The following are the items available for sale related to JEOL at SDI fabsurplus.com. To inquire about the JEOL equipment item you need, click on the relevant link below to get more details, and inquiry if interested. If no result is shown, please try to search for another item or inquiry us about your request of JEOL items.
| SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time |
|---|---|---|---|---|---|---|---|---|
| 87828 | Jeol | JWS7555 | Scanning Electron Microscopes | 200 mm | 31.12.1999 | 1 | as is where is | immediately |
| 91422 | JEOL | JSM-5600 | FE SEM | 31.05.1999 | 1 | as is where is | ||
| 91423 | JEOL | JSM-6340F | FE SEM | 1 | as is where is | |||
| 91424 | JEOL | JSM-6700F | FE SEM | 1 | as is where is | |||
| 91425 | JEOL | JWS-7515 | WAFER INSPECTION | 1 | as is where is | |||
| 91426 | JEOL | JWS-7515 | WAFER INSPECTION | 1 | as is where is | |||
| 103460 | Jeol | JSM6400 | Scanning Electron Microscope | Laboratory | 31.05.1992 | 1 | as is where is | immediately |
| 102705 | JEOL | JFS-9855S | Focused Ion Beam System | 200mm | 31.05.2000 | 1 | as is where is | immediately |
| 102968 | JEOL | JSM-7500F | SEM | Laboratory | 31.05.2009 | 1 | as is where is | |
| 87098 | JEOL | JWS-7505 | Defect review SEM w/ EDX, untested | 200 mm | 31.12.2000 | 1 | as is where is | |
| 92220 | JEOL | JWS-7555 | SEM - Defect Review (DR) | 200mm | 1 | as is where is | immediately | |
| 101692 | Jeol | JSM-6060LV | SEM | 1 | inquire | immediately | ||
| 87627 | JEOL | JSM 6400 | Scanning Electron Microscope | 1 | as is where is | immediately | ||
| 98123 | JEOL | ARM200CF Super X | PFA | 31.05.2014 | 1 | as is where is | ||
| 105807 | JEOL | JEM-2500SE | Transmission Electron Microscope | 300 mm | 1 | as is where is | ||
| 105808 | JEOL | JEM-2500SE | Transmission Electron Microscope | 300 mm | 1 | as is where is | ||
| 102486 | Jeol | JSM-6600F | SEM | 31.05.2014 | 1 | as is where is | immediately | |
| 102244 | JEOL | JEM3200FS | High Resolution TEM | 300 mm | 31.05.2006 | 1 | as is where is | |
| 102245 | JEOL | JWS-7515 | SEM Wafer Inspection Tool | 200 mm | 31.05.1999 | 1 | as is where is | |
| 102246 | JEOL | JWS-7555 | SEM Wafer Inspection Tool | 200 mm | 31.05.2000 | 1 | as is where is | |
| 102247 | JEOL | JWS-7555 | SEM Wafer Inspection Tool | 200 mm | 31.05.2002 | 1 | as is where is | |
| 93311 | JEOL | JSM-6320 | Field Emission SEM | Laboratory | 1 | as is where is | immediately | |
| 100991 | Jeol | JWS7500E w/Noran EDX | Wafer Inspection System (SEM) | 200 mm | 31.05.2000 | 1 | as is where is | immediately |
| 92068 | JEOL | JSM 6400F | Scanning Electron Microscope | 1 | as is where is | immediately | ||
| 97999 | JEOL | JWS 7700 | DR SEM | 200 mm | 31.05.1996 | 1 | as is where is | |
| 36564 | JEOL | CD-SEM, JSM-6340F | JEOL | 1 | inquire | |||
| 103158 | Jeol | JSM-6400F | SEM | 31.05.2017 | 1 | inquire | ||
| 91899 | Jeol | jSM 6330F | FIELD EMISSION SEM | 1 | as is where is | immediately | ||
| 102651 | Jeol | JEM-2100 | TEM | 1 | inquire | 1 month | ||
| 102652 | Jeol | JSM-7001 | FLV SEM | 1 | inquire | 1 month | ||
| 102653 | Jeol | JEM-2500SE | TEM | 1 | inquire | 1 month |