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| SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time |
|---|---|---|---|---|---|---|---|---|
| 109620 | ASML | PAS 5500/55A | I-line Stepper | 1 | inquire | |||
| 110674 | ASML | PAS 5500/80B | i line stepper | 100-200 MM | 01.06.1993 | 1 | as is where is | immediately |
| 108385 | ASML | TWINSCAN AT:850D | 248nm (KrF) Scanner | 300 mm | 1 | as is where is | ||
| 108387 | ASML | YieldStar S-100B | Overlay Measurement System | 300 mm | 1 | as is where is | ||
| 109156 | ASML | TWINSCAN AT:400 | i-Line Scanner | 300mm | 1 | as is where is | ||
| 109157 | ASML | TWINSCAN AT:850C | 248nm (KrF) Scanner | 300mm | 1 | as is where is | ||
| 109158 | ASML | YieldStar S-200B | Overlay Measurement System | 300mm | 1 | as is where is | ||
| 109159 | ASML | YieldStar S-250 | Overlay Measurement System | 300mm | 1 | as is where is | ||
| 108918 | ASML | XT1250D | ArF Lithography Scanner | 300 mm | 01.05.2004 | 1 | as is where is | immediately |
| 108151 | ASML | XT1400E | 193 nm DUV SCANNER(ARF) | 300 mm | 01.06.2005 | 1 | as is where is | immediately |
| 109007 | ASML | Twinscan XT400F | i LINE SCANNER | 300 mm | 1 | as is where is | immediately | |
| 109280 | ASML | XT 1950Hi | DUV Wafer scanner | 300 mm | 1 | as is where is | immediately | |
| 109286 | ASML | Twinscan AT850B | 193nm DUV Scanner | 300 mm | 01.11.2002 | 1 | as is where is | immediately |
| 109547 | ASML | XT1460K | 193 nm (ArF) excimer exposure system | 300 mm | 01.12.2017 | 1 | as is where is | 3 months |
| 109551 | ASML | TWINSCAN XT1250D | 193nm (ArF) Scanner - Cymer laser not included | 300 mm | 01.05.2004 | 1 | as is where is | immediately |
| 109563 | ASML | NXT 2000i | DUV Immersion scanner | 300 mm | 01.12.2020 | 1 | as is where is | |
| 109055 | ASML | Yieldstar S200B | Wafer metrology system | 300 mm | 01.06.2011 | 1 | as is where is | immediately |