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SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time | |
---|---|---|---|---|---|---|---|---|---|
103225 | ADE | NanoMapper FA | Nano-Defects Inspection System | 300 mm | 1 | inquire | immediately | ||
109554 | ADE | NANOMAPPER Phase Shift | nano defect inspection system | 300 mm | 01.11.2001 | 1 | as is where is | immediately | |
112210 | KLA | NANOMAPPER | Metrology Nanotopography | 300 mm | 01.06.2006 | 1 | as is where is | ||
112211 | KLA | NANOMAPPER | Metrology Nanotopography | 300 mm | 1 | as is where is | |||
112212 | KLA | NANOMAPPER | Metrology Nanotopography | 300 mm | 1 | as is where is | |||
112213 | KLA | NANOMAPPER | Metrology Nanotopography | 300 mm | 1 | as is where is |