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SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time | |
---|---|---|---|---|---|---|---|---|---|
98481 | Nanometrics | 8000Xse | film thickness measurement | 200 mm | 2 | as is where is | immediately | ||
113876 | NANOMETRICS | 8000XSE | Metrology Thickness Measurement NANO | 150 mm | 01.06.1988 | 1 | as is where is | ||
113877 | NANOMETRICS | 8000XSE | Metrology Thickness Measurement NANO | 150 mm | 01.06.1988 | 1 | as is where is | ||
113878 | NANOMETRICS | 8000XSE | Metrology Thickness Measurement NANO | 150 mm | 01.06.1988 | 1 | as is where is | ||
113879 | NANOMETRICS | 8000XSE | Metrology Thickness Measurement NANO | 150 mm | 01.06.1997 | 1 | as is where is | ||
113880 | NANOMETRICS | 8000XSE | Metrology Thickness Measurement NANO | 150 mm | 01.06.1997 | 1 | as is where is |