The following are the items available for sale related to Nanometrics at SDI fabsurplus.com. To inquire about the Nanometrics equipment item you need, click on the relevant link below to get more details, and inquiry if interested. If no result is shown, please try to search for another item or inquiry us about your request of Nanometrics items.
| SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time |
|---|---|---|---|---|---|---|---|---|
| 107027 | NANOMETRICS | Caliper Mosaic | Overlay measurement System | 300 mm | 01.08.2010 | 1 | inquire | immediately |
| 106302 | Nanometrics | SIPHER | PL Mapping | 300 mm | 01.06.2002 | 1 | as is where is | immediately |
| 106823 | Nanometrics | Nanospec 9100 | Ox film thickness measurement (PC missing) | 200mm | 1 | as is where is | immediately | |
| 103544 | NANOMETRICS | CALIPER ELAN | Overlay | 300 mm | 31.05.2004 | 1 | as is where is | |
| 91526 | NANOMETRICS | Caliper Mosaic | Overlay | 300 mm | 31.05.2003 | 1 | as is where is | immediately |
| 91529 | NANOMETRICS | Caliper Mosaic | Overlay | 300 mm | 28.02.2010 | 1 | as is where is | immediately |
| 91530 | NANOMETRICS | NANOMETRICS 9-7200-0195E | Mask & Wafer Inspection | 200 mm | 1 | as is where is | ||
| 108186 | NANOMETRICS | CALIPER_MOSAIC | Overlay | 300 mm | 01.06.2001 | 1 | as is where is | |
| 98480 | Nanometrics | 8000X | film thickness measurement | 150mm | 2 | as is where is | immediately | |
| 98481 | Nanometrics | 8000Xse | film thickness measurement | 200mm | 2 | as is where is | ||
| 98482 | Nanometrics | Caliper Mosaic (Parts) | EFEM Module, including a Brooks Razor robot | 300 mm | 1 | as is where is | immediately | |
| 108466 | Nanometrics | Atlas II+ | Critical Dimension (CD) Measurement (non SEM) | 300 mm | 1 | as is where is | ||
| 98483 | Nanometrics | Lynx EFEM | Kawasaki robot | 300 mm | 1 | as is where is | immediately | |
| 108467 | Nanometrics | Tevet Trajectory T3 | Film Thickness Measurement System | 300 mm | 1 | as is where is | ||
| 106179 | Nanometrics | 9000 | Nanospec Wafer Metrology film thickness measurement tool | 200 mm | 01.06.2005 | 1 | as is all rebuilt | immediately |
| 98508 | Nanometrics | M6100 | Film Thickness Measurement | 200 mm | 1 | as is where is | ||
| 106959 | Nanometrics | 9000 (Spare Parts) | Spectroscopic Reflectometer | Spares | 01.06.2005 | 1 | as is where is | immediately |
| 106960 | Nanometrics | 9000 (Spare Parts) | Computer Nanometrics P/n 7200-2432 | Spares | 01.06.2005 | 1 | as is where is | immediately |
| 101585 | NANOMETRICS | CALIPER-ULTRA | Overlay Measurement | 300 mm | 30.06.2006 | 1 | as is where is | |
| 106706 | NANOMETRICS | CALIPER_ULTRA | Mask & Wafer Inspection | 300 mm | 01.06.2006 | 1 | as is where is | |
| 98289 | NANOMETRICS | CALIPER ULTRA | Mask & Wafer Inspection | 300 mm | 31.05.2005 | 1 | as is where is | |
| 98290 | NANOMETRICS | CALIPER ULTRA | Mask & Wafer Inspection | 300 mm | 31.05.2005 | 1 | as is where is | |
| 98291 | NANOMETRICS | CALIPER ULTRA | Mask & Wafer Inspection | 300 mm | 30.06.2006 | 1 | as is where is | immediately |