Please find below an alphabetically ordered list of used semiconductor manufacturing equipment , test equipment, assembly equipment and SMT equipment we have for sale, updated in real time on fabsurplus.com via the SDI worldwide "DataNET".
| SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time |
|---|---|---|---|---|---|---|---|---|
| 111349 | 12 inch | PARTIAL | Wafer Fab Line, including 300 mm equipment from ASML, AMAT, TEL, Canon, Nikon and KLA etc. | 300 mm | 01.06.2010 | 94 | as is where is | immediately |
| 110771 | 8 inch | Complete | Wafer fab Line | 200 mm | 01.06.2000 | 1 | inquire | immediately |
| 108645 | 8 inch / 6 inch | Partial | Bumping Wafer Fab Line | 150 mm / 200 mm | 01.06.2005 | 79 | as is where is | immediately |
| 110670 | Complete | G5.5 | Flat Panel Display Production line | 1300mm x 1500mm | 01.06.2004 | 1021 | as is where is | immediately |
| 110753 | CYMER | ELS-6400 | 248 NM DUV Excimer Laser | Facilities | 01.06.2002 | 1 | as is where is | immediately |
| 18867 | NIKON | 204402 | Operations manual NSR-1755I7A | 1 | as is where is | immediately | ||
| 32206 | NIKON | RETICLE BOX 5 INCH | 5 INCH RETICLE BOX | 5 INCH | 2 | as is where is | immediately | |
| 91376 | NIKON | NSR-204B | Scanner DUV (GIGAPHOTON G20K2 KRF laser) | 200 mm | 1 | as is where is | ||
| 91377 | NIKON | NSR-204B | 248 nm (KrF) excimer exposure system | 200 mm | 01.06.2000 | 1 | as is where is | immediately |
| 98484 | Nikon | ECLIPSE L150 | Microscope | 100/150mm | 1 | as is where is | immediately | |
| 98485 | Nikon | Optiphot 150 | Microscope Inspection Station | 100/150mm | 3 | as is where is | immediately | |
| 99396 | Nikon | EpiPhot 200 | Inspection Microscope | 200 mm | 1 | as is where is | immediately | |
| 103456 | Nikon | NWL860-TBM | Wafer Auto Loader | 150 mm, 200 mm | 1 | as is where is | ||
| 106503 | Nikon | Auto Wafer Loader for Microscope Inspection | WAFER INSPECTION MICROSCOPE | 150 mm/200 mm | 1 | as is where is | immediately | |
| 106707 | NIKON | AMI-3300 | Wafer Inspection System | 300 mm | 1 | as is where is | ||
| 106708 | NIKON | AMI-3300 | Wafer Inspection System | 300 mm | 1 | as is where is | ||
| 106709 | NIKON | AMI-3500 | Wafer Inspection System | 300 mm | 1 | as is where is | ||
| 106956 | Nikon | 4S061-688-5 | X Linear Motor Stage Amp | SPARES | 1 | as is where is | immediately | |
| 108087 | Nikon | 4S061-690-1 | Linear Motor Controller | spares | 1 | as is where is | ||
| 108088 | Nikon | 4S586-580 | NEST | spares | 1 | as is where is | ||
| 108089 | Nikon | Irradiance Meter | included G-line sensor | spares | 1 | as is where is | ||
| 108090 | Nikon | Irradiance Meter | included i-line sensor | spares | 1 | as is where is | immediately | |
| 108092 | Nikon | OPTIPHOT-200 | Wafer inspection microscope | 200 mm | 3 | as is where is | ||
| 108093 | Nikon | OPTIPHOT-300 | Wafer inspection microscope | 300 mm | 1 | as is where is | ||
| 108094 | Nikon | OPTIPHOT-88-AC IN | Wafer inspection microscope | 200 mm | 1 | as is where is | ||
| 108095 | Nikon | R1505A | test reticle | spares | 2 | as is where is | immediately | |
| 108096 | Nikon | R2005MF(VER3.09N), R2005HMF(VER5.09) | test reticle | spares | 2 | as is where is | ||
| 108097 | Nikon | R2205HA, HB, HDIS, HMF | test reticle | spares | 4 | as is where is | ||
| 108098 | Nikon | VT286 | Digital | spares | 2 | as is where is | ||
| 108643 | Nikon | Eclipse L200 | Wafer Inspection Microscope | 150 mm/200 mm | 01.06.2006 | 1 | as is where is | immediately |
| 108772 | Nikon | Optistation 3 | Wafer Inspection System | 150 mm | 01.05.1994 | 1 | as is where is | immediately |
| 108784 | Nikon | Optistation 3A | Automatic Wafer Inspection Station | 200 mm | 01.05.1997 | 1 | as is where is | immediately |
| 108785 | NIKON | Optiphot 200 (For spares use) | Wafer Inspection Microscope (Parts Tool Only) | 200 mm | 1 | as is where is | immediately | |
| 108789 | Nikon | Optiphot 200 | Wafer Inspection Microscope | 200 mm | 1 | as is all rebuilt | immediately | |
| 108790 | NIKON | Optiphot 88 | Wafer Inspection Microscope | 200 mm | 1 | as is where is | immediately | |
| 108854 | NIKON | NWL-860 | Automatic Microscope Wafer Loader for up to 200mm Wafers | 1 | inquire | |||
| 108855 | NIKON | Optiphot 200 | Wafer Inspection Microscope, B/Dfield & DIC Microscopy, Motorized Turret with 5ea Objectives, Prior ProScan Programmable Stage, 200mm X 200mm XY Travel, Color CCD Camera & More | 1 | inquire | |||
| 108904 | Nikon | NSR-S609B | ArF 193 nm scanner (Scanner) | 300 mm | 01.05.2005 | 1 | as is where is | immediately |
| 108923 | Nikon | NES1-H04 | Mini stepper | 100 mm | 01.05.2011 | 1 | as is where is | immediately |
| 108965 | Nikon | A1R | Confocal Laser Scanning Microscope with Prior Proscan III automated stage | Laboratory | 1 | as is where is | immediately | |
| 109051 | Nikon | NSR-S203B | 248 nm (KrF) excimer exposure system | 200 mm | 01.06.1999 | 1 | as is where is | immediately |
| 109052 | Nikon | NSR-S203B | 248 nm (KrF) excimer exposure system | 200 mm | 01.06.1998 | 1 | as is where is | immediately |
| 109057 | Nikon | NSR-S307E | 193 nm (ArF) excimer exposure system | 300 mm | 1 | as is where is | immediately | |
| 109072 | Nikon | NSR-S208D | 248 nm (KrF) excimer exposure system | 300 mm | 01.06.2010 | 1 | as is where is | immediately |
| 109215 | Nikon | NSR-S308F | 193nm (ArF) Scanner | 300mm | 1 | as is where is | ||
| 109278 | Nikon | NSR2205 i14E | i-line stepper | 200 mm | 01.05.2000 | 1 | as is where is | immediately |
| 109536 | Nikon | NSR-SF100 | i-line scan-field Stepper | 200 mm | 01.06.2003 | 1 | as is all rebuilt | immediately |
| 110610 | NIKON | OptiStation 3 | Wafer Inspection Microscope | 200 mm | 1 | as is where is | immediately | |
| 110618 | NIKON | Optistation 3 | Wafer Inspection Microscope | 01.07.1994 | 1 | as is where is | immediately | |
| 110663 | Nikon | NSR-SF140 | I-LINE SCANNER | 300 mm | 1 | as is where is | immediately | |
| 110664 | Nikon | NSR-S204B | 248 nm (KrF) excimer exposure system | 200 mm | 1 | as is where is | immediately | |
| 110690 | Nikon | NSR 2205 I11D | i line Stepper | 200 mm | 01.06.1997 | 1 | as is where is | immediately |
| 110691 | Nikon | NSR 2205 I9C | i line Stepper | 200 mm | 01.06.1994 | 1 | as is where is | immediately |
| 110692 | Nikon | NSR S204B | 248 nm DUV Scanner | 200 mm | 1 | as is where is | immediately | |
| 110695 | Nikon | NWL 860 TMB | Wafer Inspection Microscope with wafer autoloader | 150 mm, 200 mm | 1 | as is where is | immediately | |
| 110729 | Nikon | NSR-S204B | Photo-lithography 248 NM DUV Scanner with photo-track | 300 MM | 01.06.2002 | 1 | as is where is | immediately |
| 110791 | Nikon | OptiStation 3200 | Fully Automated Wafer Inspection Microscope | 300 mm | 1 | as is where is | immediately | |
| 111339 | Nikon | NSR-SF200 | KrF Excimer Scan-Field Stepper | 150 mm | 01.06.2003 | 1 | as is where is | immediately |
| 111344 | Nikon | NSR-S208D | 248 nm Lithography System | 300 mm | 01.06.2008 | 1 | as is where is | immediately |
| 111345 | Nikon | NSR-S208D | 248 nm Lithography System | 300 mm | 01.06.2011 | 2 | as is where is | immediately |
| 103622 | TEL Tokyo Electron | LITHIUS | SINGLE BLOCK 2C/3D system (for NIKON S308) | 300 mm | 31.05.2006 | 1 | as is where is | |
| 103623 | TEL Tokyo Electron | LITHIUS | SINGLE BLOCK (for NIKON S205) | 300 mm | 31.05.2006 | 1 | as is where is | |
| 103624 | TEL Tokyo Electron | LITHIUS | SINGLE BLOCK 2C/3D system (for NIKON S308) | 300 mm | 31.05.2004 | 1 | as is where is | |
| 108606 | TEL Tokyo Electron | I/F Block (Mark8 - i11D) | Track interface block for Nikon i11D | 200 mm | 01.05.1997 | 1 | as is where is | |
| 110752 | TEL Tokyo Electron | ACT 12 | Double Block DUV Photoresist Coater and Developer Track | 300 mm | 01.01.2009 | 1 | as is where is | immediately |
| 108607 | TERADYNE | IP750EX | AUTOMATED TEST EQUIPMENT For CMOS Image Sensor testing | TEST | 01.06.2012 | 1 | as is where is | immediately |