse Nikon NWLxxx waferloader + Eclipse microscope Manual inspection system 150 mm 01.06.2001 1 as is where is
113585 Nikon / Eclipse Nikon NWLxxx waferloader + Eclipse microscope Manual inspection system 150 mm 01.06.2006 1 as is where is
113586 Nikon / Eclipse Nikon NWLxxx waferloader + Eclipse microscope Manual inspection system 150 mm 01.06.2000 1 as is where is
113587 Nikon / Eclipse Nikon NWLxxx waferloader + Eclipse microscope Manual inspection system 150 mm 01.06.2014 1 as is where is
113588 Nikon / Eclipse Nikon NWLxxx waferloader + Eclipse microscope Manual inspection system 150 mm 01.06.2014 1 as is where is
108033 NOVA NOVASCAN 3090 P/N 390-10000-11 CMP metrology system 300 mm 1 as is where is immediately
108967 NOVA T600 MMSR Ellipsometer for CD and thin film measurements 300 mm 01.01.2018 1 as is where is immediately
109220 Nova V2600 Integrated CMP Endpoint / Film Measurement 300mm 1 as is where is
109283 NOVA MEASURING Novascan Novascan CMP Endpoint measurement unit 200 mm 01.06.2000 1 as is where is immediately
109284 NOVA MEASURING Novascan Novascan CMP Endpoint measurement unit 200 mm 01.06.2000 1 as is where is immediately
106825 Olympus AL110-LMB6 with MX51 wafer loader with Microscope 150mm 1 as is where is immediately
108786 OLYMPUS BH-BHM Wafer Inspection Microscope 150 mm 1 as is where is immediately
108857 OLYMPUS AL100-L8 Wafer Loader, 200mm, Parts Tool 200 MM 1 inquire
109035 Olympus AL110N-LMB6 Wafer Inspection Microscope with autoloader 100 MM AND 150 mm 1 as is where is immediately
109058 Olympus AL110N-LMB6 Microscope autoloader only (Not including the microscope) 100 MM AND 150 mm 1 as is where is immediately
110697 Olympus AL100-LB6 Wafer autoloader (Not including microscope) 100MM TO 150 MM 2 as is where is immediately
111568 Olympus AL100-LB6 with BH3-MJL Wafer autoloader with microscope 100MM TO 150 MM 1 as is where is immediately
111569 Olympus AL100-LB6 with MX61L Wafer autoloader with microscope 100MM TO 150 MM 1 as is where is immediately
112879 Olympus AX70 Microscope,Bright & Dark,Hg Reflected Lt 1 as is where is
112880 Olympus BH2 BHT Microscope,Brightfield,Ref/Trans Light 1 as is where is
112881 Olympus BH2-UMA Microscope,BF/DF/DIC,Reflected Light 1 as is where is
112882 Olympus MX50-AF Microscope,Bright & Dark,Reflected Light 2 as is where is
112883 Olympus MX50-CF Microscope,BF/DF/DIC,Hg Reflected Lt 1 as is where is
112884 Olympus MX50A-F Microscope,BF/DF/DIC,Reflected Light 1 as is where is
112885 Olympus MX50T-F Microscope, Brightfield 1 as is where is
112886 Olympus MX50T-F Microscope,Bright & Dark,Reflected Light 1 as is where is
112887 Olympus STM6-F00-3 Microscope, Brightfield Reflected Light 1 as is where is
103547 ONTO WV320 MACRO INSPECTING 300 mm 31.05.2004 1 as is where is
109559 Philips PHI 680 Auger Nanoprobe Laboratory 01.05.1998 1 as is where is immediately
112900 Philips DCD 120 Double Crystal Diffractometer 200 mm 01.06.2001 1 as is where is
114157 Philips / Technos TREX 632 X-ray Fluorescence Spectrometer 300 mm 1 as is where is
110683 Plasmos SD2000 Thin Film Thickness Measurement System / Ellipsometer 200 mm 01.06.1998 1 as is where is immediately
31246 PMS Liquitrack 776200 Non volatile residual Monitor for water-quality checking facilities 01.10.1999 1 as is where is immediately
91552 RAYTEX RXW-800 EDGE SCAN 200 mm 31.05.2008 1 as is where is
98489 Raytex RXW-0826SFIX-SMIF Wafer edge scanner 200 mm 1 as is where is immediately
114163 Raytex RXW-1227 EdgeScan Edge Defect 300 mm 1 as is where is
111476 Research Instruments EUV-MBR EUV Mask and Blank reflectometer reticle 01.06.2016 1 as is where is immediately
114151 ReVera VeraFlex X-ray Fluorescence Spectrometer 300 mm 1 as is where is
114164 ReVera RVX1000 Film Thickness Measurement System 300 mm 1 as is where is
114165 ReVera RVX1000 Film Thickness Measurement System 300 mm 1 as is where is
114166 ReVera RVX1000 Film Thickness Measurement System 300 mm 1 as is where is
91557 RIGAKU XRF3640 (Handle include) Wafer/ Disk Analyzer 200 mm 01.05.1995 1 as is where is
108194 RIGAKU 3640 fluorescent X-ray measurement system 200 mm 01.11.2000 1 as is where is immediately
108865 RIGAKU V300 Total Reflection Xray Fluoroescence Spectrometer 1 inquire
112914 Rigaku TXRF 300S TXRF 200 mm 1 as is where is
113905 RIGAKU XRF3640 Metrology XRA 150 mm 01.06.2003 1 as is where is
91559 RUDOLPH AXI_S Macro Inspection System 300 mm 31.05.2005 1 as is where is
91560 RUDOLPH AXI_S Macro Inspection System 300 mm 31.05.2005 1 as is where is
91561 RUDOLPH AXI_S Macro Inspection System 300 mm 31.05.2006 1 as is where is
91563 RUDOLPH Meta Pulse Film Metrology 200 mm 01.05.2005 1 as is where is immediately
91566 Rudolph WS3840 3D Bump Metrology 300 mm 31.05.2010 1 as is where is immediately
91567 RUDOLPH META PULSE 200 Surface Film Metrology 200 mm 01.05.2002 1 as is where is immediately
94478 RUDOLPH FE-3 Focus Ellipsometer 200 mm 1 as is where is
94479 RUDOLPH FE-4D Focus Ellipsometer 200 mm 1 as is where is
98296 RUDOLPH Meta Pulse 300 Film thickness measurement 300 mm 1 as is where is immediately
98297 RUDOLPH Meta Pulse 300 Film thickness measurement 300 mm 1 as is where is
98835 RUDOLPH AXI-S Macro Wafer Inspection 300 mm 01.06.2004 1 as is where is immediately
98837 RUDOLPH MP1-300XCU Film Thickness Measurement System 300 mm 30.04.2008 1 as is where is immediately
100928 RUDOLPH AXI-S Macro Inspection System 300 mm 31.05.2003 1 as is where is
100930 RUDOLPH MP300 Film thickness measurement 200 mm 31.05.2007 1 as is where is
100931 RUDOLPH MP300 Film thickness measurement 200 mm 31.05.2009 1 as is where is
100932 RUDOLPH S3000A Focused Beam Ellipsometer 200 mm 31.05.2012 1 as is where is
103553 RUDOLPH AXI-S Macro Inspection 300 mm 31.05.2004 1 as is where is
103554 RUDOLPH AXI935D AVI 300 mm 1 as is where is
103555 RUDOLPH MP3 300XCU FLIM THICKNESS MEASUREMENT SYSTEM 300 mm 1 as is where is immediately
106420 Rudolph NSX 115 Automated Defect Inspection 200 mm 1 as is where is immediately
106422 Rudolph NSX-105 Automated Defect Inspection 150 mm/200 mm 1 as is where is immediately
106424 Rudolph NSX-95 Automated Macro Defect Inspection 150 mm/200 mm 1 as is where is immediately
106715 RUDOLPH MP3_300A METAL THICKNESS MEASUREMENT 300 mm 01.06.2012 1 as is where is
106716 RUDOLPH MP-300 Film thickness measurement 300 mm 01.06.2005 1 as is where is immediately
106717 RUDOLPH MP1-300 Film Thickness Measurement 300 mm 01.06.2003 1 as is where is immediately
106719 RUDOLPH MP1-300XCU Film thickness measurement system 300 mm 01.06.2008 1 as is where is
106720 RUDOLPH NSX 105 MACRO DEFECT INSPECTION SYSTEM 300 mm 01.06.2008 1 as is where is immediately
106721 RUDOLPH S3000A FBE(focused beam laser ellipsometry) 300 mm 01.06.2010 1 as is where is immediately
106723 RUDOLPH S3000A FBE(focused beam laser ellipsometry) 300 mm 1 as is where is
106725 RUDOLPH S3000S FBE(focused beam laser ellipsometry) 300 mm 01.06.2010 1 as is where is
106731 RUDOLPH WV320 Macro Defect Inspection 300 mm 01.06.2006 1 as is where is immediately
106732 RUDOLPH MP200 Film thickness measurement 200 mm 01.06.2003 1 as is where is
106831 Rudolph MP200XCU Cu Film thickness measurement 200 mm 1 as is where is immediately
106832 Rudolph MP-300 Metal Film thickness measurement 300mm 1 as is where is immediately
106833 Rudolph MP300 XCu Cu Film thickness measurement 300 mm 2 as is where is immediately
106871 RUDOLPH NSX 105 Automated Wafer, Die and Bump Inspection System 200 mm and 300 mm 01.06.2008 1 as is where is immediately
108034 RUDOLPH AXI-S930B Macro Defect Inspection 300 mm 01.01.2007 1 as is where is
108200 RUDOLPH MP200 Film thickness measurement 200 mm 01.06.2002 1 as is where is
108587 RUDOLPH WV320 Wafer Inspection System 300mm 1 as is where is immediately
108711 Rudolph Sonus 7800 Acoustic Metrology and Defect Detection System 300 MM 01.06.2015 1 inquire
109550 Rudolph AXI-S Macro Defect Inspection System 300 mm 01.06.2006 1 as is where is immediately
109570 Rudolph WaferView 320 Macro Wafer Defect Inspection System 300 mm 1 as is where is immediately
110735 Rudolph MetaPulse 200 Metal film measurement system 150-200 mm 01.06.2006 1 as is where is immediately
110736 Rudolph MetaPulse 200X Cu Metal film measurement system 150-200 mm 01.06.2006 1 as is where is immediately
110795 Rudolph S300D Ultra II Thin Film Measurement Tool / Ellipsometer 300 mm 01.05.2005 1 as is where is immediately
112280 Rudolph 3Di8500 Metrology Macro inspection 300 mm 01.06.2008 1 as is where is
112281 Rudolph Axi-S Metrology Macro Inspection 300 mm 01.06.2005 1 as is where is
112282 Rudolph Axi-S Metrology Macro Inspection 300 mm 01.06.2005 1 as is where is
112283 Rudolph NSX105 Metrology Macro Inspection 300 mm 01.06.2007 1 as is where is
112284 Rudolph NSX105 Metrology Macro Inspection 200 mm 01.06.2004 1 as is where is
112285 Rudolph NSX105 Metrology Macro Inspection 200 mm 01.06.2003 1 as is where is
112286 Rudolph NSX105 Metrology Macro Inspection 200 mm 1 as is where is
113131 RUDOLPH AXI-S Macro Inspection System 300 mm 01.06.2004 1 as is where is
113132 RUDOLPH META PULSE 200 Film thickness measurement 200 mm 01.06.1999 1 as is where is
113133 RUDOLPH META PULSE 200 Film thickness measurement 200 mm 01.06.2005 1 as is where is
113134 RUDOLPH META PULSE 200X CU Film thickness measurement (Including HDD) 200 mm 01.06.2003 1 as is where is immediately
113135 RUDOLPH META PULSE 200X CU Film thickness measurement (Including HDD) 200 mm 01.06.2001 1 as is where is immediately
113136 RUDOLPH META PULSE II 200X CU Film thickness measurement 200 mm 01.06.2008 1 as is where is
113137 RUDOLPH METAPULSE 200C Film thickness measurement 200 mm 01.06.2000 1 as is where is
113138 RUDOLPH METAPULSE 200cuX Film thickness measurement 200 mm 01.06.2004 1 as is where is
113140 RUDOLPH MP1-300 Film Thickness Measurement 300 mm 1 as is where is
113141 RUDOLPH MP1-300 Film Thickness Measurement 300 mm 01.06.2007 1 as is where is
113142 RUDOLPH MP1-300 Film Thickness Measurement 300 mm 1 as is where is immediately
113145 RUDOLPH MP3_300A METAL THICKNESS 300 mm 01.06.2012 1 as is where is
113147 RUDOLPH NSX 105 Macro Defect Inspection 300 mm 01.06.2008 1 as is where is
113149 RUDOLPH S3000A FBE(focused beam laser ellipsometry) 300 mm 01.06.2011 1 as is where is immediately
113150 RUDOLPH S3000A FBE(focused beam laser ellipsometry) 300 mm 1 as is where is
113151 RUDOLPH S3000A FBE(focused beam laser ellipsometry) 300 mm 01.06.2011 1 as is where is immediately
113152 RUDOLPH S3000S FBE(focused beam laser ellipsometry) 300 mm 1 as is where is immediately
113154 RUDOLPH MP200 Film thickness measurement 200 mm 01.06.1999 1 as is where is
113155 RUDOLPH MP200 Film thickness measurement 200 mm 01.06.2003 1 as is where is
113156 RUDOLPH WV320 Macro Defect Inspection System 300 mm 1 as is where is immediately
113157 RUDOLPH WV320 Macro Defect Inspection System 300 mm 1 as is where is immediately
113600 Rudolph FE -VII Ellipsometer 150 mm 01.06.1995 1 as is where is
114168 Rudolph Axi 930 Macro-Defect 300 mm 1 as is where is
114169 Rudolph Axi 935 Macro-Defect 300 mm 1 as is where is
112915 Rudolph Research AUTO EL RE-350 Ellipsometer 150 mm 1 as is where is
112916 Rudolph Technologies AUTO EL Ellipsometer 150 mm 1 as is where is
111873 Rudolph Technologies, Inc. Vanguard SpectraLASER 200XL Film Thickness Measurement System 200mm 1 as is where is
113601 SDI FAaST 230-DP-SPV Carrier Lifetime measurement 150 mm 01.06.1999 1 as is where is
113906 SDI Semiconductor Diagnostics 2500 Metrology – Carrier Lifetime Measurement 150 mm 01.06.1996 1 as is where is
108035 SEMILAB PMR_3000 Dose Monitoring 300 mm 1 as is where is
112288 Semilab FAaST 230 Metrology - Carrier Lifetime Measurement 200 mm 01.06.2005 1 as is where is immediately
112289 Semilab FAaST330A Metrology - Carrier Lifetime Measurement 300 mm 01.06.2004 1 as is where is immediately
112290 Semilab WT2500PL Metrology ANALYSIS 300 mm 01.06.2015 1 as is where is
109074 Sensofar PLu Neox Optical 3D Surface Profiler with motorized XY stage, 4 Lens (10X, 20X, 50X, 100X), anti vibration table Optical 3D Surface Profiler 01.06.2012 1 as is where is
108696 SENTECH Senduro 300 Thin Film measurement Up to 300 MM 01.06.2008 1 inquire
113612 Soluris IVS130 Overlay measurement 150 mm 01.06.2003 1 as is where is
113613 Soluris IVS130 Overlay measurement 150 mm 01.06.2003 1 as is where is
106742 SSM Fastgate 5200 Resistivity / CV Measurement 200 mm 01.06.2008 1 as is where is immediately
108773 SSM 470i CV Plotter 1 inquire
110780 SSM 5130 Hg-CV Hg-CV measurement system up to 12 inch 01.01.2004 1 as is where is immediately
113291 THERMA-WAVE OP 3290 Opti-probe wafer measurement 200 mm 1 as is where is immediately
106303 Thermo Fisher ECO1000-S FTIR up to 200 mm 01.06.1997 1 as is where is immediately
113181 THERMO FISHER ECO 1000 FTIR System 200 mm 01.06.2002 1 as is where is
114171 Thermo Fisher Theta 300 MKII Wafer Characterization 300 mm 1 as is where is
107011 Veeco Dektak 200 Si Contact Profilometer - for spares use (Not operational condition) 150 mm 01.06.2000 1 as is where is immediately
108331 Veeco Dimension 7000 Atomic Force Microscope (AFM) 200mm 01.06.1997 1 as is where is immediately
108893 VEECO AP-150 Automtic Four Point Probe, for up to 6" Wafers 150 MM 1 as is where is 2 weeks
108894 VEECO Dektak 3030ST Profilometer 1 inquire
108916 Veeco Dimension X3D Model 340 Atomic Force Microscope 300 MM 01.05.2006 1 as is where is immediately
109116 Veeco Vx340 Dimension Atomic Force Proflier 300 mm 01.06.2010 1 as is where is immediately
112570 Veeco Dimension X3D-340 Metrology AFM 300 mm 01.06.2004 1 as is where is
112980 Veeco Dektak 3030 Profileometer 1 as is where is
112981 Veeco Dektak 3030 Auto II Profileometer 1 as is where is
93087 Woollam VUV-VASE (Gen II) Ellipsometer 300 MM 1 as is where is immediately
102559 ZEISS Axiotron 300 AOI microscope with 2 units of Brooks load port 300 mm 1 as is where is immediately
108216 ZEISS AXIOTRON Inspection Micro Scope 1 as is where is
108217 ZEISS AXIOTRON Inspection Micro Scope 1 as is where is
108218 ZEISS AXIOTRON High Perfomance Micro Scope 01.06.2008 1 as is where is
108972 Zeiss Axiospect Wafer Inspection Microscope 300 mm 01.06.2011 1 as is where is immediately
113002 Zeiss AXIOTRON Microscope,Brightfield,Reflected Light 2 as is where is
113003 Zeiss AXIOTRON Microscope,Brightfield,Xe Reflected Lt 1 as is where is
113071 ZEISS AXIOSPECT 300 Microscope Inspection Station 300 mm 1 as is where is immediately
114217 Zeiss Axiospect 300 Optical Review System 300 mm 1 as is where is
114218 Zeiss Axiospect 300 Optical Review System 300 mm 1 as is where is
114219 Zeiss Axiospect 300 Optical Review System 300 mm 1 as is where is
114220 Zeiss Axiospect 300 Optical Review System 300 mm 1 as is where is
114225 Zygo AutoKMS-100 Reticle CD SEM 200 mm 1 as is where is


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