Please find below a list of Used Laboratory and Scientific equipment for sale by fabsurplus.com . Click on any listed item of used Laboratory and Scientific equipment to see further data. In semiconductor wafer processing, You’re working on materials, fabrication techniques, devices. Helping to make semiconductor devices smaller, faster, lower-cost and more energy efficient. You’re making stronger materials, or more flexible, or lighter weight.Your job is to push boundaries. For that, you may need electron microscopes, FIBs, Lab power supplies, TEM sample preparation equipment, and many types of analytical equipment.
| SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time | |
|---|---|---|---|---|---|---|---|---|---|
| 109557 | BRUKER | Quantax 200 | Energy Dispersive X- Ray Spectrometer | Laboratory | 1 | as is where is | immediately | ||
| 80083 | COLUSSI | UG 50 E | AUTOCLAVE FOR STERILIZATION | Laboratory | 01.06.2000 | 1 | as is where is | immediately | |
| 113288 | FEI | Quanta 200 | Scanning Electron Microscope | Laboratory | 1 | inquire | immediately | ||
| 106009 | FEI Company | FIB 200 | Single Beam FIB | Laboratory | 01.06.2003 | 1 | as is where is | immediately | |
| 110602 | FEI Company | XL820 | Dualbeam FIB | 16.06.2001 | 1 | as is where is | |||
| 110704 | FEI Company | 820 | Dual beam FIB SEM | Laboratory | 1 | as is where is | immediately | ||
| 79892 | Gossen Konstanter | IEC625 | Laboratory Power supply Gossen Konstanter UOP | Electronics Test and Measurement | 1 | as is where is | immediately | ||
| 109287 | Hitachi | SU 8010 | Ultra High Resolution Field Emission Scanning Electron Microscope | 100 mm | 01.06.2007 | 1 | as is where is | immediately | |
| 109556 | Hitachi | HD2300 | STEM (Scanning Transmission Electron Microscope) | Laboratory | 01.06.2006 | 1 | as is where is | immediately | |
| 113306 | Hitachi | S5500 | High Resolution FE SEM | Laboratory | 1 | as is where is | immediately | ||
| 113319 | Hitachi | S-4700 | Scanning Electron Microscope | 01.06.2001 | 1 | as is where is | immediately | ||
| 77264 | HOLADAY | HI-1801 | MICROWAVE SURVEY METER | Laboratory | 2 | as is where is | immediately | ||
| 108907 | JEOL | JEM3200FS | High Resolution TEM | Laboratory | 01.05.2006 | 1 | as is where is | immediately | |
| 108771 | NICOLET | Magna 550 | FT-IR Spectrophotometer | Laboratory | 01.05.1993 | 1 | as is all rebuilt | immediately | |
| 108965 | Nikon | A1R | Confocal Laser Scanning Microscope with Prior Proscan III automated stage | Laboratory | 1 | as is where is | immediately | ||
| 109559 | Philips | PHI 680 | Auger Nanoprobe | Laboratory | 01.05.1998 | 1 | as is where is | immediately | |
| 109560 | SELA/Camtek | EM3i | Saw for TEM sample preparation | ASSEMBLY | 01.05.2011 | 1 | as is where is |