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SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time |
---|---|---|---|---|---|---|---|---|
100923 | NANOMETRICS | ATLAS | Critical Dimension (CD) Measurement | 300 mm | 31.05.2006 | 1 | as is where is | |
98153 | Nanometrics | Caliper Mosaic | Overlay Measurement | 300 mm | 31.05.2011 | 1 | as is where is | |
98154 | Nanometrics | Caliper Mosaic | Overlay Measurement | 300 mm | 31.05.2009 | 1 | as is where is | |
98155 | Nanometrics | Caliper Mosaic | Overlay Measurement | 300 mm | 31.05.2009 | 1 | as is where is | |
103544 | NANOMETRICS | CALIPER ELAN | Overlay | 300 mm | 31.05.2004 | 1 | as is where is | |
91526 | NANOMETRICS | Caliper Mosaic | Overlay | 300 mm | 31.05.2003 | 1 | as is where is | immediately |
91527 | NANOMETRICS | Caliper Mosaic | Overlay | 300 mm | 31.05.2010 | 1 | as is where is | immediately |
91528 | NANOMETRICS | Caliper Mosaic | Overlay | 300 mm | 31.08.2009 | 1 | as is where is | immediately |
91529 | NANOMETRICS | Caliper Mosaic | Overlay | 300 mm | 28.02.2010 | 1 | as is where is | immediately |
92041 | Nanometrics | 9010B | Metrology | 1 | as is where is | immediately | ||
91530 | NANOMETRICS | NANOMETRICS 9-7200-0195E | Mask & Wafer Inspection | 200 mm | 1 | as is where is | ||
91531 | NANOMETRICS | NANOSPEC ATF210 | Film Thickness Measurement | 1 | as is where is | |||
92818 | Nanometrics | NanoSpec 210 | Metrology (Metrology) | 125 mm | 1 | as is where is | ||
86425 | Nanometrics | Nanospec AFT 210 | surface inspection | 125 mm | 1 | as is where is | ||
102309 | Nanometrics | Caliper Q300 | Overlay Measurement System | 300 mm | 31.05.2003 | 1 | as is where is | |
102310 | Nanometrics | Caliper Q300 | Overlay Measurement | 300 mm | 31.05.2003 | 1 | as is where is | |
102311 | Nanometrics | Caliper Q300 | Overlay Inspection | 300 mm | 31.05.2002 | 1 | as is where is | |
102312 | Nanometrics | Caliper Q300 | Overlay Measurement | 300 mm | 31.05.2002 | 1 | as is where is | |
102314 | Nanometrics | Q200I | Overlay Measurement System | 200 mm | 31.05.2000 | 1 | as is where is | |
102315 | Nanometrics | Q200I | Overlay Measurement | 200 mm | 31.05.2002 | 1 | as is where is | |
98480 | Nanometrics | 8000X | film thickness measurement | 150mm | 2 | as is where is | immediately | |
98481 | Nanometrics | 8000Xse | film thickness measurement | 200mm | 2 | as is where is | ||
98482 | Nanometrics | Caliper Mosaic (Parts) | EFEM Module, including a Brooks Razor robot | 300 mm | 1 | as is where is | immediately | |
98483 | Nanometrics | Lynx EFEM | Kawasaki robot | 300 mm | 1 | as is where is | immediately | |
102840 | NANOMETRICS | 9010 | Integrated Metrology System | 31.12.2007 | 5 | as is where is | immediately | |
106179 | Nanometrics | 9000 | Nanospec 9000 Metrology thickness tool | 200 mm | 01.06.2005 | 1 | as is all rebuilt | immediately |
98508 | Nanometrics | M6100 | Film Thickness Measurement | 200 mm | 1 | as is where is | ||
101585 | NANOMETRICS | CALIPER-ULTRA | Overlay Measurement | 300 mm | 30.06.2006 | 1 | as is where is | |
98289 | NANOMETRICS | CALIPER ULTRA | Mask & Wafer Inspection | 300 mm | 31.05.2005 | 1 | as is where is | |
98290 | NANOMETRICS | CALIPER ULTRA | Mask & Wafer Inspection | 300 mm | 31.05.2005 | 1 | as is where is | |
98291 | NANOMETRICS | CALIPER ULTRA | Mask & Wafer Inspection | 300 mm | 30.06.2006 | 1 | as is where is | immediately |