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| SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time | |
|---|---|---|---|---|---|---|---|---|---|
| 107027 | NANOMETRICS | Caliper Mosaic | Overlay measurement System | 300 mm | 01.08.2010 | 1 | inquire | immediately | |
| 109113 | Nanometrics | LynX 9010T | Optical CD Measurement (Scatterometry) system | 300 mm | 01.09.2008 | 1 | as is where is | immediately | |
| 106302 | Nanometrics | SIPHER | PL Mapping | 300 mm | 01.06.2002 | 1 | as is where is | immediately | |
| 106823 | Nanometrics | Nanospec 9100 | Oxide film thickness measurement (PC missing) | 200 mm | 01.03.2003 | 1 | as is where is | immediately | |
| 112242 | Nanometrics | Atlas II+ | Metrology Film Thickness Measurement | 300 mm | 1 | as is where is | |||
| 112243 | Nanometrics | Caliper Elan | Metrology Overlay | 200 mm | 01.06.2005 | 1 | as is where is | ||
| 112244 | Nanometrics | Caliper Mosaic | Metrology Overlay | 300 mm | 01.06.2009 | 1 | as is where is | ||
| 112245 | Nanometrics | Caliper Mosaic | Metrology Overlay | 300 mm | 01.06.2011 | 1 | as is where is | ||
| 112246 | Nanometrics | Caliper Mosaic | Metrology Overlay | 300 mm | 01.06.2009 | 1 | as is where is | ||
| 112247 | Nanometrics | Caliper Mosaic | Metrology Overlay | 300 mm | 01.06.2009 | 1 | as is where is | ||
| 103544 | NANOMETRICS | CALIPER ELAN | Overlay | 300 mm | 31.05.2004 | 1 | as is where is | ||
| 112248 | Nanometrics | Caliper Mosaic | Metrology Overlay | 300 mm | 01.06.2011 | 1 | as is where is | ||
| 112249 | Nanometrics | Caliper Mosaic | Metrology Overlay | 300 mm | 01.06.2011 | 1 | as is where is | ||
| 112250 | Nanometrics | NanoSpec AFT 180 | Metrology Thickness measurement | 150 mm | 1 | as is where is | |||
| 91526 | NANOMETRICS | Caliper Mosaic | Overlay | 300 mm | 31.05.2003 | 1 | as is where is | immediately | |
| 91529 | NANOMETRICS | Caliper Mosaic | Overlay | 300 mm | 28.02.2010 | 1 | as is where is | immediately | |
| 113579 | Nanometrics | RPM Blue | Photoluminescence measurement | 150 mm | 1 | as is where is | |||
| 98480 | Nanometrics | 8000X | film thickness measurement | 150 mm | 2 | as is where is | immediately | ||
| 98481 | Nanometrics | 8000Xse | film thickness measurement | 200 mm | 2 | as is where is | immediately | ||
| 98482 | Nanometrics | Caliper Mosaic (Parts) | EFEM Module, including a Brooks Razor robot | 300 mm | 1 | as is where is | immediately | ||
| 98483 | Nanometrics | Lynx EFEM | EFEM including a Kawasaki robot | 300 mm | 1 | as is where is | immediately | ||
| 108467 | Nanometrics | Tevet Trajectory T3 | Film Thickness Measurement System | 300 mm | 1 | as is where is | |||
| 106179 | Nanometrics | 9000 | Nanospec Wafer Metrology film thickness measurement tool | 200 mm | 01.06.2005 | 1 | as is all rebuilt | immediately | |
| 106959 | Nanometrics | 9000 (Spare Parts) | Spectroscopic Reflectometer | Spares | 01.06.2005 | 1 | as is where is | immediately | |
| 113103 | NANOMETRICS | CALIPER_MOSAIC | Optical Overlay measurement | 300 mm | 01.06.2003 | 1 | as is where is | ||
| 106960 | Nanometrics | 9000 (Spare Parts) | Computer Nanometrics P/n 7200-2432 | Spares | 01.06.2005 | 1 | as is where is | immediately | |
| 113104 | NANOMETRICS | CALIPER_MOSAIC | Optical Overlay measurement | 300 mm | 01.06.2001 | 1 | as is where is | immediately | |
| 101585 | NANOMETRICS | CALIPER ULTRA | Optical Overlay Measurement | 300 mm | 01.06.2006 | 1 | as is where is | immediately | |
| 113105 | NANOMETRICS | CALIPER_MOSAIC | Optical Overlay measurement | 300 mm | 1 | as is where is | |||
| 113107 | NANOMETRICS | CALIPER-ULTRA | Optical Overlay measurement | 300 mm | 01.06.2006 | 1 | as is where is | immediately | |
| 113875 | NANOMETRICS | 210 | Metrology Thickness Measurement NANO | 150 mm | 01.06.1988 | 1 | as is where is | ||
| 113876 | NANOMETRICS | 8000XSE | Metrology Thickness Measurement NANO | 150 mm | 01.06.1988 | 1 | as is where is | ||
| 113109 | NANOMETRICS | NANOSPEC 8000 | Film Thickness Measurement System | N/A | 01.06.1996 | 1 | as is where is | ||
| 113877 | NANOMETRICS | 8000XSE | Metrology Thickness Measurement NANO | 150 mm | 01.06.1988 | 1 | as is where is | ||
| 113878 | NANOMETRICS | 8000XSE | Metrology Thickness Measurement NANO | 150 mm | 01.06.1988 | 1 | as is where is | ||
| 113879 | NANOMETRICS | 8000XSE | Metrology Thickness Measurement NANO | 150 mm | 01.06.1997 | 1 | as is where is | ||
| 113880 | NANOMETRICS | 8000XSE | Metrology Thickness Measurement NANO | 150 mm | 01.06.1997 | 1 | as is where is | ||
| 98289 | NANOMETRICS | CALIPER ULTRA | Mask & Wafer Inspection | 300 mm | 31.05.2005 | 1 | as is where is | ||
| 98290 | NANOMETRICS | CALIPER ULTRA | Mask & Wafer Inspection | 300 mm | 31.05.2005 | 1 | as is where is | ||
| 98291 | NANOMETRICS | CALIPER ULTRA | Mask & Wafer Inspection | 300 mm | 30.06.2006 | 1 | as is where is | immediately |