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| SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time | |
|---|---|---|---|---|---|---|---|---|---|
| 113520 | KLA | AIT 1 | Wafer Particle Detection | 150 mm | 01.12.1997 | 1 | as is where is | ||
| 113521 | KLA | ALTAIR 8920 | Defect inspection system | 150 mm | 01.06.2017 | 1 | as is where is | ||
| 113522 | KLA | FT-700 | Thickness measurement | 150 mm | 01.06.1992 | 1 | as is where is | ||
| 113523 | KLA | FT-700 | Thickness measurement | 150 mm | 01.06.1995 | 1 | as is where is | ||
| 113524 | KLA | FT-700 | Thickness measurement | 150 mm | 01.06.1995 | 1 | as is where is | ||
| 113525 | KLA | RS 35C | Resistivity measurment | 150 mm | 01.06.1992 | 1 | as is where is | ||
| 113526 | KLA | RS 35C | Resistivity measurment | 150 mm | 01.06.1990 | 1 | as is where is | ||
| 113527 | KLA | SURFSCAN 6200 | Defect inspection system | 150 mm | 01.06.1992 | 1 | as is where is | ||
| 113528 | KLA | SURFSCAN 6220 | Defect inspection system | 150 mm | 01.06.1992 | 1 | as is where is | ||
| 113529 | KLA | SURFSCAN 6220 | Defect inspection system | 200 mm | 01.06.1992 | 1 | as is where is | ||
| 113530 | KLA | SURFSCAN 7700 | Defect inspection system | 150 mm | 01.06.1996 | 1 | as is where is | ||
| 113531 | KLA | SURFSCAN 7700 | Defect inspection system | 150 mm | 01.06.1995 | 1 | as is where is | ||
| 113532 | KLA | SURFSCAN 7700 | Defect inspection system | 150 mm | 01.06.1996 | 1 | as is where is | ||
| 113533 | KLA | uv1280 | Thickness measurement | 150 mm | 01.06.1995 | 1 | as is where is | ||
| 113534 | KLA | uv1280 | Thickness measurement | 200 mm | 01.06.1997 | 1 | as is where is | ||
| 113535 | KLA | uv1280 | Thickness measurement | 150 mm | 01.06.1999 | 1 | as is where is | ||
| 86672 | KLA Tencor | 710-661729-00 | PC Board, KLA 21XX | Spares | 1 | as is where is | immediately | ||
| 95117 | KLA - Tencor | 259 | Image Digitizer Assembly | SPARES | 2 | as is where is | immediately | ||
| 111395 | KLA -TENCOR | P-22H | Step Height Measurement Tool (Refurbished) | 1 | inquire | ||||
| 34117 | KLA -TENCOR | 7700 | CASSETTE PLATE + PCB 8" | SPARES | 01.09.1995 | 1 | immediately | ||
| 34126 | KLA -Tencor | 7700m (Spares) | Mirror Curved | SPARES | 1 | as is where is | immediately | ||
| 34137 | KLA -Tencor | 7700m | p/n 199958 Rev F PCB PSF Driver SFS75 | SPARES | 1 | as is where is | immediately | ||
| 83562 | KLA -TENCOR | 7700M (Spares) | CONCAVE MIRROR 201969 - Optical part from KLA 7700M Surfscan | Spares | 1 | as is where is | immediately | ||
| 113287 | KLA -TENCOR | 259 with RIA 2 | Reticle Inspection system with die to database computer | up to 7 inch | 01.03.1991 | 1 | inquire | immediately | |
| 83624 | KLA -Tencor | 8100 (Spares) | load lock assembly for CD-SEM | SPARES | 01.06.1998 | 1 | as is where is | immediately | |
| 108075 | KLA Tencor | 2131 | Wafer Defect Inspection | 150 mm | 1 | as is where is | |||
| 34140 | KLA TENCOR | 7700M | COMPUTER HARD DISK | 1 | as is where is | immediately | |||
| 83555 | KLA TENCOR | 720-05721000 | CONTROL CHASSIS FOR KLA 8100 Column Control Chassis | 2 | as is where is | immediately | |||
| 83572 | KLA TENCOR | 720-05887-000 | MCP DETECTOR CONTROL CHASSIS | SPARES | 01.02.1997 | 1 | as is where is | immediately | |
| 83574 | KLA TENCOR | 720-05887-000 | MCP DETECTOR CONTROL CHASSIS | 150 WATTS | 01.02.1997 | 1 | as is where is | immediately | |
| 83577 | KLA TENCOR | 7700 M | MODEL 2214-30SLOTT | D1,D2,D3 | 01.09.1998 | 1 | as is where is | immediately | |
| 31612 | KLA TENCOR | 8100 | PART 740 05584 000 C CONNECTOR INTERFACE | 3 | as is where is | ||||
| 83581 | KLA TENCOR | 720-05888-000 | TFE GUN CONTROLLER CHASSIS | 230 WATTS | 01.02.1997 | 1 | as is where is | immediately | |
| 108165 | KLA TENCOR | Surfscan 7200 | Surfscan wafer particle detection | 150 mm,200 mm | 01.06.1991 | 1 | as is where is | ||
| 108166 | KLA TENCOR | Surfscan 7200 | Surfscan wafer particle detection | 150 mm,200 mm | 01.06.1990 | 1 | as is where is | ||
| 83614 | KLA TENCOR | HA-200 | RADIATION POWER SYSTEMS INC. Mercury Lamp psu FOR KLA 2XX reticle inspection systems | SPARES | 1 | as is where is | immediately | ||
| 27808 | KLA TENCOR | 720-07335-000 | ADVANTECH COMPUTER ICP-6751 FOR KLA 81XX CD SEM | Spares | 1 | as is where is | immediately | ||
| 111524 | KLA TENCOR | SURFSCAN AIT | Surfscan Wafer particle Detection System (missing Parts) | 200 MM | 01.06.1999 | 1 | as is where is | immediately | |
| 21670 | KLA Tencor | 213780 REV C | PCB PFE 4K MASK ASSY SFS 7500 | SPARES | 01.02.1996 | 1 | inquire | immediately | |
| 21671 | KLA Tencor | 244143 REV B | PCB ADC PFE I/F 576 ASSY | SPARES | 01.02.1996 | 1 | inquire | immediately | |
| 106674 | KLA TENCOR | Viper 2430 | Macro Defect Inspection | 300 mm | 01.06.2004 | 1 | as is where is | immediately | |
| 106675 | KLA TENCOR | Viper 2435 | Macro Defect Inspection | 300 mm | 01.06.2004 | 1 | as is where is | ||
| 106676 | KLA TENCOR | Viper 2435XP | Macro Defect Inspection | 300 mm | 01.06.2004 | 1 | as is where is | ||
| 106678 | KLA TENCOR | CI T1X0 | package inspection system | 300 mm | 01.06.2006 | 1 | as is where is | immediately | |
| 83895 | KLA TENCOR | 7700M (Spares) | PIN DIODE PRE AMP PCB | SPARES | 31.05.1992 | 1 | as is where is | immediately | |
| 83898 | KLA TENCOR | 7700M (Spares) | Optical sub-assembly | SPARES | 1 | as is where is | immediately | ||
| 83899 | KLA TENCOR | 7700M (Spares) | Lens assembly | SPARES | 2 | as is where is | immediately | ||
| 83900 | KLA TENCOR | 7700 | Mechanical part | SPARES | 1 | as is where is | immediately | ||
| 32230 | KLA TENCOR | SFS6400 MECHANICAL CALIBRATION Document Number 238 | WAFERSURFACE ANALYSIS SYSTEM CUSTOMER MAINTENANCE REFERENCE | MANUAL | 1 | as is where is | immediately | ||
| 32231 | KLA TENCOR | Surfscan 64X0 Calibration Procedure | Surfscan 64X0 Calibration Procedure | MANUAL | 1 | as is where is | immediately | ||
| 32232 | KLA TENCOR | surfscan 64XX optical alignments Document Number 236 | WAFER SURFACE ANALYSIS SYSTEM MAINTENANCE REFERENCE | MANUAL | 1 | as is where is | immediately | ||
| 32233 | KLA TENCOR | SFS6x00 MECHANICAL CALIBRATION Document number 200 | WAFER SURFACE ANALYSIS SYSTEM MAINTENANCE REFERENCE | MANUAL | 1 | as is where is | immediately | ||
| 106481 | KLA Tencor | AIT I | Patterned Surface Inspection System | 150 mm/200 mm | 01.06.1995 | 1 | as is where is | immediately |