Please find below a list of Used Fab Metrology , Inspection and QC Equipment for sale by fabsurplus.com .Click on any listed item of Fab Metrology , Inspection and QC Equipment to see further data.
SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time |
---|---|---|---|---|---|---|---|---|
103225 | ADE | NanoMapper FA | Nano-Defects Inspection System | 300 mm | 1 | inquire | immediately | |
108791 | ADE | 5810 | Non-Contact Capacitance Gauging Module with 2ea ADE 2248 Probes | 1 | inquire | |||
108792 | ADE | 6033 | Wafer Thickness Tester | 1 | inquire | |||
108793 | ADE | 6033T | Wafer Thickness Tester | 1 | inquire | |||
109554 | ADE | NANOMAPPER Phase Shift | nano defect inspection system | 300 mm | 01.11.2001 | 1 | as is where is | immediately |
83514 | Applied Materials | Opal 7830i Enhanced | CD-SEM | 100 mm to 200 mm | 01.05.1997 | 1 | as is where is | immediately |
108556 | Applied Materials | Uvision 600SP | Brightfield Inspection System | 300 mm | 01.05.2008 | 1 | as is where is | immediately |
108931 | Applied Materials | SEMVISION G5 MAX | Defect Review SEM | 300 mm | 01.06.2011 | 1 | as is where is | immediately |
109088 | Applied Materials | SEMVISION G3 Lite | Defect Review SEM | 300 mm | 01.08.2007 | 1 | as is where is | 6 months |
109112 | Applied Materials | Verity 2 | CD MEASUREMENT SEM | 200 mm | 01.06.2004 | 1 | immediately | |
109149 | Applied Materials | ComPLUS MP | Darkfield Inspection | 200mm | 1 | as is where is | ||
109150 | Applied Materials | ComPLUS MP | Darkfield Inspection | 200mm | 1 | as is where is | ||
110661 | APPLIED MATERIALS | UVISION 5 | Bright Field Inspection | 300 mm | 01.06.2011 | 1 | as is where is | immediately |
109055 | ASML | Yieldstar S200B | Wafer metrology system | 300 mm | 01.06.2011 | 1 | as is where is | immediately |
109158 | ASML | YieldStar S-200B | Overlay Measurement System | 300mm | 1 | as is where is | ||
109159 | ASML | YieldStar S-250 | Overlay Measurement System | 300mm | 1 | as is where is | ||
108153 | ATI | OAK-1 | Auto Scope Inspection | 01.06.2013 | 1 | as is where is | ||
98447 | August | 3DI-8000 | wafer bump inspection | 300mm | 1 | as is where is | immediately | |
98448 | August | NSX-95 | 2D Auto inspection system / Macro defect inspection system | 200 mm | 4 | as is where is | immediately | |
101818 | August | NSX105 | Wafer Bumping Inspection System / Macro defect inspection | 200mm | 1 | inquire | ||
108734 | Bio-Rad | Q8 | Overlay Metrology | 1 | as is all rebuilt | 1 month | ||
108735 | Bio-Rad | QS-1200 | FT-IR Spectrometer | 100-200 mm | 01.05.2004 | 1 | as is where is | immediately |
108736 | Bio-Rad | QS-300 | FT-IR Spectrometer | 1 | as is where is | immediately | ||
108800 | BIO-RAD | ECN4900PC | Profilers, 2ea Available - Parts Only | 1 | inquire | |||
108801 | BIO-RAD | Q7 | Overlay Metrology Tool | 1 | inquire | |||
108802 | BIO-RAD | Q8 | Overlay Metrology / CD Measurement Tool for up to 200mm Wafers | 1 | inquire | |||
108737 | BIORAD | Q5 | Overlay Metrology Tool | 200 mm | 2 | as is where is | immediately | |
106642 | BROOKS | METARA 7200 | Overlay | 200 mm | 01.06.1996 | 1 | as is where is | |
108025 | BRUKER | VERTEX 80V | FT-IR Spectrometer | 1 | as is where is | |||
106645 | CAMECA | EX300 | Secondary Ion Mass Spectrometer | 300 mm | 1 | as is where is | ||
108394 | CAMECA | EX-300 | Implant Dosing Measurement | 300 mm | 1 | as is where is | ||
110603 | Camtek | EM3 | TEM and SEM sample preparation system | Laboratory | 1 | inquire | immediately | |
110604 | CAMTEK | XACT | TEM/STEM sample preparation system | Laboratory | 01.06.2011 | 1 | as is where is | immediately |
109533 | Creative Design Engineering (CDE) | ResMap 178 | Resistivity Mapping System | Up to 200 mm | 01.06.2012 | 1 | as is where is | immediately |
106647 | CYBER OPTICS | CYBERSCAN C212/110 | Laser Measure | 200 mm | 1 | as is where is | ||
108201 | DNS | INSPECTION SCOPE | Inspection Scope | 1 | as is where is | |||
106200 | EDAX | Eagle 2 | Micro-probe EDX analyser | Laboratory | 01.06.2000 | 1 | as is where is | immediately |
106964 | FEI | Strata 400 | Dual Beam FIB SEM | Laboratory | 01.06.2006 | 1 | as is where is | immediately |
108026 | FEI | CLM-PLUS (CRT-082) | FIB SEM | 300 mm | 01.04.2012 | 1 | as is where is | |
108932 | FEI | ExSolve CLM Next Gen | High Accuracy FIB SEM | 300 mm | 01.06.2016 | 2 | as is where is | immediately |
108710 | Fogale | DeepProbe 300M | Low Coherence IR wafer interferometry | 200 mm and 300 mm | 01.06.2014 | 1 | inquire | |
108817 | FOUR DIMENSIONS | CV92A | Semi Auomatic Mercury Probe CV Plotter | up to 200 mm | 01.06.1998 | 1 | inquire | immediately |
93084 | FSM | SYMPHONYMC | Life Time | 300 MM | 1 | as is where is | ||
96543 | Gaertner | L115C-8 | Ellipsometer, cassette to cassette | 100-200 mm | 28.02.1995 | 1 | as is where is | immediately |
108751 | GCA TROPEL | 9000 | Wafer Flatness Analyzer | 1 | as is where is | |||
71907 | Hamamatsu | C7103 | PC Controlled IC Back-side Lapping and Wafer Grinding System | 200 mm and packages | 30.09.2001 | 1 | as is where is | immediately |
52166 | Hitachi | 545-5515 | DC power supply module for CD SEM | spares | 1 | as is where is | immediately | |
52167 | Hitachi | 6280H | Power Supply Module 4channels | spares | 1 | as is where is | immediately | |
52168 | Hitachi | 545-5540 | Power Supply unit for CD SEM | Spares | 1 | as is where is | immediately | |
52312 | Hitachi | 545-5522 | VG board for CD SEM | spares | 31.05.1994 | 1 | as is where is | immediately |
52339 | Hitachi | 545-5521 | EVAC PCB FOR HITACHI CD-SEM | spares | 31.05.1994 | 1 | as is where is | immediately |
52340 | Hitachi | 545-5537 | IP-PC2 for cd-sem | spares | 31.05.1994 | 1 | as is where is | immediately |
52343 | Hitachi | 377-7592 | Power Supply Module for CD SEM | spares | 31.05.1994 | 1 | as is where is | immediately |
53054 | HITACHI | 6280H (SPARES) | SORD Computer for cd sem system | spares | 1 | as is where is | immediately | |
60939 | HITACHI | S4160 | Scanning electron microscope | 31.05.1996 | 1 | as is where is | ||
74794 | Hitachi | S5200 | FE SEM with EDX | Inspection | 31.05.2005 | 1 | as is where is | immediately |
83849 | Hitachi | S4500 Type I | FE SEM | Laboratory | 01.05.1995 | 1 | inquire | immediately |
91397 | HITACHI | IS2700SE | Dark Field inspection | 1 | as is where is | |||
91403 | HITACHI | S-5000 | FE SEM | 150 mm,200 mm | 1 | as is where is | ||
91404 | HITACHI | S-5000 | FE SEM | 150 mm,200 mm | 1 | as is where is | ||
91405 | HITACHI | S-5000 | FE SEM | 150 mm,200 mm | 1 | as is where is | ||
91407 | HITACHI | S-5000 | FE SEM | 150 mm,200 mm | 1 | as is where is | ||
91408 | HITACHI | S-5000 | FE SEM | 150 mm,200 mm | 1 | as is where is | ||
91417 | HITACHI | LS-6800 | wafer surface inspection | 300 mm | 31.08.2007 | 1 | as is where is | immediately |
91418 | HITACHI | UA-7200 | Stripper/Asher | 31.05.2001 | 1 | as is where is | ||
98269 | HITACHI | RS 4000 | Defect Review SEM | 300 mm | 01.05.2003 | 1 | as is where is | immediately |
98270 | HITACHI | RS 4000 | Defect Review SEM | 300 mm | 01.05.2003 | 1 | as is where is | immediately |
103525 | HITACHI | S4700-l | Scanning Electron Microscope | Laboratory | 31.05.2004 | 1 | as is where is | immediately |
103526 | HITACHI | S4700-ll | FE Sem with Horriba EMAX EDX | Laboratory | 31.05.2001 | 1 | as is where is | immediately |
103527 | HITACHI | S4700-ll | FE Sem with Horriba EMAX EDX (Destocking Status) | Laboratory | 31.05.2003 | 1 | as is where is | immediately |
106160 | HITACHI | RS6000 (Enhanced) | Defect Review SEM | 300 mm | 01.06.2013 | 1 | as is where is | immediately |
106662 | HITACHI | FB2100 | FIB | 200 mm | 01.06.2003 | 1 | as is where is | |
106663 | HITACHI | IS3000SE | WAFER PARTICLE INSPECTION | 300 mm | 01.06.2006 | 1 | as is where is | |
106664 | HITACHI | IS3200SE | WAFER PARTICLE INSPECTION | 300 mm | 01.06.2010 | 1 | as is where is | |
106665 | HITACHI | LS9000 | Wafer Surface Inspection | 300 mm | 01.06.2010 | 1 | as is where is | |
106666 | HITACHI | LS-6800 | Wafer Surface Inspection | 300 mm | 01.06.2007 | 1 | as is where is | |
108027 | HITACHI | N-6000 | NANO PROBER | Laboratory | 01.09.2007 | 1 | as is where is | |
108072 | Hitachi | S-6280H | CD SEM | 1 | as is where is | |||
108159 | HITACHI | S4700II | FE SEM with EDAX (Detecting Unit) | 1 | as is where is | |||
108160 | HITACHI | CV4000 | High Voltage SEM | 300 mm | 01.06.2014 | 1 | as is where is | |
108413 | Hitachi | CG4000 | SEM | 300 mm | 3 | as is where is | ||
108568 | HITACHI | LS9000 | Wafer Surface Inspection System | 300mm | 01.06.2010 | 1 | as is where is | immediately |
108752 | HITACHI | S7000 | CD SEM | 150 mm | 01.05.1989 | 1 | as is where is | immediately |
108896 | Hitachi | RS4000 | Defect Review SEM | 300 mm | 01.06.2006 | 1 | as is where is | immediately |
108902 | Hitachi | RS4000 | Defect Review SEM | 300 mm | 01.05.2007 | 1 | as is where is | immediately |
109047 | Hitachi | RS5500 | Defect Review SEM with optional EDX | 300 mm | 01.07.2009 | 1 | as is where is | immediately |
109183 | Hitachi | CG4000 | SEM - Critical Dimension (CD) Measurement | 300mm | 1 | as is where is | ||
109287 | Hitachi | SU 8010 | Ultra High Resolution Field Emission Scanning Electron Microscope | 100 mm | 01.06.2007 | 1 | as is where is | immediately |
109555 | Hitachi | IS3000 | DARK FIELD INSPECTION | 300 mm | 01.05.2007 | 1 | as is where is | |
109556 | Hitachi | HD2300 | STEM (Scanning Transmission Electron Microscope) | Laboratory | 01.06.2006 | 1 | as is where is | immediately |
109561 | Hitachi | S5500 | HIGH RESOLUTION INSPECTION SEM | Laboratory | 01.06.2014 | 1 | as is where is | immediately |
109568 | Hitachi | CG-4100 | Critical Dimension (CD) Measurement SEM | 300 mm | 01.06.2012 | 1 | as is where is | immediately |
109569 | Hitachi | CG-4000 | Critical Dimension (CD) Measurement SEM | 300 mm | 01.06.2010 | 1 | as is where is | immediately |
110601 | Hitachi | FB 2100 | FIB SEM | Laboratory | 01.06.2006 | 1 | as is where is | immediately |
110662 | Hitachi | S9380 II | CD-SEM | 300 mm | 01.05.2009 | 1 | as is where is | immediately |
109114 | HMI | EScan 400XP | E-Beam wafer inspection system | 300 mm | 01.06.2010 | 2 | as is where is | immediately |
109115 | HMI | EScan EP3 | E-Beam wafer inspection system | 300 mm | 01.06.2010 | 2 | as is where is | immediately |
109179 | HMI | eP3 XP | E-beam Inspection | 300mm | 1 | as is where is | ||
109180 | HMI | eScan 300 | E-beam Inspection | 300mm | 1 | as is where is | ||
109181 | HMI | eScan 320 | E-beam Inspection | 300mm | 1 | as is where is | ||
109182 | HMI | eScan 320 | E-beam Inspection | 300mm | 1 | as is where is | ||
108161 | HP | 4145B | CV Measurement | 1 | as is where is | |||
106667 | HSEB | AXIOSPECT 300 | MICROSCOPE INSPECTION STATION | 300 mm | 1 | as is where is | ||
102559 | HSEB Zeiss | Axiotron 300 | AOI microscope with 2 units of Brooks load port | 300 mm | 1 | as is where is | immediately | |
108819 | HYPERVISION | Visionary 2 | Emmission Microscope with Karl Suss PM-8 Analytical Prober | 1 | inquire | |||
109074 | INVALID[Sensofar] | PLu Neox Optical 3D Surface Profiler with motorized XY stage, 4 Lens (10X, 20X, 50X, 100X), anti vibration table | Optical 3D Surface Profiler | 01.06.2012 | 1 | as is where is | ||
106504 | Irvine Optical | Auto Wafer Loader Microscope Inspection | WAFER INSPECTION MICROSCOPE WITH AUTOLOADER | 200 mm | 01.06.1990 | 1 | as is where is | immediately |
91419 | J.A Woollam | VUV-VASE (Gen II) | Ellipsometer | 300 mm | 1 | as is where is | ||
91420 | J.A Woollam | VUV-VASE VU302 (Gen I) | Ellipsometer | 200 mm | 31.05.2001 | 1 | as is where is | |
91422 | JEOL | JSM-5600 | FE SEM | 31.05.1999 | 1 | as is where is | ||
91424 | JEOL | JSM-6700F | FE SEM | 1 | as is where is | |||
106668 | JEOL | JWS-7500E | SCANNING ELECTRON MICROSCOPE | 200 mm | 1 | as is where is | ||
108164 | JEOL | JSM-6340F | FE Sem | 1 | as is where is | |||
108323 | JEOL | JFS-9855S | Focused Ion Beam System | 200mm | 01.05.2000 | 1 | as is where is | immediately |
108324 | JEOL | JWS-7555 | SEM - Defect Review (DR) | 200mm | 1 | as is where is | immediately | |
108822 | JEOL | JSM-6600F | Scanning Electron Microscope | 1 | inquire | |||
108907 | JEOL | JEM3200FS | High Resolution TEM | Laboratory | 01.05.2006 | 1 | as is where is | immediately |
109185 | JEOL | JEM-2010F | TEM | Laboratory | 1 | as is where is | ||
109186 | JEOL | JFS-9815 | Focused Ion Beam System | 200mm | 1 | as is where is | ||
109187 | JEOL | JSM-6400F | FE SEM | Laboratory | 1 | as is where is | ||
109558 | JEOL | JSM-7500F | SEM | Laboratory | 01.05.2009 | 1 | as is where is | immediately |
110627 | JEOL | JSM-6460LV | Scanning Electron Microscope | Laboratory | 1 | as is where is | ||
91427 | Jordan Valley | JVX 6200 | X-ray metrology (X-Ray Reflectivity) | 300 mm | 1 | as is where is | ||
99830 | JORDAN VALLEY | JVX6200I | X-ray Metrology System | 300 mm | 28.02.2011 | 1 | as is where is | immediately |
100917 | Jordan Valley | JVX6200 | X-Ray Inspection System | 300 mm | 31.05.2010 | 1 | as is where is | |
108415 | Jordan Valley Semiconductors LTD | JVX 7200 | X-ray Fluorescence Spectrometer | 300 mm | 1 | as is where is | ||
106865 | KLA | 2830 (PARTS) | EFEM ONLY with Yaskawa XURCM9206 robot | 300 mm | 01.02.2010 | 1 | as is where is | immediately |
106968 | KLA | SP2 (spare parts) | Complete set of calibration standard wafers for a KLA SP2 | 200 mm | 01.11.2022 | 1 | inquire | immediately |
108009 | KLA | UV1250SE | Wafer Film measurement / Ellipsometer | 200 mm | 01.10.1996 | 1 | as is where is | immediately |
108421 | KLA | eDR-5210 | SEM - Defect Review (DR) | 300 mm | 4 | as is where is | ||
108424 | KLA | eS805 | E-beam Inspection | 300 mm | 1 | as is where is | ||
108426 | KLA | SM-300/SpectraMap | Film Thickness Measurement System | 1 | as is where is | |||
108428 | KLA | Surfscan 7700 | Particle Measurement | 200 MM | 1 | as is where is | ||
108430 | KLA | TP300 | Implant Dosing Measurement | 200 MM | 1 | as is where is | ||
108431 | KLA | VisEdge CV300R | Edge Defect | 300 mm | 1 | as is where is | ||
108569 | KLA | 2131 | Inspection System | 200 mm | 01.05.1995 | 1 | as is where is | immediately |
108775 | KLA | AlphaStep 300 | Profilometer | 1 | inquire | |||
108930 | KLA | Archer AIM Plus | Overlay measurement System | 300 mm | 01.06.2005 | 2 | as is where is | immediately |
109106 | KLA | Surfscan AIT 3 | Wafer particle Inspection | 200 mm | 01.06.2005 | 1 | as is where is | immediately |
109537 | KLA | 2351 | Brightfield Wafer Defect Inspection System | 200 mm | 01.06.2002 | 1 | as is where is | immediately |
109562 | KLA | 2367 | Brightfield wafer defect inspection system | 200 mm | 01.09.2006 | 1 | as is where is | immediately |
110659 | KLA | UV1250SE | Thin film meansurement system | 125 mm - 200 mm | 01.06.1998 | 1 | as is where is | immediately |
110660 | KLA | 7700 | Surfscan wafer particle detection system | 100 - 200 mm | 1 | as is where is | immediately | |
32230 | KLA TENCOR | SFS6400 MECHANICAL CALIBRATION Document Number 238 | WAFERSURFACE ANALYSIS SYSTEM CUSTOMER MAINTENANCE REFERENCE | MANUAL | 1 | as is where is | immediately | |
32231 | KLA TENCOR | Surfscan 64X0 Calibration Procedure | Surfscan 64X0 Calibration Procedure | MANUAL | 1 | as is where is | immediately | |
32232 | KLA TENCOR | surfscan 64XX optical alignments Document Number 236 | WAFER SURFACE ANALYSIS SYSTEM MAINTENANCE REFERENCE | MANUAL | 1 | as is where is | immediately | |
32233 | KLA TENCOR | SFS6x00 MECHANICAL CALIBRATION Document number 200 | WAFER SURFACE ANALYSIS SYSTEM MAINTENANCE REFERENCE | MANUAL | 1 | as is where is | immediately | |
106481 | KLA Tencor | AIT I | Patterned Surface Inspection System | 150 mm/200 mm | 01.06.1995 | 1 | as is where is | immediately |
106574 | KLA TENCOR | SEM-3800C | Scanning Electron Microscope | N/A | 1 | as is where is | ||
106674 | KLA TENCOR | Viper 2430 | Macro Defect Inspection | 300 mm | 01.06.2004 | 1 | as is where is | immediately |
106675 | KLA TENCOR | Viper 2435 | Macro Defect Inspection | 300 mm | 01.06.2004 | 1 | as is where is | |
106676 | KLA TENCOR | Viper 2435XP | Macro Defect Inspection | 300 mm | 01.06.2004 | 1 | as is where is | |
106679 | KLA TENCOR | 2132 (mainbody only) | Wafer Inspection System | 150 mm,200 mm | 01.06.1995 | 1 | as is where is | |
106681 | KLA TENCOR | P-2 | Profileometer | 150 mm,200 mm | 01.06.1996 | 1 | as is where is | |
108075 | KLA Tencor | 2131 | Wafer Defect Inspection | 150 mm | 1 | as is where is | ||
108165 | KLA TENCOR | Surfscan 7200 | Surfscan wafer particle detection | 150 mm,200 mm | 01.06.1991 | 1 | as is where is | |
108166 | KLA TENCOR | Surfscan 7200 | Surfscan wafer particle detection | 150 mm,200 mm | 01.06.1990 | 1 | as is where is | |
1691 | KLA-TENCOR | 259 (spare parts) | Reticle Inspection - SPARE PARTS | up to 7 inch | 01.12.1991 | 1 | inquire | immediately |
52151 | KLA-Tencor | Hamamatsu R1924A | Photomultiplier | spares | 01.03.2007 | 1 | as is where is | immediately |
53035 | KLA-Tencor | 2132 (8 inch Wafer Chuck Assembly) | Ceramic Wafer chuck, 8" | spares | 1 | as is where is | immediately | |
53036 | KLA-Tencor | Compumotor M575L11 | Stepping motor drive | spares | 1 | as is where is | immediately | |
71632 | KLA-TENCOR | 2122 | Brightfield Wafer Defect Inspection System | 200 mm | 01.04.1996 | 1 | as is where is | immediately |
91435 | KLA-Tencor | AIT | Particle Review | 200 mm | 31.05.1997 | 1 | as is where is | |
91464 | KLA-Tencor | PROMETRIX FT750 | Film Thickness Measurement | 200 mm | 1 | as is where is | immediately | |
91466 | KLA-Tencor | PROMETRIX FT750 | Film Thickness Measurement | 1 | as is where is | |||
96998 | KLA-Tencor | Surfscan AIT | Patterned Wafer Inspection | 200 mm | 01.05.1997 | 1 | as is where is | immediately |
108716 | KLA-Tencor | Surfscan 4500 | Unpatterned Wafer Surface Inspection | 2 inch to 6 inch | 01.11.1989 | 1 | as is where is | immediately |
108760 | KLA-Tencor | Surfscan 4500 | Wafer Particle Inspection System | 2 to 6 inch | 01.05.1986 | 1 | as is where is | immediately |
109107 | KLA-Tencor | PROMETRIX FT-650 | WAFER FILM THICKNESS MEASUREMENT SYSTEM | 01.06.1991 | 1 | as is where is | immediately | |
109191 | KLA-Tencor | 2820 | Wafer Inspection Equipment | 300mm | 1 | as is where is | ||
109192 | KLA-Tencor | 2820 | Wafer Inspection Equipment | 300mm | 1 | as is where is | ||
109193 | KLA-Tencor | 2830 | Brightfield Inspection | 300mm | 1 | as is where is | ||
109194 | KLA-Tencor | AIT UV | Darkfield Inspection | 300mm | 1 | as is where is | ||
109195 | KLA-Tencor | ASET-F5x | Film Thickness Measurement System | 300mm | 1 | as is where is | ||
109196 | KLA-Tencor | Puma 9130 | Darkfield Inspection | 300mm | 1 | as is where is | ||
109197 | KLA-Tencor | Puma 9130 | Darkfield Inspection | 300mm | 1 | as is where is | ||
109198 | KLA-Tencor | Surfscan SP2 | Particle Measurement | 300mm | 1 | as is where is | ||
109598 | KLA-Tencor | Surfscan 5500 | Wafer Particle Detection | 200 mm | 1 | inquire | ||
109601 | KLA-Tencor | P15XP | Surface Profiler (Upgraded from a P10) | 200 mm | 1 | inquire | ||
109613 | KLA-Tencor | AIT | Surfscan wafer particle detection system | 150 mm | 1 | inquire | ||
108837 | KOKUSAI | VR70 | Resistivity Test Tool | 1 | inquire | |||
94475 | LASERTEC | BGM300 | Wafer Surface Analyzing and VIsualization System | 200 mm | 31.05.2008 | 1 | as is where is | |
106702 | LASERTEC | BGM300 | Wafer Inspection System | 300 mm | 1 | as is where is | ||
106485 | Leica | LEICA INM20 | Microscope inspection station | 200 mm | 01.06.1995 | 1 | as is where is | immediately |
108171 | LEICA | INM100 | Microscope | 1 | as is where is | |||
108172 | LEICA | INM100 | Microscope | 1 | as is where is | |||
108173 | LEICA | INM100 | Microscope | 1 | as is where is | |||
108174 | LEICA | KENSINGTON 300901 | Wafer Inspection Microscope | 1 | as is where is | |||
108175 | LEICA | KENSINGTON 300901 | Wafer Inspection Microscope | 1 | as is where is | |||
108176 | LEICA | KENSINGTON 300901 | Wafer Inspection Microscope | 1 | as is where is | |||
108177 | LEICA | KENSINGTON 300901 | Wafer Inspection Microscope | 1 | as is where is | |||
108178 | LEICA | Polyvar SC | POLYVAR SCOPE | 1 | as is where is | |||
108179 | LEICA | Reichert POLYVAR SC | Wafer Inspection Microscope | 200 mm/300 mm | 01.06.2002 | 1 | as is where is | |
108180 | LEICA | Reichert-Jung, Kensington 300901 | Wafer Inspection Microscope | 1 | as is where is | |||
108181 | LEICA | Reichert-Jung, Kensington 300901 | Wafer Inspection Microscope | 1 | as is where is | |||
108182 | LEICA | Reichert-Jung, Kensington 300901 | Wafer Inspection Microscope | 1 | as is where is | |||
108183 | LEICA | Reichert-Jung, Kensington 300901 | Wafer Inspection Microscope | 1 | as is where is | |||
109211 | Leica | INS3300 | Macro-Defect | 300mm | 1 | as is where is | ||
109212 | Leica | INS3300 | Macro-Defect | 300mm | 1 | as is where is | ||
109213 | Leica | INS3300 | Macro-Defect | 300mm | 1 | as is where is | ||
108464 | Metryx | Mentor DF3 | Mass Measurement | 300 mm | 1 | as is where is | ||
108465 | Metryx | Mentor OC23 | Mass Measurement | 200-300 mm | 1 | as is where is | immediately | |
109214 | Metryx | Mentor OC23 | Mass Measurement | 200mm | 1 | as is where is | ||
108848 | MINATO | MM-6600 | Wafer Mobility Tester with MECS UX-1000 Wafer Robot, 2ea Available | 1 | inquire | |||
108029 | MSP CORP. | 2300XP1 | Particle Depositioning | 300 mm | 1 | as is where is | ||
106703 | N&K | ANALYZER 5700-CDRT | Wafer Inspection System | 1 | as is where is | |||
106704 | n&k Technology | 6700-CDRT | Wafer Inspection System | 1 | as is where is | |||
106705 | NANO OPTICS | HAZE 2 | Nano Optics Haze 2 | 200 mm | 1 | as is where is | ||
91526 | NANOMETRICS | Caliper Mosaic | Overlay | 300 mm | 31.05.2003 | 1 | as is where is | immediately |
91529 | NANOMETRICS | Caliper Mosaic | Overlay | 300 mm | 28.02.2010 | 1 | as is where is | immediately |
91530 | NANOMETRICS | NANOMETRICS 9-7200-0195E | Mask & Wafer Inspection | 200 mm | 1 | as is where is | ||
98289 | NANOMETRICS | CALIPER ULTRA | Mask & Wafer Inspection | 300 mm | 31.05.2005 | 1 | as is where is | |
98290 | NANOMETRICS | CALIPER ULTRA | Mask & Wafer Inspection | 300 mm | 31.05.2005 | 1 | as is where is | |
98291 | NANOMETRICS | CALIPER ULTRA | Mask & Wafer Inspection | 300 mm | 30.06.2006 | 1 | as is where is | immediately |
98480 | Nanometrics | 8000X | film thickness measurement | 150mm | 2 | as is where is | immediately | |
98481 | Nanometrics | 8000Xse | film thickness measurement | 200mm | 2 | as is where is | ||
101585 | NANOMETRICS | CALIPER-ULTRA | Overlay Measurement | 300 mm | 30.06.2006 | 1 | as is where is | |
103544 | NANOMETRICS | CALIPER ELAN | Overlay | 300 mm | 31.05.2004 | 1 | as is where is | |
106179 | Nanometrics | 9000 | Nanospec Wafer Metrology film thickness measurement tool | 200 mm | 01.06.2005 | 1 | as is all rebuilt | immediately |
106706 | NANOMETRICS | CALIPER_ULTRA | Mask & Wafer Inspection | 300 mm | 01.06.2006 | 1 | as is where is | |
106823 | Nanometrics | Nanospec 9100 | Ox film thickness measurement (PC missing) | 200mm | 1 | as is where is | immediately | |
107027 | NANOMETRICS | Caliper Mosaic | Overlay measurement System | 300 mm | 01.08.2010 | 1 | inquire | immediately |
108186 | NANOMETRICS | CALIPER_MOSAIC | Overlay | 300 mm | 01.06.2001 | 1 | as is where is | |
108467 | Nanometrics | Tevet Trajectory T3 | Film Thickness Measurement System | 300 mm | 1 | as is where is | ||
109113 | Nanometrics | LynX 9010T | Optical CD Measurement (Scatterometry) system | 300 mm | 01.09.2008 | 1 | as is where is | immediately |
93103 | NGR | NGR2150 | E-beam wafer inspection | 300 MM | 1 | as is where is | ||
108853 | NICOLET | Avatar 370 DTGS | FT-IR Spectrometer | 1 | inquire | |||
108189 | NIDEC | Im15 | Wafer inspection | 1 | as is where is | |||
108190 | NIDEC | Im800 | Wafer inspection | 1 | as is where is | |||
99396 | Nikon | EpiPhot 200 | Inspection Microscope | 200 mm | 1 | as is where is | immediately | |
106503 | Nikon | Auto Wafer Loader for Microscope Inspection | WAFER INSPECTION MICROSCOPE | 150 mm/200 mm | 1 | as is where is | immediately | |
106707 | NIKON | AMI-3300 | Wafer Inspection System | 300 mm | 1 | as is where is | ||
106708 | NIKON | AMI-3300 | Wafer Inspection System | 300 mm | 1 | as is where is | ||
106709 | NIKON | AMI-3500 | Wafer Inspection System | 300 mm | 1 | as is where is | ||
108092 | Nikon | OPTIPHOT-200 | Wafer inspection microscope | 200 mm | 3 | as is where is | ||
108093 | Nikon | OPTIPHOT-300 | Wafer inspection microscope | 300 mm | 1 | as is where is | ||
108094 | Nikon | OPTIPHOT-88-AC IN | Wafer inspection microscope | 200 mm | 1 | as is where is | ||
108643 | Nikon | Eclipse L200 | Wafer Inspection Microscope | 150 mm/200 mm | 01.06.2006 | 1 | as is where is | immediately |
108772 | Nikon | Optistation 3 | Wafer Inspection System | 150 mm | 01.05.1994 | 1 | as is where is | immediately |
108784 | Nikon | Optistation 3A | Automatic Wafer Inspection Station | 200 mm | 01.05.1997 | 1 | as is where is | immediately |
108785 | NIKON | Optiphot 200 (For spares use) | Wafer Inspection Microscope (Parts Tool Only) | 200 mm | 1 | as is where is | immediately | |
108789 | Nikon | Optiphot 200 | Wafer Inspection Microscope | 200 mm | 1 | as is all rebuilt | immediately | |
108790 | NIKON | Optiphot 88 | Wafer Inspection Microscope | 200 mm | 1 | as is where is | immediately | |
108854 | NIKON | NWL-860 | Automatic Microscope Wafer Loader for up to 200mm Wafers | 1 | inquire | |||
108855 | NIKON | Optiphot 200 | Wafer Inspection Microscope, B/Dfield & DIC Microscopy, Motorized Turret with 5ea Objectives, Prior ProScan Programmable Stage, 200mm X 200mm XY Travel, Color CCD Camera & More | 1 | inquire | |||
110610 | NIKON | OptiStation 3 | Wafer Inspection Microscope | 200 mm | 1 | as is where is | immediately | |
110618 | NIKON | Optistation 3 | Wafer Inspection Microscope | 01.07.1994 | 1 | as is where is | immediately | |
108033 | NOVA | NOVASCAN 3090 P/N 390-10000-11 | CMP metrology system | 300 mm | 1 | as is where is | immediately | |
108967 | NOVA | T600 MMSR | Ellipsometer for CD and thin film measurements | 300 mm | 01.01.2018 | 1 | as is where is | immediately |
109216 | Nova | NovaScan 3090 Next SA | Optical CD Measurement | 300mm | 1 | as is where is | ||
109217 | Nova | NovaScan 3090 Next SA | Optical CD Measurement | 300mm | 1 | as is where is | ||
109218 | Nova | NovaScan 3090 Next SA | Optical CD Measurement | 300mm | 1 | as is where is | ||
109219 | Nova | NovaScan 3090 Next SA | Optical CD Measurement | 300mm | 1 | as is where is | ||
109220 | Nova | V2600 | Integrated CMP Endpoint / Film Measurement | 300mm | 1 | as is where is | ||
109283 | NOVA MEASURING | Novascan | Novascan CMP Endpoint measurement unit | 200 mm | 01.06.2000 | 1 | as is where is | immediately |
109284 | NOVA MEASURING | Novascan | Novascan CMP Endpoint measurement unit | 200 mm | 01.06.2000 | 1 | as is where is | immediately |
106825 | Olympus | AL110-LMB6 with MX51 | wafer loader with Microscope | 150mm | 1 | inquire | ||
108786 | OLYMPUS | BH-BHM | Wafer Inspection Microscope | 150 mm | 1 | as is where is | immediately | |
108857 | OLYMPUS | AL100-L8 | Wafer Loader, 200mm, Parts Tool | 200 MM | 1 | inquire | ||
109035 | Olympus | AL110N-LMB6 | Wafer Inspection Microscope with autoloader | 100 MM AND 150 mm | 1 | as is where is | immediately | |
109058 | Olympus | AL110N-LMB6 | Microscope autoloader only (Not including the microscope) | 100 MM AND 150 mm | 1 | as is where is | immediately | |
103547 | ONTO | WV320 | MACRO INSPECTING | 300 mm | 31.05.2004 | 1 | as is where is | |
109229 | ONTO | AutoEL III | Ellipsometer | 200mm | 1 | as is where is | ||
109230 | ONTO | Axi 935 | Macro-Defect | 300mm | 1 | as is where is | ||
109231 | ONTO | MetaPULSE 300 | Film Thickness Measurement System | 300mm | 1 | as is where is | ||
109232 | ONTO | MetaPULSE 300 | Film Thickness Measurement System | 300mm | 1 | as is where is | ||
109233 | ONTO | NSX 105 | Macro-Defect | 200mm | 1 | as is where is | ||
109559 | Philips | PHI 680 | Auger Nanoprobe | Laboratory | 01.05.1998 | 1 | as is where is | immediately |
31246 | PMS | Liquitrack 776200 | Non volatile residual Monitor for water-quality checking | facilities | 01.10.1999 | 1 | as is where is | immediately |
91552 | RAYTEX | RXW-800 | EDGE SCAN | 200 mm | 31.05.2008 | 1 | as is where is | |
98489 | Raytex | RXW-0826SFIX-SMIF | edge scanner | 200mm | 1 | as is where is | ||
108479 | Raytex | RXW-1227 EdgeScan | Edge Defect | 1 | as is where is | |||
108329 | ReVera | RVX1000 | Film Thickness Measurement System | 300 mm | 1 | as is where is | immediately | |
108480 | ReVera | RVX1000 | Film Thickness Measurement System | 1 | as is where is | |||
91557 | RIGAKU | XRF3640 (Handle include) | Wafer/ Disk Analyzer | 200 mm | 01.05.1995 | 1 | as is where is | |
108194 | RIGAKU | 3640 | WAFER/DISK Analyzer | 200 mm | 01.06.2000 | 1 | as is where is | immediately |
108865 | RIGAKU | V300 | Total Reflection Xray Fluoroescence Spectrometer | 1 | inquire | |||
91559 | RUDOLPH | AXI_S | Macro Inspection System | 300 mm | 31.05.2005 | 1 | as is where is | |
91560 | RUDOLPH | AXI_S | Macro Inspection System | 300 mm | 31.05.2005 | 1 | as is where is | |
91561 | RUDOLPH | AXI_S | Macro Inspection System | 300 mm | 31.05.2006 | 1 | as is where is | |
91563 | RUDOLPH | Meta Pulse | Film Metrology | 200 mm | 31.05.2005 | 1 | as is where is | |
91566 | Rudolph | WS3840 | 3D Bump Metrology | 300 mm | 31.05.2010 | 1 | as is where is | immediately |
91567 | RUDOLPH | META PULSE 200 | Surface Film Metrology | 200 mm | 31.05.2002 | 1 | as is where is | immediately |
94478 | RUDOLPH | FE-3 | Focus Ellipsometer | 200 mm | 1 | as is where is | ||
94479 | RUDOLPH | FE-4D | Focus Ellipsometer | 200 mm | 1 | as is where is | ||
98296 | RUDOLPH | Meta Pulse 300 | Film thickness measurement | 300 mm | 1 | as is where is | ||
98297 | RUDOLPH | Meta Pulse 300 | Film thickness measurement | 300 mm | 1 | as is where is | ||
98298 | RUDOLPH | MP1-300 | Film thickness measurement | 300 mm | 31.05.2007 | 1 | as is where is | |
98835 | RUDOLPH | AXI-S | Macro Wafer Inspection | 300 mm | 01.06.2004 | 1 | as is where is | immediately |
98837 | RUDOLPH | MP1-300XCU | Film Thickness Measurement System | 300 mm | 30.04.2008 | 1 | as is where is | immediately |
100928 | RUDOLPH | AXI-S | Macro Inspection System | 300 mm | 31.05.2003 | 1 | as is where is | |
100929 | RUDOLPH | FE-7 | Ellipsometer | 200 mm | 31.05.1996 | 1 | as is where is | |
100930 | RUDOLPH | MP300 | Film thickness measurement | 200 mm | 31.05.2007 | 1 | as is where is | |
100931 | RUDOLPH | MP300 | Film thickness measurement | 200 mm | 31.05.2009 | 1 | as is where is | |
100932 | RUDOLPH | S3000A | Focused Beam Ellipsometer | 200 mm | 31.05.2012 | 1 | as is where is | |
103553 | RUDOLPH | AXI-S | Macro Inspection | 300 mm | 31.05.2004 | 1 | as is where is | |
103554 | RUDOLPH | AXI935D | AVI | 300 mm | 1 | as is where is | ||
103555 | RUDOLPH | MP3 300XCU | FLIM THICKNESS MEASUREMENT SYSTEM | 300 mm | 1 | as is where is | immediately | |
106420 | Rudolph | NSX 115 | Automated Defect Inspection | 200 mm | 1 | as is where is | immediately | |
106421 | Rudolph | NSX 95 | Automated Macro Defect Inspection | 150 mm/200 mm | 1 | as is where is | immediately | |
106422 | Rudolph | NSX-105 | Automated Defect Inspection | 150 mm/200 mm | 1 | as is where is | immediately | |
106424 | Rudolph | NSX-95 | Automated Macro Defect Inspection | 150 mm/200 mm | 1 | as is where is | immediately | |
106425 | Rudolph | NSX-95 | Manual Macro Wafer Defect Inspection | 150 mm/200 mm | 1 | as is where is | immediately | |
106715 | RUDOLPH | MP3_300A | METAL THICKNESS MEASUREMENT | 300 mm | 01.06.2012 | 1 | as is where is | |
106716 | RUDOLPH | MP-300 | Film thickness measurement | 300 mm | 01.06.2005 | 1 | as is where is | |
106717 | RUDOLPH | MP1-300 | Film Thickness Measurement | 300 mm | 01.06.2003 | 1 | as is where is | |
106718 | RUDOLPH | MP1-300 | Film Thickness Measurement | 300 mm | 1 | as is where is | ||
106719 | RUDOLPH | MP1-300XCU | Film thickness measurement system | 300 mm | 01.06.2008 | 1 | as is where is | |
106720 | RUDOLPH | NSX 105 | MACRO DEFECT INSPECTION SYSTEM | 300 mm | 01.06.2008 | 1 | as is where is | immediately |
106721 | RUDOLPH | S3000A | FBE(focused beam laser ellipsometry) | 300 mm | 01.06.2010 | 1 | as is where is | |
106722 | RUDOLPH | S3000A | FBE(focused beam laser ellipsometry) | 300 mm | 01.06.2011 | 1 | as is where is | |
106723 | RUDOLPH | S3000A | FBE(focused beam laser ellipsometry) | 300 mm | 1 | as is where is | ||
106724 | RUDOLPH | S3000A | FBE(focused beam laser ellipsometry) | 300 mm | 01.06.2011 | 1 | as is where is | |
106725 | RUDOLPH | S3000S | FBE(focused beam laser ellipsometry) | 300 mm | 01.06.2010 | 1 | as is where is | |
106726 | RUDOLPH | S3000S | FBE(focused beam laser ellipsometry) | 300 mm | 1 | as is where is | ||
106727 | RUDOLPH | WS2500 | Wafer Inspection System | 200 mm | 01.06.2003 | 1 | as is where is | |
106728 | RUDOLPH | WS2500 | Wafer Inspection System | 200 mm | 01.06.2003 | 1 | as is where is | |
106729 | RUDOLPH | WS2500 | Wafer Inspection System | 200 mm | 01.06.2006 | 1 | as is where is | |
106730 | RUDOLPH | WS2500 | Wafer Inspection System | 200 mm | 01.06.2002 | 1 | as is where is | |
106731 | RUDOLPH | WV320 | Macro Inspection | 300 mm | 01.06.2006 | 1 | as is where is | |
106732 | RUDOLPH | MP200 | Film thickness measurement | 200 mm | 01.06.2003 | 1 | as is where is | |
106733 | RUDOLPH | MP200 | Film thickness measurement | 200 mm | 01.06.1999 | 1 | as is where is | |
106734 | RUDOLPH | WV320 | Macro Defect Inspection System | 300 mm | 1 | as is where is | ||
106735 | RUDOLPH | WV320 | Macro Defect Inspection System | 300 mm | 1 | as is where is | ||
106831 | Rudolph | MP200XCU | Cu Film thickness measurement | 200mm | 1 | inquire | ||
106832 | Rudolph | MP300 | Metal Film thickness measurement | 300mm | 1 | inquire | ||
106833 | Rudolph | MP300 XCu | Cu Film thickness measurement | 300mm | 2 | inquire | ||
106871 | RUDOLPH | NSX 105 | Automated Wafer, Die and Bump Inspection System | 300 mm | 01.06.2008 | 1 | as is where is | immediately |
108034 | RUDOLPH | AXI-S930B | Macro Defect Inspection | 300 mm | 01.01.2007 | 1 | as is where is | |
108195 | RUDOLPH | META PULSE 200 | Film thickness measurement | 200 mm | 01.06.1999 | 1 | as is where is | |
108196 | RUDOLPH | META PULSE 200 | Film thickness measurement | 200 mm | 01.06.2005 | 1 | as is where is | |
108197 | RUDOLPH | META PULSE 200X CU | Film thickness measurement (Including HDD) | 200 mm | 01.06.2003 | 1 | as is where is | |
108198 | RUDOLPH | META PULSE 200X CU | Film thickness measurement (Including HDD) | 200 mm | 01.06.2001 | 1 | as is where is | |
108199 | RUDOLPH | META PULSE II 200X CU | Film thickness measurement | 200 mm | 01.06.2008 | 1 | as is where is | |
108200 | RUDOLPH | MP200 | Film thickness measurement | 200 mm | 01.06.2002 | 1 | as is where is | |
108482 | Rudolph | Axi 935 | Macro-Defect | 1 | as is where is | |||
108483 | Rudolph | Matrix S-300 | Ellipsometer | 300 mm | 1 | as is where is | ||
108484 | Rudolph | MetaPULSE 300 | Film Thickness Measurement System | 300 mm | 3 | as is where is | ||
108485 | Rudolph | NSX 105 | Macro-Defect | 300 mm | 8 | as is where is | ||
108587 | RUDOLPH | WV320 | Wafer Inspection System | 300mm | 1 | as is where is | immediately | |
108711 | Rudolph | Sonus 7800 | Acoustic Metrology and Defect Detection System | 300 MM | 01.06.2015 | 1 | inquire | |
109550 | Rudolph | AXI-S | Macro Defect Inspection System | 300 mm | 01.06.2006 | 1 | as is where is | immediately |
109570 | Rudolph | WaferView 320 | Macro Wafer Defect Inspection System | 300 mm | 1 | as is where is | immediately | |
106661 | SDI | FAAST 230-DP+SPV+SLIC | CARRIER LIFETIME MEASUREMENT | 200 mm | 1 | as is where is | ||
108035 | SEMILAB | PMR_3000 | Dose Monitoring | 300 mm | 1 | as is where is | ||
108696 | SENTECH | Senduro 300 | Thin Film measurement | Up to 300 MM | 01.06.2008 | 1 | inquire | |
106742 | SSM | 5200 | Resistivity Measurement | 200 mm | 01.06.2008 | 1 | as is where is | |
108773 | SSM | 470i | CV Plotter | 1 | inquire | |||
91569 | Thermo Fisher | ECO 1000 | FTIR System | 200 mm | 01.05.2000 | 1 | as is where is | immediately |
107011 | Veeco | Dektak 200 Si | Contact Profilometer - for spares use (Not operational condition) | 150 mm | 01.06.2000 | 1 | as is where is | immediately |
108331 | Veeco | Dimension 7000 | Atomic Force Microscope (AFM) | 200mm | 1 | as is where is | immediately | |
108893 | VEECO | AP-150 | Automtic Four Point Probe, for up to 6" Wafers | 150 MM | 1 | as is where is | 2 weeks | |
108894 | VEECO | Dektak 3030ST | Profilometer | 1 | inquire | |||
108916 | Veeco | Dimension X3D | Model 340 Atomic Force Microscope | 300 MM | 01.05.2006 | 1 | as is where is | immediately |
109116 | Veeco | Vx340 Dimension | Atomic Force Proflier | 300 mm | 01.06.2010 | 1 | as is where is | immediately |
109600 | Veeco Dimension | 3100 | Atomic Force Microscope | 1 | inquire | |||
93087 | Woollam | VUV-VASE (Gen II) | Ellipsometer | 300 MM | 1 | as is where is | immediately | |
108216 | ZEISS | AXIOTRON | Inspection Micro Scope | 1 | as is where is | |||
108217 | ZEISS | AXIOTRON | Inspection Micro Scope | 1 | as is where is | |||
108218 | ZEISS | AXIOTRON | High Perfomance Micro Scope | 01.06.2008 | 1 | as is where is | ||
108545 | Zeiss | Axiospect 300 | Optical Review System | 300 mm | 4 | as is where is | ||
108972 | Zeiss | Axiospect | Wafer Inspection Microscope | 300 mm | 01.06.2011 | 1 | as is where is | immediately |