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| SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time | |
|---|---|---|---|---|---|---|---|---|---|
| 111451 | Leica | INS 3000 | Microscope Inspection station | 200 mm | 01.01.1998 | 1 | as is where is | immediately | |
| 114187 | TEL Tokyo Electron | NS 300 | Wafer Scrubber | 300 mm | 1 | as is where is | |||
| 114188 | TEL Tokyo Electron | NS 300 | Wafer Scrubber | 300 mm | 1 | as is where is | |||
| 114189 | TEL Tokyo Electron | NS 300 | Wafer Scrubber | 300 mm | 1 | as is where is | |||
| 114190 | TEL Tokyo Electron | NS 300 | Wafer Scrubber | 300 mm | 1 | as is where is | |||
| 111935 | TEL TOKYO ELECTRON | NS 300 | Wafer Scrubber | 300mm | 12 | as is where is | |||
| 111938 | TEL TOKYO ELECTRON | NS 300Z | Wafer Scrubber | 300mm | 1 | as is where is |