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SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time |
---|---|---|---|---|---|---|---|---|
109568 | Hitachi | CG-4100 | Critical Dimension (CD) Measurement SEM | 300 mm | 01.06.2012 | 1 | as is where is | immediately |
109569 | Hitachi | CG-4000 | Critical Dimension (CD) Measurement SEM | 300 mm | 01.06.2010 | 1 | as is where is | immediately |
91397 | HITACHI | IS2700SE | Dark Field inspection | 1 | as is where is | |||
86278 | Hitachi | 6280H CONTROL RACK | CD SEM (PARTS) | Spares | 01.05.1995 | 1 | as is where is | immediately |
108040 | Hitachi | Spare Parts | Various Spare Parts for sale | Spares | 1 | as is where is | immediately | |
110601 | Hitachi | FB 2100 | FIB SEM | Laboratory | 01.06.2006 | 1 | as is where is | immediately |
109578 | HITACHI | CM-700H | WIRE BONDER | ASSEMBLY | 01.05.2007 | 20 | inquire | immediately |
91403 | HITACHI | S-5000 | FE SEM | 150 mm,200 mm | 1 | as is where is | ||
60939 | HITACHI | S4160 | Scanning electron microscope | 31.05.1996 | 1 | as is where is | ||
91404 | HITACHI | S-5000 | FE SEM | 150 mm,200 mm | 1 | as is where is | ||
91405 | HITACHI | S-5000 | FE SEM | 150 mm,200 mm | 1 | as is where is | ||
91407 | HITACHI | S-5000 | FE SEM | 150 mm,200 mm | 1 | as is where is | ||
91408 | HITACHI | S-5000 | FE SEM | 150 mm,200 mm | 1 | as is where is | ||
108568 | HITACHI | LS9000 | Wafer Surface Inspection System | 300mm | 01.06.2010 | 1 | as is where is | immediately |
91417 | HITACHI | LS-6800 | wafer surface inspection | 300 mm | 31.08.2007 | 1 | as is where is | immediately |
91418 | HITACHI | UA-7200 | Stripper/Asher | 31.05.2001 | 1 | as is where is | ||
108068 | Hitachi | HL7000M | E-Beam Litho (9 inch mask) | RETICLE | 1 | as is where is | ||
108069 | Hitachi | HL7500M | E-Beam Litho (6 inch mask) | RETICLE | 1 | as is where is | ||
108070 | Hitachi | HL7800M | E-Beam Litho (6 inch mask) | RETICLE | 1 | as is where is | ||
108071 | Hitachi | HL8000M | E-Beam Litho (6 inch mask) | RETICLE | 1 | as is where is | ||
108072 | Hitachi | S-6280H | CD SEM | 1 | as is where is | |||
74794 | Hitachi | S5200 | FE SEM with EDX | Inspection | 31.05.2005 | 1 | as is where is | immediately |
53054 | HITACHI | 6280H (SPARES) | SORD Computer for cd sem system | spares | 1 | as is where is | immediately | |
110662 | Hitachi | S9380 II | CD-SEM | 300 mm | 01.05.2009 | 1 | as is where is | immediately |
110665 | Hitachi | S-8820 | CD SEM | 150 / 200 | 1 | as is where is | 5 months | |
52301 | Hitachi | 545-5516 | 7 Channel Power Supply module | spares | 0 | as is where is | immediately | |
52312 | Hitachi | 545-5522 | VG board for CD SEM | spares | 31.05.1994 | 1 | as is where is | immediately |
108896 | Hitachi | RS4000 | Defect Review SEM | 300 mm | 01.06.2006 | 1 | as is where is | immediately |
103525 | HITACHI | S4700-l | Scanning Electron Microscope | Laboratory | 31.05.2004 | 1 | as is where is | immediately |
103526 | HITACHI | S4700-ll | FE Sem with Horriba EMAX EDX | Laboratory | 31.05.2001 | 1 | as is where is | immediately |
108902 | Hitachi | RS4000 | Defect Review SEM | 300 mm | 01.05.2007 | 1 | as is where is | immediately |
103527 | HITACHI | S4700-ll | FE Sem with Horriba EMAX EDX (Destocking Status) | Laboratory | 31.05.2003 | 1 | as is where is | immediately |
52339 | Hitachi | 545-5521 | EVAC PCB FOR HITACHI CD-SEM | spares | 31.05.1994 | 1 | as is where is | immediately |
52340 | Hitachi | 545-5537 | IP-PC2 for cd-sem | spares | 31.05.1994 | 1 | as is where is | immediately |
52343 | Hitachi | 377-7592 | Power Supply Module for CD SEM | spares | 31.05.1994 | 1 | as is where is | immediately |
108413 | Hitachi | CG4000 | SEM | 300 mm | 3 | as is where is | ||
108159 | HITACHI | S4700II | FE SEM with EDAX (Detecting Unit) | 1 | as is where is | |||
109183 | Hitachi | CG4000 | SEM - Critical Dimension (CD) Measurement | 300mm | 1 | as is where is | ||
108160 | HITACHI | CV4000 | High Voltage SEM | 300 mm | 01.06.2014 | 1 | as is where is | |
83849 | Hitachi | S4500 Type I | FE SEM | Laboratory | 01.05.1995 | 1 | inquire | immediately |
36518 | HITACHI | S-5000 | 1 | inquire | ||||
106662 | HITACHI | FB2100 | FIB | 200 mm | 01.06.2003 | 1 | as is where is | |
106663 | HITACHI | IS3000SE | WAFER PARTICLE INSPECTION | 300 mm | 01.06.2006 | 1 | as is where is | |
106664 | HITACHI | IS3200SE | WAFER PARTICLE INSPECTION | 300 mm | 01.06.2010 | 1 | as is where is | |
106665 | HITACHI | LS9000 | Wafer Surface Inspection | 300 mm | 01.06.2010 | 1 | as is where is | |
106666 | HITACHI | LS-6800 | Wafer Surface Inspection | 300 mm | 01.06.2007 | 1 | as is where is | |
102060 | Hitachi | 6280H | CD SEM Control Rack including qty 12 PC Boards in the rack | Spares | 12 | as is where is | immediately | |
106160 | HITACHI | RS6000 (Enhanced) | Defect Review SEM | 300 mm | 01.06.2013 | 1 | as is where is | immediately |
52166 | Hitachi | 545-5515 | DC power supply module for CD SEM | spares | 1 | as is where is | immediately | |
52167 | Hitachi | 6280H | Power Supply Module 4channels | spares | 1 | as is where is | immediately | |
52168 | Hitachi | 545-5540 | Power Supply unit for CD SEM | Spares | 1 | as is where is | immediately | |
108752 | HITACHI | S7000 | CD SEM | 150 mm | 01.05.1989 | 1 | as is where is | immediately |
98269 | HITACHI | RS 4000 | Defect Review SEM | 300 mm | 01.05.2003 | 1 | as is where is | immediately |
98270 | HITACHI | RS 4000 | Defect Review SEM | 300 mm | 01.05.2003 | 1 | as is where is | immediately |
109287 | Hitachi | SU 8010 | Ultra High Resolution Field Emission Scanning Electron Microscope | 100 mm | 01.06.2007 | 1 | as is where is | immediately |
18925 | HITACHI | 131-9008-1 | Model U-3210 / U 3410recording spectrophotometer available commands | 1 | as is where is | |||
18926 | HITACHI | 131-9007-1 | Model U3210 / U3410 Recording spectrophotometer operating procedure | 1 | as is where is | |||
109555 | Hitachi | IS3000 | DARK FIELD INSPECTION | 300 mm | 01.05.2007 | 1 | as is where is | |
109556 | Hitachi | HD2300 | STEM (Scanning Transmission Electron Microscope) | Laboratory | 01.06.2006 | 1 | as is where is | immediately |
109047 | Hitachi | RS5500 | Defect Review SEM with optional EDX | 300 mm | 01.07.2009 | 1 | as is where is | immediately |
109561 | Hitachi | S5500 | HIGH RESOLUTION INSPECTION SEM | Laboratory | 01.06.2014 | 1 | as is where is | immediately |
108027 | HITACHI | N-6000 | NANO PROBER | Laboratory | 01.09.2007 | 1 | as is where is |