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SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time | |
---|---|---|---|---|---|---|---|---|---|
108588 | SEMICS | OPUS2 | FULLY AUTOMATED PROBER | 300mm | 01.06.2007 | 1 | as is where is | immediately | |
108589 | SEMICS | OPUS2 | FULLY AUTOMATED PROBER | 300mm | 01.06.2007 | 1 | as is where is | immediately | |
108590 | SEMICS | OPUS2 | FULLY AUTOMATED PROBER | 300mm | 01.06.2007 | 1 | as is where is | immediately | |
108591 | SEMICS | OPUS2 | FULLY AUTOMATED PROBER | 300mm | 01.06.2007 | 1 | as is where is | immediately | |
108592 | SEMICS | OPUS3 | FULLY AUTOMATED PROBER | 300mm | 01.06.2011 | 1 | as is where is | immediately | |
108593 | SEMICS | OPUS3 | FULLY AUTOMATED PROBER | 300mm | 01.06.2011 | 1 | as is where is | immediately | |
112287 | Semics | OPUS3 | Wafer Probing | 200 mm, 300 mm | 01.06.2012 | 1 | as is where is | ||
113336 | SEMICS | OPUS 2 | Prober with Ambient and hot (Up to 150 C) | 300 mm | 01.06.2010 | 2 | as is where is | immediately | |
113337 | SEMICS | OPUS 3 | Prober with Ambient and hot (Up to 150 C) | 300 mm | 01.06.2010 | 2 | as is where is | immediately |