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SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time | |
---|---|---|---|---|---|---|---|---|---|
112186 | Hitachi | IS3200SE | Metrology Dark field inspection | 300 mm | 01.06.2010 | 1 | as is where is | ||
112187 | Hitachi | IS3200SE | Metrology Dark Field Inspection | 300 mm | 01.06.2010 | 1 | as is where is | ||
112188 | Hitachi | IS3200SE | Metrology Dark Field Inspection | 300 mm | 01.06.2010 | 1 | as is where is | ||
113064 | HITACHI | IS3200SE | Wafer E-BEAM Inspection System | 300 mm | 01.06.2010 | 1 | as is where is | immediately |