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| SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time | |
|---|---|---|---|---|---|---|---|---|---|
| 111379 | Leica | INS3000 | Defect Inspection | 1 | as is where is | immediately | |||
| 111451 | Leica | INS 3000 | Microscope Inspection station | 200 mm | 01.01.1998 | 1 | as is where is | immediately | |
| 112785 | Leica | INM 100 | Microscope,Bright & Dark,Reflected Light | 1 | as is where is | ||||
| 112786 | Leica | INM20 | Microscope, BF/DF/DIC 200 | 1 | as is where is | ||||
| 112787 | Leica | POLYLITE 88 | Microscope, BF/DF/DIC 200 | 1 | as is where is | ||||
| 112788 | Leica | POLYLITE 88 | Microscope, Bright & Dark 200 | 1 | as is where is | ||||
| 112789 | Leica | POLYLITE 88 | Microscope, Bright & Dark 200 | 1 | as is where is | ||||
| 112790 | Leica | Polylite 88 | Microscope,Bright & Dark,Reflected Light | 2 | as is where is | ||||
| 112791 | Leica | Polylite 88 | Microscope,Bright & Dark,Reflected Light | 1 | as is where is | ||||
| 112792 | Leica | POLYLITE88 | Microscope,BF/DF/DIC,Reflected Light | 1 | as is where is | ||||
| 113563 | Leica | Mis 200 | Wafer Inspection Microscope | 150 mm | 01.06.1995 | 1 | as is where is | ||
| 113564 | Leica | Mis 200 | Wafer Inspection Microscope | 150 mm | 01.06.1995 | 1 | as is where is | ||
| 113837 | LEICA | INM200 | Metrology Defect Inspection – Wafer Inspection Microscope | 150 mm | 1 | as is where is | |||
| 113838 | LEICA | ERGOLUX 200 | Metrology Defect Inspection – Wafer Inspection Microscope | 150 mm | 01.06.1990 | 1 | as is where is | ||
| 113839 | LEICA | ERGOLUX 200 | Metrology Defect Inspection – Wafer Inspection Microscope | 150 mm | 01.06.1995 | 1 | as is where is | ||
| 113840 | LEICA | ERGOLUX 200 | Metrology Defect Inspection – Wafer Inspection Microscope | 150 mm | 01.06.1995 | 1 | as is where is | ||
| 113841 | LEICA | ERGOLUX 200 | Metrology Defect Inspection – Wafer Inspection Microscope | 150 mm | 01.06.1995 | 1 | as is where is | ||
| 113842 | LEICA | ERGOLUX 200 | Metrology Defect Inspection – Wafer Inspection Microscope | 150 mm | 01.06.1995 | 1 | as is where is | ||
| 113843 | LEICA | ERGOLUX 200 | Metrology Defect Inspection – Wafer Inspection Microscope | 150 mm | 01.06.1995 | 1 | as is where is | ||
| 113844 | LEICA | ERGOLUX 200 | Metrology Defect Inspection – Wafer Inspection Microscope | 150 mm | 01.06.1995 | 1 | as is where is | ||
| 113845 | LEICA | ERGOLUX 200 | Metrology Defect Inspection – Wafer Inspection Microscope | 150 mm | 01.06.1995 | 1 | as is where is | ||
| 113846 | LEICA | ERGOLUX 200 | Metrology Defect Inspection – Wafer Inspection Microscope | 150 mm | 01.06.1995 | 1 | as is where is | ||
| 113847 | LEICA | ERGOLUX 200 | Metrology Defect Inspection – Wafer Inspection Microscope | 150 mm | 01.06.1995 | 1 | as is where is | ||
| 113848 | LEICA | ERGOLUX 200 | Metrology Defect Inspection – Wafer Inspection Microscope | 150 mm | 01.06.1995 | 1 | as is where is | ||
| 113849 | LEICA | ERGOLUX 200 | Metrology Defect Inspection – Wafer Inspection Microscope | 150 mm | 01.06.1995 | 1 | as is where is | ||
| 113850 | LEICA | ERGOLUX 200 | Metrology Defect Inspection – Wafer Inspection Microscope | 150 mm | 01.06.1995 | 1 | as is where is | ||
| 113851 | LEICA | ERGOLUX 200 | Metrology Defect Inspection – Wafer Inspection Microscope | 150 mm | 01.06.1995 | 1 | as is where is | ||
| 113852 | LEICA | ERGOLUX 200 | Metrology Defect Inspection – Wafer Inspection Microscope | 150 mm | 01.06.1990 | 1 | as is where is | ||
| 113853 | LEICA | ERGOLUX 200 | Metrology Defect Inspection – Wafer Inspection Microscope | 150 mm | 01.06.1995 | 1 | as is where is | ||
| 113854 | LEICA | ERGOLUX 200 | Metrology Defect Inspection – Wafer Inspection Microscope | 150 mm | 01.06.1990 | 1 | as is where is | ||
| 113855 | LEICA | ERGOLUX 200 | Metrology Defect Inspection – Wafer Inspection Microscope | 150 mm | 01.06.1990 | 1 | as is where is | ||
| 113856 | LEICA | ERGOLUX 200 | Metrology Defect Inspection – Wafer Inspection Microscope | 150 mm | 01.06.1995 | 1 | as is where is | ||
| 113857 | LEICA | ERGOLUX 200 | Metrology Defect Inspection – Wafer Inspection Microscope | 150 mm | 01.06.1995 | 1 | as is where is | ||
| 113858 | LEICA | ERGOLUX 200 | Metrology Defect Inspection – Wafer Inspection Microscope | 150 mm | 01.06.1995 | 1 | as is where is |