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SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time |
---|---|---|---|---|---|---|---|---|
107027 | NANOMETRICS | Caliper Mosaic | Overlay measurement System | 300 mm | 01.08.2010 | 1 | inquire | immediately |
106302 | Nanometrics | SIPHER | PL Mapping | 300 mm | 01.06.2002 | 1 | as is where is | immediately |
106823 | Nanometrics | Nanospec 9100 | Ox film thickness measurement (PC missing) | 200mm | 1 | as is where is | immediately | |
103544 | NANOMETRICS | CALIPER ELAN | Overlay | 300 mm | 31.05.2004 | 1 | as is where is | |
91526 | NANOMETRICS | Caliper Mosaic | Overlay | 300 mm | 31.05.2003 | 1 | as is where is | immediately |
91529 | NANOMETRICS | Caliper Mosaic | Overlay | 300 mm | 28.02.2010 | 1 | as is where is | immediately |
91530 | NANOMETRICS | NANOMETRICS 9-7200-0195E | Mask & Wafer Inspection | 200 mm | 1 | as is where is | ||
108186 | NANOMETRICS | CALIPER_MOSAIC | Overlay | 300 mm | 01.06.2001 | 1 | as is where is | |
98480 | Nanometrics | 8000X | film thickness measurement | 150mm | 2 | as is where is | immediately | |
98481 | Nanometrics | 8000Xse | film thickness measurement | 200mm | 2 | as is where is | ||
98482 | Nanometrics | Caliper Mosaic (Parts) | EFEM Module, including a Brooks Razor robot | 300 mm | 1 | as is where is | immediately | |
108466 | Nanometrics | Atlas II+ | Critical Dimension (CD) Measurement (non SEM) | 300 mm | 1 | as is where is | ||
98483 | Nanometrics | Lynx EFEM | Kawasaki robot | 300 mm | 1 | as is where is | immediately | |
108467 | Nanometrics | Tevet Trajectory T3 | Film Thickness Measurement System | 300 mm | 1 | as is where is | ||
106179 | Nanometrics | 9000 | Nanospec Wafer Metrology film thickness measurement tool | 200 mm | 01.06.2005 | 1 | as is all rebuilt | immediately |
98508 | Nanometrics | M6100 | Film Thickness Measurement | 200 mm | 1 | as is where is | ||
106959 | Nanometrics | 9000 (Spare Parts) | Spectroscopic Reflectometer | Spares | 01.06.2005 | 1 | as is where is | immediately |
106960 | Nanometrics | 9000 (Spare Parts) | Computer Nanometrics P/n 7200-2432 | Spares | 01.06.2005 | 1 | as is where is | immediately |
101585 | NANOMETRICS | CALIPER-ULTRA | Overlay Measurement | 300 mm | 30.06.2006 | 1 | as is where is | |
106706 | NANOMETRICS | CALIPER_ULTRA | Mask & Wafer Inspection | 300 mm | 01.06.2006 | 1 | as is where is | |
98289 | NANOMETRICS | CALIPER ULTRA | Mask & Wafer Inspection | 300 mm | 31.05.2005 | 1 | as is where is | |
98290 | NANOMETRICS | CALIPER ULTRA | Mask & Wafer Inspection | 300 mm | 31.05.2005 | 1 | as is where is | |
98291 | NANOMETRICS | CALIPER ULTRA | Mask & Wafer Inspection | 300 mm | 30.06.2006 | 1 | as is where is | immediately |