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| SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time | |
|---|---|---|---|---|---|---|---|---|---|
| 83589 | Beckhoff | BK9000 | Ethernet interface module | Spares | 1 | as is where is | immediately | ||
| 108751 | GCA TROPEL | 9000 | Wafer Flatness Analyzer | 1 | as is where is | ||||
| 108568 | HITACHI | LS9000 | Wafer Surface Inspection System | 300mm | 01.06.2010 | 1 | as is where is | immediately | |
| 106665 | HITACHI | LS9000 | Wafer Surface Inspection | 300 mm | 01.06.2010 | 1 | as is where is | ||
| 106179 | Nanometrics | 9000 | Nanospec Wafer Metrology film thickness measurement tool | 200 mm | 01.06.2005 | 1 | as is all rebuilt | immediately | |
| 106959 | Nanometrics | 9000 (Spare Parts) | Spectroscopic Reflectometer | Spares | 01.06.2005 | 1 | as is where is | immediately | |
| 106960 | Nanometrics | 9000 (Spare Parts) | Computer Nanometrics P/n 7200-2432 | Spares | 01.06.2005 | 1 | as is where is | immediately | |
| 111245 | VARIAN | E59000002 | STANDOFF CERAMIC 1/2"L 3/8"OD 6-32 THD, CERAMIC, HIGH PURITY - XE/XER | Spares | 5 | inquire | |||
| 106755 | VISTEC | LWM9000 | CD SEM for 65 nm mask measurement | Reticle / 150 mm | 01.06.2005 | 1 | as is where is | immediately |