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SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time | |
---|---|---|---|---|---|---|---|---|---|
110679 | KLA | Surfscan 6400 | Unpatterned wafer surface particle inspection system | 100-200 MM | 01.06.1994 | 1 | inquire | immediately | |
113798 | KLA | Surfscan 6400 | Metrology Particles measurement (laser) INSP.TOOLS | 150 mm | 01.06.1992 | 1 | as is where is |