The following are the items available for sale related to Ergolux at SDI fabsurplus.com. To inquire about the Ergolux equipment item you need, click on the relevant link below to get more details, and inquiry if interested. If no result is shown, please try to search for another item or inquiry us about your request of Ergolux items.
| SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time | |
|---|---|---|---|---|---|---|---|---|---|
| 113838 | LEICA | ERGOLUX 200 | Metrology Defect Inspection – Wafer Inspection Microscope | 150 mm | 01.06.1990 | 1 | as is where is | ||
| 113839 | LEICA | ERGOLUX 200 | Metrology Defect Inspection – Wafer Inspection Microscope | 150 mm | 01.06.1995 | 1 | as is where is | ||
| 113840 | LEICA | ERGOLUX 200 | Metrology Defect Inspection – Wafer Inspection Microscope | 150 mm | 01.06.1995 | 1 | as is where is | ||
| 113841 | LEICA | ERGOLUX 200 | Metrology Defect Inspection – Wafer Inspection Microscope | 150 mm | 01.06.1995 | 1 | as is where is | ||
| 113842 | LEICA | ERGOLUX 200 | Metrology Defect Inspection – Wafer Inspection Microscope | 150 mm | 01.06.1995 | 1 | as is where is | ||
| 113843 | LEICA | ERGOLUX 200 | Metrology Defect Inspection – Wafer Inspection Microscope | 150 mm | 01.06.1995 | 1 | as is where is | ||
| 113844 | LEICA | ERGOLUX 200 | Metrology Defect Inspection – Wafer Inspection Microscope | 150 mm | 01.06.1995 | 1 | as is where is | ||
| 113845 | LEICA | ERGOLUX 200 | Metrology Defect Inspection – Wafer Inspection Microscope | 150 mm | 01.06.1995 | 1 | as is where is | ||
| 113846 | LEICA | ERGOLUX 200 | Metrology Defect Inspection – Wafer Inspection Microscope | 150 mm | 01.06.1995 | 1 | as is where is | ||
| 113847 | LEICA | ERGOLUX 200 | Metrology Defect Inspection – Wafer Inspection Microscope | 150 mm | 01.06.1995 | 1 | as is where is | ||
| 113848 | LEICA | ERGOLUX 200 | Metrology Defect Inspection – Wafer Inspection Microscope | 150 mm | 01.06.1995 | 1 | as is where is | ||
| 113849 | LEICA | ERGOLUX 200 | Metrology Defect Inspection – Wafer Inspection Microscope | 150 mm | 01.06.1995 | 1 | as is where is | ||
| 113850 | LEICA | ERGOLUX 200 | Metrology Defect Inspection – Wafer Inspection Microscope | 150 mm | 01.06.1995 | 1 | as is where is | ||
| 113851 | LEICA | ERGOLUX 200 | Metrology Defect Inspection – Wafer Inspection Microscope | 150 mm | 01.06.1995 | 1 | as is where is | ||
| 113852 | LEICA | ERGOLUX 200 | Metrology Defect Inspection – Wafer Inspection Microscope | 150 mm | 01.06.1990 | 1 | as is where is | ||
| 113853 | LEICA | ERGOLUX 200 | Metrology Defect Inspection – Wafer Inspection Microscope | 150 mm | 01.06.1995 | 1 | as is where is | ||
| 113854 | LEICA | ERGOLUX 200 | Metrology Defect Inspection – Wafer Inspection Microscope | 150 mm | 01.06.1990 | 1 | as is where is | ||
| 113855 | LEICA | ERGOLUX 200 | Metrology Defect Inspection – Wafer Inspection Microscope | 150 mm | 01.06.1990 | 1 | as is where is | ||
| 113856 | LEICA | ERGOLUX 200 | Metrology Defect Inspection – Wafer Inspection Microscope | 150 mm | 01.06.1995 | 1 | as is where is | ||
| 113857 | LEICA | ERGOLUX 200 | Metrology Defect Inspection – Wafer Inspection Microscope | 150 mm | 01.06.1995 | 1 | as is where is | ||
| 113858 | LEICA | ERGOLUX 200 | Metrology Defect Inspection – Wafer Inspection Microscope | 150 mm | 01.06.1995 | 1 | as is where is | ||
| 112794 | Leitz | Ergolux | Microscope,Bright & Dark,Ref/Trans Light | 1 | as is where is | ||||
| 112795 | Leitz | Ergolux | Microscope,Bright & DarkReflected Light | 1 | as is where is | ||||
| 109017 | LEITZ | ERGOLUX AMC -LIS | Inspection microscopes | 1 |