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| SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time |
|---|---|---|---|---|---|---|---|---|
| 100923 | NANOMETRICS | ATLAS | Critical Dimension (CD) Measurement | 300 mm | 31.05.2006 | 1 | as is where is | |
| 98153 | Nanometrics | Caliper Mosaic | Overlay Measurement | 300 mm | 31.05.2011 | 1 | as is where is | |
| 98154 | Nanometrics | Caliper Mosaic | Overlay Measurement | 300 mm | 31.05.2009 | 1 | as is where is | |
| 98155 | Nanometrics | Caliper Mosaic | Overlay Measurement | 300 mm | 31.05.2009 | 1 | as is where is | |
| 103544 | NANOMETRICS | CALIPER ELAN | Overlay | 300 mm | 31.05.2004 | 1 | as is where is | |
| 91526 | NANOMETRICS | Caliper Mosaic | Overlay | 300 mm | 31.05.2003 | 1 | as is where is | immediately |
| 91527 | NANOMETRICS | Caliper Mosaic | Overlay | 300 mm | 31.05.2010 | 1 | as is where is | immediately |
| 91528 | NANOMETRICS | Caliper Mosaic | Overlay | 300 mm | 31.08.2009 | 1 | as is where is | immediately |
| 91529 | NANOMETRICS | Caliper Mosaic | Overlay | 300 mm | 28.02.2010 | 1 | as is where is | immediately |
| 92041 | Nanometrics | 9010B | Metrology | 1 | as is where is | immediately | ||
| 91530 | NANOMETRICS | NANOMETRICS 9-7200-0195E | Mask & Wafer Inspection | 200 mm | 1 | as is where is | ||
| 91531 | NANOMETRICS | NANOSPEC ATF210 | Film Thickness Measurement | 1 | as is where is | |||
| 92818 | Nanometrics | NanoSpec 210 | Metrology (Metrology) | 125 mm | 1 | as is where is | ||
| 86425 | Nanometrics | Nanospec AFT 210 | surface inspection | 125 mm | 1 | as is where is | ||
| 102309 | Nanometrics | Caliper Q300 | Overlay Measurement System | 300 mm | 31.05.2003 | 1 | as is where is | |
| 102310 | Nanometrics | Caliper Q300 | Overlay Measurement | 300 mm | 31.05.2003 | 1 | as is where is | |
| 102311 | Nanometrics | Caliper Q300 | Overlay Inspection | 300 mm | 31.05.2002 | 1 | as is where is | |
| 102312 | Nanometrics | Caliper Q300 | Overlay Measurement | 300 mm | 31.05.2002 | 1 | as is where is | |
| 102314 | Nanometrics | Q200I | Overlay Measurement System | 200 mm | 31.05.2000 | 1 | as is where is | |
| 102315 | Nanometrics | Q200I | Overlay Measurement | 200 mm | 31.05.2002 | 1 | as is where is | |
| 98480 | Nanometrics | 8000X | film thickness measurement | 150mm | 2 | as is where is | immediately | |
| 98481 | Nanometrics | 8000Xse | film thickness measurement | 200mm | 2 | as is where is | ||
| 98482 | Nanometrics | Caliper Mosaic (Parts) | EFEM Module, including a Brooks Razor robot | 300 mm | 1 | as is where is | immediately | |
| 98483 | Nanometrics | Lynx EFEM | Kawasaki robot | 300 mm | 1 | as is where is | immediately | |
| 102840 | NANOMETRICS | 9010 | Integrated Metrology System | 31.12.2007 | 5 | as is where is | immediately | |
| 106179 | Nanometrics | 9000 | Nanospec 9000 Metrology thickness tool | 200 mm | 01.06.2005 | 1 | as is all rebuilt | immediately |
| 98508 | Nanometrics | M6100 | Film Thickness Measurement | 200 mm | 1 | as is where is | ||
| 101585 | NANOMETRICS | CALIPER-ULTRA | Overlay Measurement | 300 mm | 30.06.2006 | 1 | as is where is | |
| 98289 | NANOMETRICS | CALIPER ULTRA | Mask & Wafer Inspection | 300 mm | 31.05.2005 | 1 | as is where is | |
| 98290 | NANOMETRICS | CALIPER ULTRA | Mask & Wafer Inspection | 300 mm | 31.05.2005 | 1 | as is where is | |
| 98291 | NANOMETRICS | CALIPER ULTRA | Mask & Wafer Inspection | 300 mm | 30.06.2006 | 1 | as is where is | immediately |