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Pre-owned Fab Metrology , Inspection and QC Equipment for sale by fabsurplus.com

Please find below a list of Used Fab Metrology , Inspection and QC Equipment for sale by fabsurplus.com .Click on any listed item of Fab Metrology , Inspection and QC Equipment to see further data.


SDI ID Manufacturer Model Description Version Vintage Q. ty Sales Conditions Lead Time
103225 ADE NanoMapper FA Nano-Defects Inspection System 300 mm 1 inquire immediately
108791 ADE 5810 Non-Contact Capacitance Gauging Module with 2ea ADE 2248 Probes 1 inquire
108792 ADE 6033 Wafer Thickness Tester 1 inquire
108793 ADE 6033T Wafer Thickness Tester 1 inquire
109554 ADE NANOMAPPER Phase Shift nano defect inspection system 300 mm 01.11.2001 1 as is where is immediately
83514 Applied Materials Opal 7830i Enhanced CD-SEM 100 mm to 200 mm 01.05.1997 1 as is where is immediately
108556 Applied Materials Uvision 600SP Brightfield Inspection System 300 mm 01.05.2008 1 as is where is immediately
108931 Applied Materials SEMVISION G5 MAX Defect Review SEM 300 mm 01.06.2011 1 as is where is immediately
109088 Applied Materials SEMVISION G3 Lite Defect Review SEM 300 mm 01.08.2007 1 as is where is 6 months
109112 Applied Materials Verity 2 CD MEASUREMENT SEM 200 mm 01.06.2004 1 immediately
109149 Applied Materials ComPLUS MP Darkfield Inspection 200mm 1 as is where is
109150 Applied Materials ComPLUS MP Darkfield Inspection 200mm 1 as is where is
110661 APPLIED MATERIALS UVISION 5 Bright Field Inspection 300 mm 01.06.2011 1 as is where is immediately
109055 ASML Yieldstar S200B Wafer metrology system 300 mm 01.06.2011 1 as is where is immediately
109158 ASML YieldStar S-200B Overlay Measurement System 300mm 1 as is where is
109159 ASML YieldStar S-250 Overlay Measurement System 300mm 1 as is where is
108153 ATI OAK-1 Auto Scope Inspection 01.06.2013 1 as is where is
98447 August 3DI-8000 wafer bump inspection 300mm 1 as is where is immediately
98448 August NSX-95 2D Auto inspection system / Macro defect inspection system 200 mm 4 as is where is immediately
101818 August NSX105 Wafer Bumping Inspection System / Macro defect inspection 200mm 1 inquire
108734 Bio-Rad Q8 Overlay Metrology 1 as is all rebuilt 1 month
108735 Bio-Rad QS-1200 FT-IR Spectrometer 100-200 mm 01.05.2004 1 as is where is immediately
108736 Bio-Rad QS-300 FT-IR Spectrometer 1 as is where is immediately
108800 BIO-RAD ECN4900PC Profilers, 2ea Available - Parts Only 1 inquire
108801 BIO-RAD Q7 Overlay Metrology Tool 1 inquire
108802 BIO-RAD Q8 Overlay Metrology / CD Measurement Tool for up to 200mm Wafers 1 inquire
108737 BIORAD Q5 Overlay Metrology Tool 200 mm 2 as is where is immediately
106642 BROOKS METARA 7200 Overlay 200 mm 01.06.1996 1 as is where is
108025 BRUKER VERTEX 80V FT-IR Spectrometer 1 as is where is
106645 CAMECA EX300 Secondary Ion Mass Spectrometer 300 mm 1 as is where is
108394 CAMECA EX-300 Implant Dosing Measurement 300 mm 1 as is where is
110603 Camtek EM3 TEM and SEM sample preparation system Laboratory 1 inquire immediately
110604 CAMTEK XACT TEM/STEM sample preparation system Laboratory 01.06.2011 1 as is where is immediately
109533 Creative Design Engineering (CDE) ResMap 178 Resistivity Mapping System Up to 200 mm 01.06.2012 1 as is where is immediately
106647 CYBER OPTICS CYBERSCAN C212/110 Laser Measure 200 mm 1 as is where is
108201 DNS INSPECTION SCOPE Inspection Scope 1 as is where is
106200 EDAX Eagle 2 Micro-probe EDX analyser Laboratory 01.06.2000 1 as is where is immediately
106964 FEI Strata 400 Dual Beam FIB SEM Laboratory 01.06.2006 1 as is where is immediately
108026 FEI CLM-PLUS (CRT-082) FIB SEM 300 mm 01.04.2012 1 as is where is
108932 FEI ExSolve CLM Next Gen High Accuracy FIB SEM 300 mm 01.06.2016 2 as is where is immediately
108710 Fogale DeepProbe 300M Low Coherence IR wafer interferometry 200 mm and 300 mm 01.06.2014 1 inquire
108817 FOUR DIMENSIONS CV92A Semi Auomatic Mercury Probe CV Plotter up to 200 mm 01.06.1998 1 inquire immediately
93084 FSM SYMPHONYMC Life Time 300 MM 1 as is where is
96543 Gaertner L115C-8 Ellipsometer, cassette to cassette 100-200 mm 28.02.1995 1 as is where is immediately
108751 GCA TROPEL 9000 Wafer Flatness Analyzer 1 as is where is
71907 Hamamatsu C7103 PC Controlled IC Back-side Lapping and Wafer Grinding System 200 mm and packages 30.09.2001 1 as is where is immediately
52166 Hitachi 545-5515 DC power supply module for CD SEM spares 1 as is where is immediately
52167 Hitachi 6280H Power Supply Module 4channels spares 1 as is where is immediately
52168 Hitachi 545-5540 Power Supply unit for CD SEM Spares 1 as is where is immediately
52312 Hitachi 545-5522 VG board for CD SEM spares 31.05.1994 1 as is where is immediately
52339 Hitachi 545-5521 EVAC PCB FOR HITACHI CD-SEM spares 31.05.1994 1 as is where is immediately
52340 Hitachi 545-5537 IP-PC2 for cd-sem spares 31.05.1994 1 as is where is immediately
52343 Hitachi 377-7592 Power Supply Module for CD SEM spares 31.05.1994 1 as is where is immediately
53054 HITACHI 6280H (SPARES) SORD Computer for cd sem system spares 1 as is where is immediately
60939 HITACHI S4160 Scanning electron microscope 31.05.1996 1 as is where is
74794 Hitachi S5200 FE SEM with EDX Inspection 31.05.2005 1 as is where is immediately
83849 Hitachi S4500 Type I FE SEM Laboratory 01.05.1995 1 inquire immediately
91397 HITACHI IS2700SE Dark Field inspection 1 as is where is
91403 HITACHI S-5000 FE SEM 150 mm,200 mm 1 as is where is
91404 HITACHI S-5000 FE SEM 150 mm,200 mm 1 as is where is
91405 HITACHI S-5000 FE SEM 150 mm,200 mm 1 as is where is
91407 HITACHI S-5000 FE SEM 150 mm,200 mm 1 as is where is
91408 HITACHI S-5000 FE SEM 150 mm,200 mm 1 as is where is
91417 HITACHI LS-6800 wafer surface inspection 300 mm 31.08.2007 1 as is where is immediately
91418 HITACHI UA-7200 Stripper/Asher 31.05.2001 1 as is where is
98269 HITACHI RS 4000 Defect Review SEM 300 mm 01.05.2003 1 as is where is immediately
98270 HITACHI RS 4000 Defect Review SEM 300 mm 01.05.2003 1 as is where is immediately
103525 HITACHI S4700-l Scanning Electron Microscope Laboratory 31.05.2004 1 as is where is immediately
103526 HITACHI S4700-ll FE Sem with Horriba EMAX EDX Laboratory 31.05.2001 1 as is where is immediately
103527 HITACHI S4700-ll FE Sem with Horriba EMAX EDX (Destocking Status) Laboratory 31.05.2003 1 as is where is immediately
106160 HITACHI RS6000 (Enhanced) Defect Review SEM 300 mm 01.06.2013 1 as is where is immediately
106662 HITACHI FB2100 FIB 200 mm 01.06.2003 1 as is where is
106663 HITACHI IS3000SE WAFER PARTICLE INSPECTION 300 mm 01.06.2006 1 as is where is
106664 HITACHI IS3200SE WAFER PARTICLE INSPECTION 300 mm 01.06.2010 1 as is where is
106665 HITACHI LS9000 Wafer Surface Inspection 300 mm 01.06.2010 1 as is where is
106666 HITACHI LS-6800 Wafer Surface Inspection 300 mm 01.06.2007 1 as is where is
108027 HITACHI N-6000 NANO PROBER Laboratory 01.09.2007 1 as is where is
108072 Hitachi S-6280H CD SEM 1 as is where is
108159 HITACHI S4700II FE SEM with EDAX (Detecting Unit) 1 as is where is
108160 HITACHI CV4000 High Voltage SEM 300 mm 01.06.2014 1 as is where is
108413 Hitachi CG4000 SEM 300 mm 3 as is where is
108568 HITACHI LS9000 Wafer Surface Inspection System 300mm 01.06.2010 1 as is where is immediately
108752 HITACHI S7000 CD SEM 150 mm 01.05.1989 1 as is where is immediately
108896 Hitachi RS4000 Defect Review SEM 300 mm 01.06.2006 1 as is where is immediately
108902 Hitachi RS4000 Defect Review SEM 300 mm 01.05.2007 1 as is where is immediately
109047 Hitachi RS5500 Defect Review SEM with optional EDX 300 mm 01.07.2009 1 as is where is immediately
109183 Hitachi CG4000 SEM - Critical Dimension (CD) Measurement 300mm 1 as is where is
109287 Hitachi SU 8010 Ultra High Resolution Field Emission Scanning Electron Microscope 100 mm 01.06.2007 1 as is where is immediately
109555 Hitachi IS3000 DARK FIELD INSPECTION 300 mm 01.05.2007 1 as is where is
109556 Hitachi HD2300 STEM (Scanning Transmission Electron Microscope) Laboratory 01.06.2006 1 as is where is immediately
109561 Hitachi S5500 HIGH RESOLUTION INSPECTION SEM Laboratory 01.06.2014 1 as is where is immediately
109568 Hitachi CG-4100 Critical Dimension (CD) Measurement SEM 300 mm 01.06.2012 1 as is where is immediately
109569 Hitachi CG-4000 Critical Dimension (CD) Measurement SEM 300 mm 01.06.2010 1 as is where is immediately
110601 Hitachi FB 2100 FIB SEM Laboratory 01.06.2006 1 as is where is immediately
110662 Hitachi S9380 II CD-SEM 300 mm 01.05.2009 1 as is where is immediately
109114 HMI EScan 400XP E-Beam wafer inspection system 300 mm 01.06.2010 2 as is where is immediately
109115 HMI EScan EP3 E-Beam wafer inspection system 300 mm 01.06.2010 2 as is where is immediately
109179 HMI eP3 XP E-beam Inspection 300mm 1 as is where is
109180 HMI eScan 300 E-beam Inspection 300mm 1 as is where is
109181 HMI eScan 320 E-beam Inspection 300mm 1 as is where is
109182 HMI eScan 320 E-beam Inspection 300mm 1 as is where is
108161 HP 4145B CV Measurement 1 as is where is
106667 HSEB AXIOSPECT 300 MICROSCOPE INSPECTION STATION 300 mm 1 as is where is
102559 HSEB Zeiss Axiotron 300 AOI microscope with 2 units of Brooks load port 300 mm 1 as is where is immediately
108819 HYPERVISION Visionary 2 Emmission Microscope with Karl Suss PM-8 Analytical Prober 1 inquire
109074 INVALID[Sensofar] PLu Neox Optical 3D Surface Profiler with motorized XY stage, 4 Lens (10X, 20X, 50X, 100X), anti vibration table Optical 3D Surface Profiler 01.06.2012 1 as is where is
106504 Irvine Optical Auto Wafer Loader Microscope Inspection WAFER INSPECTION MICROSCOPE WITH AUTOLOADER 200 mm 01.06.1990 1 as is where is immediately
91419 J.A Woollam VUV-VASE (Gen II) Ellipsometer 300 mm 1 as is where is
91420 J.A Woollam VUV-VASE VU302 (Gen I) Ellipsometer 200 mm 31.05.2001 1 as is where is
91422 JEOL JSM-5600 FE SEM 31.05.1999 1 as is where is
91424 JEOL JSM-6700F FE SEM 1 as is where is
106668 JEOL JWS-7500E SCANNING ELECTRON MICROSCOPE 200 mm 1 as is where is
108164 JEOL JSM-6340F FE Sem 1 as is where is
108323 JEOL JFS-9855S Focused Ion Beam System 200mm 01.05.2000 1 as is where is immediately
108324 JEOL JWS-7555 SEM - Defect Review (DR) 200mm 1 as is where is immediately
108822 JEOL JSM-6600F Scanning Electron Microscope 1 inquire
108907 JEOL JEM3200FS High Resolution TEM Laboratory 01.05.2006 1 as is where is immediately
109185 JEOL JEM-2010F TEM Laboratory 1 as is where is
109186 JEOL JFS-9815 Focused Ion Beam System 200mm 1 as is where is
109187 JEOL JSM-6400F FE SEM Laboratory 1 as is where is
109558 JEOL JSM-7500F SEM Laboratory 01.05.2009 1 as is where is immediately
110627 JEOL JSM-6460LV Scanning Electron Microscope Laboratory 1 as is where is
91427 Jordan Valley JVX 6200 X-ray metrology (X-Ray Reflectivity) 300 mm 1 as is where is
99830 JORDAN VALLEY JVX6200I X-ray Metrology System 300 mm 28.02.2011 1 as is where is immediately
100917 Jordan Valley JVX6200 X-Ray Inspection System 300 mm 31.05.2010 1 as is where is
108415 Jordan Valley Semiconductors LTD JVX 7200 X-ray Fluorescence Spectrometer 300 mm 1 as is where is
106865 KLA 2830 (PARTS) EFEM ONLY with Yaskawa XURCM9206 robot 300 mm 01.02.2010 1 as is where is immediately
106968 KLA SP2 (spare parts) Complete set of calibration standard wafers for a KLA SP2 200 mm 01.11.2022 1 inquire immediately
108009 KLA UV1250SE Wafer Film measurement / Ellipsometer 200 mm 01.10.1996 1 as is where is immediately
108421 KLA eDR-5210 SEM - Defect Review (DR) 300 mm 4 as is where is
108424 KLA eS805 E-beam Inspection 300 mm 1 as is where is
108426 KLA SM-300/SpectraMap Film Thickness Measurement System 1 as is where is
108428 KLA Surfscan 7700 Particle Measurement 200 MM 1 as is where is
108430 KLA TP300 Implant Dosing Measurement 200 MM 1 as is where is
108431 KLA VisEdge CV300R Edge Defect 300 mm 1 as is where is
108569 KLA 2131 Inspection System 200 mm 01.05.1995 1 as is where is immediately
108775 KLA AlphaStep 300 Profilometer 1 inquire
108930 KLA Archer AIM Plus Overlay measurement System 300 mm 01.06.2005 2 as is where is immediately
109106 KLA Surfscan AIT 3 Wafer particle Inspection 200 mm 01.06.2005 1 as is where is immediately
109537 KLA 2351 Brightfield Wafer Defect Inspection System 200 mm 01.06.2002 1 as is where is immediately
109562 KLA 2367 Brightfield wafer defect inspection system 200 mm 01.09.2006 1 as is where is immediately
110659 KLA UV1250SE Thin film meansurement system 125 mm - 200 mm 01.06.1998 1 as is where is immediately
110660 KLA 7700 Surfscan wafer particle detection system 100 - 200 mm 1 as is where is immediately
32230 KLA TENCOR SFS6400 MECHANICAL CALIBRATION Document Number 238 WAFERSURFACE ANALYSIS SYSTEM CUSTOMER MAINTENANCE REFERENCE MANUAL 1 as is where is immediately
32231 KLA TENCOR Surfscan 64X0 Calibration Procedure Surfscan 64X0 Calibration Procedure MANUAL 1 as is where is immediately
32232 KLA TENCOR surfscan 64XX optical alignments Document Number 236 WAFER SURFACE ANALYSIS SYSTEM MAINTENANCE REFERENCE MANUAL 1 as is where is immediately
32233 KLA TENCOR SFS6x00 MECHANICAL CALIBRATION Document number 200 WAFER SURFACE ANALYSIS SYSTEM MAINTENANCE REFERENCE MANUAL 1 as is where is immediately
106481 KLA Tencor AIT I Patterned Surface Inspection System 150 mm/200 mm 01.06.1995 1 as is where is immediately
106574 KLA TENCOR SEM-3800C Scanning Electron Microscope N/A 1 as is where is
106674 KLA TENCOR Viper 2430 Macro Defect Inspection 300 mm 01.06.2004 1 as is where is immediately
106675 KLA TENCOR Viper 2435 Macro Defect Inspection 300 mm 01.06.2004 1 as is where is
106676 KLA TENCOR Viper 2435XP Macro Defect Inspection 300 mm 01.06.2004 1 as is where is
106679 KLA TENCOR 2132 (mainbody only) Wafer Inspection System 150 mm,200 mm 01.06.1995 1 as is where is
106681 KLA TENCOR P-2 Profileometer 150 mm,200 mm 01.06.1996 1 as is where is
108075 KLA Tencor 2131 Wafer Defect Inspection 150 mm 1 as is where is
108165 KLA TENCOR Surfscan 7200 Surfscan wafer particle detection 150 mm,200 mm 01.06.1991 1 as is where is
108166 KLA TENCOR Surfscan 7200 Surfscan wafer particle detection 150 mm,200 mm 01.06.1990 1 as is where is
1691 KLA-TENCOR 259 (spare parts) Reticle Inspection - SPARE PARTS up to 7 inch 01.12.1991 1 inquire immediately
52151 KLA-Tencor Hamamatsu R1924A Photomultiplier spares 01.03.2007 1 as is where is immediately
53035 KLA-Tencor 2132 (8 inch Wafer Chuck Assembly) Ceramic Wafer chuck, 8" spares 1 as is where is immediately
53036 KLA-Tencor Compumotor M575L11 Stepping motor drive spares 1 as is where is immediately
71632 KLA-TENCOR 2122 Brightfield Wafer Defect Inspection System 200 mm 01.04.1996 1 as is where is immediately
91435 KLA-Tencor AIT Particle Review 200 mm 31.05.1997 1 as is where is
91464 KLA-Tencor PROMETRIX FT750 Film Thickness Measurement 200 mm 1 as is where is immediately
91466 KLA-Tencor PROMETRIX FT750 Film Thickness Measurement 1 as is where is
96998 KLA-Tencor Surfscan AIT Patterned Wafer Inspection 200 mm 01.05.1997 1 as is where is immediately
108716 KLA-Tencor Surfscan 4500 Unpatterned Wafer Surface Inspection 2 inch to 6 inch 01.11.1989 1 as is where is immediately
108760 KLA-Tencor Surfscan 4500 Wafer Particle Inspection System 2 to 6 inch 01.05.1986 1 as is where is immediately
109107 KLA-Tencor PROMETRIX FT-650 WAFER FILM THICKNESS MEASUREMENT SYSTEM 01.06.1991 1 as is where is immediately
109191 KLA-Tencor 2820 Wafer Inspection Equipment 300mm 1 as is where is
109192 KLA-Tencor 2820 Wafer Inspection Equipment 300mm 1 as is where is
109193 KLA-Tencor 2830 Brightfield Inspection 300mm 1 as is where is
109194 KLA-Tencor AIT UV Darkfield Inspection 300mm 1 as is where is
109195 KLA-Tencor ASET-F5x Film Thickness Measurement System 300mm 1 as is where is
109196 KLA-Tencor Puma 9130 Darkfield Inspection 300mm 1 as is where is
109197 KLA-Tencor Puma 9130 Darkfield Inspection 300mm 1 as is where is
109198 KLA-Tencor Surfscan SP2 Particle Measurement 300mm 1 as is where is
109598 KLA-Tencor Surfscan 5500 Wafer Particle Detection 200 mm 1 inquire
109601 KLA-Tencor P15XP Surface Profiler (Upgraded from a P10) 200 mm 1 inquire
109613 KLA-Tencor AIT Surfscan wafer particle detection system 150 mm 1 inquire
108837 KOKUSAI VR70 Resistivity Test Tool 1 inquire
94475 LASERTEC BGM300 Wafer Surface Analyzing and VIsualization System 200 mm 31.05.2008 1 as is where is
106702 LASERTEC BGM300 Wafer Inspection System 300 mm 1 as is where is
106485 Leica LEICA INM20 Microscope inspection station 200 mm 01.06.1995 1 as is where is immediately
108171 LEICA INM100 Microscope 1 as is where is
108172 LEICA INM100 Microscope 1 as is where is
108173 LEICA INM100 Microscope 1 as is where is
108174 LEICA KENSINGTON 300901 Wafer Inspection Microscope 1 as is where is
108175 LEICA KENSINGTON 300901 Wafer Inspection Microscope 1 as is where is
108176 LEICA KENSINGTON 300901 Wafer Inspection Microscope 1 as is where is
108177 LEICA KENSINGTON 300901 Wafer Inspection Microscope 1 as is where is
108178 LEICA Polyvar SC POLYVAR SCOPE 1 as is where is
108179 LEICA Reichert POLYVAR SC Wafer Inspection Microscope 200 mm/300 mm 01.06.2002 1 as is where is
108180 LEICA Reichert-Jung, Kensington 300901 Wafer Inspection Microscope 1 as is where is
108181 LEICA Reichert-Jung, Kensington 300901 Wafer Inspection Microscope 1 as is where is
108182 LEICA Reichert-Jung, Kensington 300901 Wafer Inspection Microscope 1 as is where is
108183 LEICA Reichert-Jung, Kensington 300901 Wafer Inspection Microscope 1 as is where is
109211 Leica INS3300 Macro-Defect 300mm 1 as is where is
109212 Leica INS3300 Macro-Defect 300mm 1 as is where is
109213 Leica INS3300 Macro-Defect 300mm 1 as is where is
108464 Metryx Mentor DF3 Mass Measurement 300 mm 1 as is where is
108465 Metryx Mentor OC23 Mass Measurement 200-300 mm 1 as is where is immediately
109214 Metryx Mentor OC23 Mass Measurement 200mm 1 as is where is
108848 MINATO MM-6600 Wafer Mobility Tester with MECS UX-1000 Wafer Robot, 2ea Available 1 inquire
108029 MSP CORP. 2300XP1 Particle Depositioning 300 mm 1 as is where is
106703 N&K ANALYZER 5700-CDRT Wafer Inspection System 1 as is where is
106704 n&k Technology 6700-CDRT Wafer Inspection System 1 as is where is
106705 NANO OPTICS HAZE 2 Nano Optics Haze 2 200 mm 1 as is where is
91526 NANOMETRICS Caliper Mosaic Overlay 300 mm 31.05.2003 1 as is where is immediately
91529 NANOMETRICS Caliper Mosaic Overlay 300 mm 28.02.2010 1 as is where is immediately
91530 NANOMETRICS NANOMETRICS 9-7200-0195E Mask & Wafer Inspection 200 mm 1 as is where is
98289 NANOMETRICS CALIPER ULTRA Mask & Wafer Inspection 300 mm 31.05.2005 1 as is where is
98290 NANOMETRICS CALIPER ULTRA Mask & Wafer Inspection 300 mm 31.05.2005 1 as is where is
98291 NANOMETRICS CALIPER ULTRA Mask & Wafer Inspection 300 mm 30.06.2006 1 as is where is immediately
98480 Nanometrics 8000X film thickness measurement 150mm 2 as is where is immediately
98481 Nanometrics 8000Xse film thickness measurement 200mm 2 as is where is
101585 NANOMETRICS CALIPER-ULTRA Overlay Measurement 300 mm 30.06.2006 1 as is where is
103544 NANOMETRICS CALIPER ELAN Overlay 300 mm 31.05.2004 1 as is where is
106179 Nanometrics 9000 Nanospec Wafer Metrology film thickness measurement tool 200 mm 01.06.2005 1 as is all rebuilt immediately
106706 NANOMETRICS CALIPER_ULTRA Mask & Wafer Inspection 300 mm 01.06.2006 1 as is where is
106823 Nanometrics Nanospec 9100 Ox film thickness measurement (PC missing) 200mm 1 as is where is immediately
107027 NANOMETRICS Caliper Mosaic Overlay measurement System 300 mm 01.08.2010 1 inquire immediately
108186 NANOMETRICS CALIPER_MOSAIC Overlay 300 mm 01.06.2001 1 as is where is
108467 Nanometrics Tevet Trajectory T3 Film Thickness Measurement System 300 mm 1 as is where is
109113 Nanometrics LynX 9010T Optical CD Measurement (Scatterometry) system 300 mm 01.09.2008 1 as is where is immediately
93103 NGR NGR2150 E-beam wafer inspection 300 MM 1 as is where is
108853 NICOLET Avatar 370 DTGS FT-IR Spectrometer 1 inquire
108189 NIDEC Im15 Wafer inspection 1 as is where is
108190 NIDEC Im800 Wafer inspection 1 as is where is
99396 Nikon EpiPhot 200 Inspection Microscope 200 mm 1 as is where is immediately
106503 Nikon Auto Wafer Loader for Microscope Inspection WAFER INSPECTION MICROSCOPE 150 mm/200 mm 1 as is where is immediately
106707 NIKON AMI-3300 Wafer Inspection System 300 mm 1 as is where is
106708 NIKON AMI-3300 Wafer Inspection System 300 mm 1 as is where is
106709 NIKON AMI-3500 Wafer Inspection System 300 mm 1 as is where is
108092 Nikon OPTIPHOT-200 Wafer inspection microscope 200 mm 3 as is where is
108093 Nikon OPTIPHOT-300 Wafer inspection microscope 300 mm 1 as is where is
108094 Nikon OPTIPHOT-88-AC IN Wafer inspection microscope 200 mm 1 as is where is
108643 Nikon Eclipse L200 Wafer Inspection Microscope 150 mm/200 mm 01.06.2006 1 as is where is immediately
108772 Nikon Optistation 3 Wafer Inspection System 150 mm 01.05.1994 1 as is where is immediately
108784 Nikon Optistation 3A Automatic Wafer Inspection Station 200 mm 01.05.1997 1 as is where is immediately
108785 NIKON Optiphot 200 (For spares use) Wafer Inspection Microscope (Parts Tool Only) 200 mm 1 as is where is immediately
108789 Nikon Optiphot 200 Wafer Inspection Microscope 200 mm 1 as is all rebuilt immediately
108790 NIKON Optiphot 88 Wafer Inspection Microscope 200 mm 1 as is where is immediately
108854 NIKON NWL-860 Automatic Microscope Wafer Loader for up to 200mm Wafers 1 inquire
108855 NIKON Optiphot 200 Wafer Inspection Microscope, B/Dfield & DIC Microscopy, Motorized Turret with 5ea Objectives, Prior ProScan Programmable Stage, 200mm X 200mm XY Travel, Color CCD Camera & More 1 inquire
110610 NIKON OptiStation 3 Wafer Inspection Microscope 200 mm 1 as is where is immediately
110618 NIKON Optistation 3 Wafer Inspection Microscope 01.07.1994 1 as is where is immediately
108033 NOVA NOVASCAN 3090 P/N 390-10000-11 CMP metrology system 300 mm 1 as is where is immediately
108967 NOVA T600 MMSR Ellipsometer for CD and thin film measurements 300 mm 01.01.2018 1 as is where is immediately
109216 Nova NovaScan 3090 Next SA Optical CD Measurement 300mm 1 as is where is
109217 Nova NovaScan 3090 Next SA Optical CD Measurement 300mm 1 as is where is
109218 Nova NovaScan 3090 Next SA Optical CD Measurement 300mm 1 as is where is
109219 Nova NovaScan 3090 Next SA Optical CD Measurement 300mm 1 as is where is
109220 Nova V2600 Integrated CMP Endpoint / Film Measurement 300mm 1 as is where is
109283 NOVA MEASURING Novascan Novascan CMP Endpoint measurement unit 200 mm 01.06.2000 1 as is where is immediately
109284 NOVA MEASURING Novascan Novascan CMP Endpoint measurement unit 200 mm 01.06.2000 1 as is where is immediately
106825 Olympus AL110-LMB6 with MX51 wafer loader with Microscope 150mm 1 inquire
108786 OLYMPUS BH-BHM Wafer Inspection Microscope 150 mm 1 as is where is immediately
108857 OLYMPUS AL100-L8 Wafer Loader, 200mm, Parts Tool 200 MM 1 inquire
109035 Olympus AL110N-LMB6 Wafer Inspection Microscope with autoloader 100 MM AND 150 mm 1 as is where is immediately
109058 Olympus AL110N-LMB6 Microscope autoloader only (Not including the microscope) 100 MM AND 150 mm 1 as is where is immediately
103547 ONTO WV320 MACRO INSPECTING 300 mm 31.05.2004 1 as is where is
109229 ONTO AutoEL III Ellipsometer 200mm 1 as is where is
109230 ONTO Axi 935 Macro-Defect 300mm 1 as is where is
109231 ONTO MetaPULSE 300 Film Thickness Measurement System 300mm 1 as is where is
109232 ONTO MetaPULSE 300 Film Thickness Measurement System 300mm 1 as is where is
109233 ONTO NSX 105 Macro-Defect 200mm 1 as is where is
109559 Philips PHI 680 Auger Nanoprobe Laboratory 01.05.1998 1 as is where is immediately
31246 PMS Liquitrack 776200 Non volatile residual Monitor for water-quality checking facilities 01.10.1999 1 as is where is immediately
91552 RAYTEX RXW-800 EDGE SCAN 200 mm 31.05.2008 1 as is where is
98489 Raytex RXW-0826SFIX-SMIF edge scanner 200mm 1 as is where is
108479 Raytex RXW-1227 EdgeScan Edge Defect 1 as is where is
108329 ReVera RVX1000 Film Thickness Measurement System 300 mm 1 as is where is immediately
108480 ReVera RVX1000 Film Thickness Measurement System 1 as is where is
91557 RIGAKU XRF3640 (Handle include) Wafer/ Disk Analyzer 200 mm 01.05.1995 1 as is where is
108194 RIGAKU 3640 WAFER/DISK Analyzer 200 mm 01.06.2000 1 as is where is immediately
108865 RIGAKU V300 Total Reflection Xray Fluoroescence Spectrometer 1 inquire
91559 RUDOLPH AXI_S Macro Inspection System 300 mm 31.05.2005 1 as is where is
91560 RUDOLPH AXI_S Macro Inspection System 300 mm 31.05.2005 1 as is where is
91561 RUDOLPH AXI_S Macro Inspection System 300 mm 31.05.2006 1 as is where is
91563 RUDOLPH Meta Pulse Film Metrology 200 mm 31.05.2005 1 as is where is
91566 Rudolph WS3840 3D Bump Metrology 300 mm 31.05.2010 1 as is where is immediately
91567 RUDOLPH META PULSE 200 Surface Film Metrology 200 mm 31.05.2002 1 as is where is immediately
94478 RUDOLPH FE-3 Focus Ellipsometer 200 mm 1 as is where is
94479 RUDOLPH FE-4D Focus Ellipsometer 200 mm 1 as is where is
98296 RUDOLPH Meta Pulse 300 Film thickness measurement 300 mm 1 as is where is
98297 RUDOLPH Meta Pulse 300 Film thickness measurement 300 mm 1 as is where is
98298 RUDOLPH MP1-300 Film thickness measurement 300 mm 31.05.2007 1 as is where is
98835 RUDOLPH AXI-S Macro Wafer Inspection 300 mm 01.06.2004 1 as is where is immediately
98837 RUDOLPH MP1-300XCU Film Thickness Measurement System 300 mm 30.04.2008 1 as is where is immediately
100928 RUDOLPH AXI-S Macro Inspection System 300 mm 31.05.2003 1 as is where is
100929 RUDOLPH FE-7 Ellipsometer 200 mm 31.05.1996 1 as is where is
100930 RUDOLPH MP300 Film thickness measurement 200 mm 31.05.2007 1 as is where is
100931 RUDOLPH MP300 Film thickness measurement 200 mm 31.05.2009 1 as is where is
100932 RUDOLPH S3000A Focused Beam Ellipsometer 200 mm 31.05.2012 1 as is where is
103553 RUDOLPH AXI-S Macro Inspection 300 mm 31.05.2004 1 as is where is
103554 RUDOLPH AXI935D AVI 300 mm 1 as is where is
103555 RUDOLPH MP3 300XCU FLIM THICKNESS MEASUREMENT SYSTEM 300 mm 1 as is where is immediately
106420 Rudolph NSX 115 Automated Defect Inspection 200 mm 1 as is where is immediately
106421 Rudolph NSX 95 Automated Macro Defect Inspection 150 mm/200 mm 1 as is where is immediately
106422 Rudolph NSX-105 Automated Defect Inspection 150 mm/200 mm 1 as is where is immediately
106424 Rudolph NSX-95 Automated Macro Defect Inspection 150 mm/200 mm 1 as is where is immediately
106425 Rudolph NSX-95 Manual Macro Wafer Defect Inspection 150 mm/200 mm 1 as is where is immediately
106715 RUDOLPH MP3_300A METAL THICKNESS MEASUREMENT 300 mm 01.06.2012 1 as is where is
106716 RUDOLPH MP-300 Film thickness measurement 300 mm 01.06.2005 1 as is where is
106717 RUDOLPH MP1-300 Film Thickness Measurement 300 mm 01.06.2003 1 as is where is
106718 RUDOLPH MP1-300 Film Thickness Measurement 300 mm 1 as is where is
106719 RUDOLPH MP1-300XCU Film thickness measurement system 300 mm 01.06.2008 1 as is where is
106720 RUDOLPH NSX 105 MACRO DEFECT INSPECTION SYSTEM 300 mm 01.06.2008 1 as is where is immediately
106721 RUDOLPH S3000A FBE(focused beam laser ellipsometry) 300 mm 01.06.2010 1 as is where is
106722 RUDOLPH S3000A FBE(focused beam laser ellipsometry) 300 mm 01.06.2011 1 as is where is
106723 RUDOLPH S3000A FBE(focused beam laser ellipsometry) 300 mm 1 as is where is
106724 RUDOLPH S3000A FBE(focused beam laser ellipsometry) 300 mm 01.06.2011 1 as is where is
106725 RUDOLPH S3000S FBE(focused beam laser ellipsometry) 300 mm 01.06.2010 1 as is where is
106726 RUDOLPH S3000S FBE(focused beam laser ellipsometry) 300 mm 1 as is where is
106727 RUDOLPH WS2500 Wafer Inspection System 200 mm 01.06.2003 1 as is where is
106728 RUDOLPH WS2500 Wafer Inspection System 200 mm 01.06.2003 1 as is where is
106729 RUDOLPH WS2500 Wafer Inspection System 200 mm 01.06.2006 1 as is where is
106730 RUDOLPH WS2500 Wafer Inspection System 200 mm 01.06.2002 1 as is where is
106731 RUDOLPH WV320 Macro Inspection 300 mm 01.06.2006 1 as is where is
106732 RUDOLPH MP200 Film thickness measurement 200 mm 01.06.2003 1 as is where is
106733 RUDOLPH MP200 Film thickness measurement 200 mm 01.06.1999 1 as is where is
106734 RUDOLPH WV320 Macro Defect Inspection System 300 mm 1 as is where is
106735 RUDOLPH WV320 Macro Defect Inspection System 300 mm 1 as is where is
106831 Rudolph MP200XCU Cu Film thickness measurement 200mm 1 inquire
106832 Rudolph MP300 Metal Film thickness measurement 300mm 1 inquire
106833 Rudolph MP300 XCu Cu Film thickness measurement 300mm 2 inquire
106871 RUDOLPH NSX 105 Automated Wafer, Die and Bump Inspection System 300 mm 01.06.2008 1 as is where is immediately
108034 RUDOLPH AXI-S930B Macro Defect Inspection 300 mm 01.01.2007 1 as is where is
108195 RUDOLPH META PULSE 200 Film thickness measurement 200 mm 01.06.1999 1 as is where is
108196 RUDOLPH META PULSE 200 Film thickness measurement 200 mm 01.06.2005 1 as is where is
108197 RUDOLPH META PULSE 200X CU Film thickness measurement (Including HDD) 200 mm 01.06.2003 1 as is where is
108198 RUDOLPH META PULSE 200X CU Film thickness measurement (Including HDD) 200 mm 01.06.2001 1 as is where is
108199 RUDOLPH META PULSE II 200X CU Film thickness measurement 200 mm 01.06.2008 1 as is where is
108200 RUDOLPH MP200 Film thickness measurement 200 mm 01.06.2002 1 as is where is
108482 Rudolph Axi 935 Macro-Defect 1 as is where is
108483 Rudolph Matrix S-300 Ellipsometer 300 mm 1 as is where is
108484 Rudolph MetaPULSE 300 Film Thickness Measurement System 300 mm 3 as is where is
108485 Rudolph NSX 105 Macro-Defect 300 mm 8 as is where is
108587 RUDOLPH WV320 Wafer Inspection System 300mm 1 as is where is immediately
108711 Rudolph Sonus 7800 Acoustic Metrology and Defect Detection System 300 MM 01.06.2015 1 inquire
109550 Rudolph AXI-S Macro Defect Inspection System 300 mm 01.06.2006 1 as is where is immediately
109570 Rudolph WaferView 320 Macro Wafer Defect Inspection System 300 mm 1 as is where is immediately
106661 SDI FAAST 230-DP+SPV+SLIC CARRIER LIFETIME MEASUREMENT 200 mm 1 as is where is
108035 SEMILAB PMR_3000 Dose Monitoring 300 mm 1 as is where is
108696 SENTECH Senduro 300 Thin Film measurement Up to 300 MM 01.06.2008 1 inquire
106742 SSM 5200 Resistivity Measurement 200 mm 01.06.2008 1 as is where is
108773 SSM 470i CV Plotter 1 inquire
91569 Thermo Fisher ECO 1000 FTIR System 200 mm 01.05.2000 1 as is where is immediately
107011 Veeco Dektak 200 Si Contact Profilometer - for spares use (Not operational condition) 150 mm 01.06.2000 1 as is where is immediately
108331 Veeco Dimension 7000 Atomic Force Microscope (AFM) 200mm 1 as is where is immediately
108893 VEECO AP-150 Automtic Four Point Probe, for up to 6" Wafers 150 MM 1 as is where is 2 weeks
108894 VEECO Dektak 3030ST Profilometer 1 inquire
108916 Veeco Dimension X3D Model 340 Atomic Force Microscope 300 MM 01.05.2006 1 as is where is immediately
109116 Veeco Vx340 Dimension Atomic Force Proflier 300 mm 01.06.2010 1 as is where is immediately
109600 Veeco Dimension 3100 Atomic Force Microscope 1 inquire
93087 Woollam VUV-VASE (Gen II) Ellipsometer 300 MM 1 as is where is immediately
108216 ZEISS AXIOTRON Inspection Micro Scope 1 as is where is
108217 ZEISS AXIOTRON Inspection Micro Scope 1 as is where is
108218 ZEISS AXIOTRON High Perfomance Micro Scope 01.06.2008 1 as is where is
108545 Zeiss Axiospect 300 Optical Review System 300 mm 4 as is where is
108972 Zeiss Axiospect Wafer Inspection Microscope 300 mm 01.06.2011 1 as is where is immediately


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