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| SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time |
|---|---|---|---|---|---|---|---|---|
| 109057 | Nikon | NSR-S307E | 193 nm (ArF) excimer exposure system | 300 mm | 1 | as is where is | immediately | |
| 106503 | Nikon | Auto Wafer Loader for Microscope Inspection | WAFER INSPECTION MICROSCOPE | 150 mm/200 mm | 1 | as is where is | immediately | |
| 109072 | Nikon | NSR-S208D | 248 nm (KrF) excimer exposure system | 300 mm | 01.06.2010 | 1 | as is where is | immediately |
| 110610 | NIKON | OptiStation 3 | Wafer Inspection Microscope | 200 mm | 1 | as is where is | immediately | |
| 110618 | NIKON | Optistation 3 | Wafer Inspection Microscope | 01.07.1994 | 1 | as is where is | immediately | |
| 103456 | Nikon | NWL860-TBM | Wafer Auto Loader | 150 mm, 200 mm | 1 | as is where is | ||
| 108854 | NIKON | NWL-860 | Automatic Microscope Wafer Loader for up to 200mm Wafers | 1 | inquire | |||
| 108087 | Nikon | 4S061-690-1 | Linear Motor Controller | spares | 1 | as is where is | ||
| 108855 | NIKON | Optiphot 200 | Wafer Inspection Microscope, B/Dfield & DIC Microscopy, Motorized Turret with 5ea Objectives, Prior ProScan Programmable Stage, 200mm X 200mm XY Travel, Color CCD Camera & More | 1 | inquire | |||
| 108088 | Nikon | 4S586-580 | NEST | spares | 1 | as is where is | ||
| 108089 | Nikon | Irradiance Meter | included G-line sensor | spares | 1 | as is where is | ||
| 108090 | Nikon | Irradiance Meter | included i-line sensor | spares | 1 | as is where is | immediately | |
| 108092 | Nikon | OPTIPHOT-200 | Wafer inspection microscope | 200 mm | 3 | as is where is | ||
| 108093 | Nikon | OPTIPHOT-300 | Wafer inspection microscope | 300 mm | 1 | as is where is | ||
| 108094 | Nikon | OPTIPHOT-88-AC IN | Wafer inspection microscope | 200 mm | 1 | as is where is | ||
| 108095 | Nikon | R1505A | test reticle | spares | 2 | as is where is | immediately | |
| 108096 | Nikon | R2005MF(VER3.09N), R2005HMF(VER5.09) | test reticle | spares | 2 | as is where is | ||
| 108097 | Nikon | R2205HA, HB, HDIS, HMF | test reticle | spares | 4 | as is where is | ||
| 108098 | Nikon | VT286 | Digital | spares | 2 | as is where is | ||
| 99396 | Nikon | EpiPhot 200 | Inspection Microscope | 200 mm | 1 | as is where is | immediately | |
| 103238 | NIKON | NSR-S620D | 193 NM immersion scanner (EXCIMER LASER NOT INCLUDED) | 300 mm | 1 | as is where is | immediately | |
| 110663 | Nikon | NSR-SF140 | I-LINE SCANNER | 300 mm | 1 | as is where is | immediately | |
| 110664 | Nikon | NSR-S204B | 248 nm (KrF) excimer exposure system | 200 mm | 1 | as is where is | immediately | |
| 108643 | Nikon | Eclipse L200 | Wafer Inspection Microscope | 150 mm/200 mm | 01.06.2006 | 1 | as is where is | immediately |
| 108904 | Nikon | NSR-S609B | ArF 193 nm scanner (Scanner) | 300 mm | 01.05.2005 | 1 | as is where is | immediately |
| 108923 | Nikon | NES1-H04 | Mini stepper | 100 mm | 01.05.2011 | 1 | as is where is | immediately |
| 109215 | Nikon | NSR-S308F | 193nm (ArF) Scanner | 300mm | 1 | as is where is | ||
| 108965 | Nikon | A1R | Confocal Laser Scanning Microscope with Prior Proscan III automated stage | Laboratory | 1 | as is where is | immediately | |
| 18867 | NIKON | 204402 | Operations manual NSR-1755I7A | 1 | as is where is | immediately | ||
| 98484 | Nikon | ECLIPSE L150 | Microscope | 100/150mm | 1 | as is where is | immediately | |
| 98485 | Nikon | Optiphot 150 | Microscope Inspection Station | 100/150mm | 3 | as is where is | immediately | |
| 106956 | Nikon | 4S061-688-5 | X Linear Motor Stage Amp | SPARES | 1 | as is where is | immediately | |
| 32206 | NIKON | RETICLE BOX 5 INCH | 5 INCH RETICLE BOX | 5 INCH | 2 | as is where is | immediately | |
| 106707 | NIKON | AMI-3300 | Wafer Inspection System | 300 mm | 1 | as is where is | ||
| 106708 | NIKON | AMI-3300 | Wafer Inspection System | 300 mm | 1 | as is where is | ||
| 106709 | NIKON | AMI-3500 | Wafer Inspection System | 300 mm | 1 | as is where is | ||
| 109278 | Nikon | NSR2205 i14E | i-line stepper | 200 mm | 01.05.2000 | 1 | as is where is | immediately |
| 109536 | Nikon | NSR-SF100 | i-line scan-field Stepper | 200 mm | 01.06.2003 | 1 | as is all rebuilt | immediately |
| 108772 | Nikon | Optistation 3 | Wafer Inspection System | 150 mm | 01.05.1994 | 1 | as is where is | immediately |
| 91376 | NIKON | NSR-204B | Scanner DUV (GIGAPHOTON G20K2 KRF laser) | 200 mm | 1 | as is where is | ||
| 108784 | Nikon | Optistation 3A | Automatic Wafer Inspection Station | 200 mm | 01.05.1997 | 1 | as is where is | immediately |
| 91377 | NIKON | NSR-204B | 248 nm (KrF) excimer exposure system | 200 mm | 01.06.2000 | 1 | as is where is | immediately |
| 108785 | NIKON | Optiphot 200 (For spares use) | Wafer Inspection Microscope (Parts Tool Only) | 200 mm | 1 | as is where is | immediately | |
| 108789 | Nikon | Optiphot 200 | Wafer Inspection Microscope | 200 mm | 1 | as is all rebuilt | immediately | |
| 108790 | NIKON | Optiphot 88 | Wafer Inspection Microscope | 200 mm | 1 | as is where is | immediately | |
| 109049 | Nikon | NSR-S204B | 248 nm (KrF) excimer exposure system | 200 mm | 01.06.2000 | 1 | as is where is | immediately |
| 109051 | Nikon | NSR-S203B | 248 nm (KrF) excimer exposure system | 200 mm | 01.06.1999 | 1 | as is where is | immediately |
| 109052 | Nikon | NSR-S203B | 248 nm (KrF) excimer exposure system | 200 mm | 01.06.1998 | 1 | as is where is | immediately |