Please find below a list of used semiconductor manufacturing equipment , solar cell equipment, test equipment, assembly equipment and SMT equipment owned 100% by Fabsurplus.com. All equipment is available for immediate sale. It is located in Italy, Germany, Japan , Singapore and Texas at our worldwide network of storage facilities. It can be inspected by appointment. Click on the link to see detailed photos and technical information on these sales items. Most items can be offered either " as is" , "as is, operational" or refurbished.
| SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time |
|---|---|---|---|---|---|---|---|---|
| 54859 | 35 MWp | Baccini | Solar Cell Print line for Mono or Poly Crystalline Solar Cells | 156 mm | 01.11.2005 | 1 | as is where is | immediately |
| 98785 | 60 MWp | Baccini | Solar Cell Print Line for Mono or Poly Crystalline Solar Cells | Solar | 01.05.2008 | 1 | as is where is | immediately |
| 54226 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 7 | as is where is | immediately |
| 95398 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 1 | as is where is | immediately |
| 95399 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 1 | as is where is | immediately |
| 95400 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 1 | as is where is | immediately |
| 95401 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 1 | as is where is | immediately |
| 95402 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 1 | as is where is | immediately |
| 95403 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 1 | as is where is | immediately |
| 98706 | Adixen Alcatel | ADS 602H | Dry Vacuum pump combo | Pump | 01.05.2008 | 1 | as is where is | immediately |
| 87652 | Advantest | T5371 | Test system (With a single test head ) | Test | 1 | as is where is | immediately | |
| 89909 | Advantest | Hifix for PQFP80 (14 x 20) | Hi-fix for Advantest T5371 package type PQFP80 (14 x 20) | Spares | 31.05.2005 | 1 | as is where is | immediately |
| 99379 | ADVANTEST | T5375 | High-Speed Flash Memory tester | TEST | 1 | as is where is | immediately | |
| 99380 | ADVANTEST | T5771ES | Automated Test Equipment for laboratory or office use | TEST | 1 | as is where is | immediately | |
| 99388 | Advantest | Versatest V4000 | Automated Test Equipment for laboratory or office use | TEST | 01.06.2006 | 1 | as is where is | immediately |
| 99389 | Advantest | V4000 | Automated Test Equipment | TEST | 1 | as is where is | immediately | |
| 99390 | Advantest | V4000 | Automated Test Equipment | TEST | 1 | as is where is | immediately | |
| 109022 | Advantest | Versatest V6000 | Test Engineering Workstation for Office or Laboratory Use | Test | 01.05.2008 | 1 | as is where is | immediately |
| 10544 | Agilent / Verigy / Keysight | 4261A | LCR METER | TEST | 1 | as is where is | immediately | |
| 18868 | Agilent / Verigy / Keysight | 5335A | Universal Frequency Counter | Electronics Test and Measurement | 1 | as is where is | immediately | |
| 18869 | Agilent / Verigy / Keysight | E4915A | Crystal impedance LCR meter | Electronics Test and Measurement | 1 | as is where is | immediately | |
| 76605 | Agilent / Verigy / Keysight | 41501B | SMU and Pulse Generator Expander 2 units | TEST | 01.05.2001 | 1 | as is where is | immediately |
| 79588 | Agilent / Verigy / Keysight | 1671G | Logic Analyzer | test | 01.09.2007 | 1 | as is where is | immediately |
| 79589 | Agilent / Verigy / Keysight | 1671G | Logic Analyzer | test | 30.09.2008 | 1 | as is where is | immediately |
| 2669 | Angelantoni | T600 TU5 | Large Clean-room Oven with internal blowers | FACILITIES | 01.07.1995 | 1 | as is where is | immediately |
| 10637 | Angelantoni | T600 TUS | Large Clean-room Oven with internal blowers | FACILITIES | 31.05.1995 | 1 | inquire | immediately |
| 34740 | AP & S | TwinStep-B H3P04 | Semi-Automatic Wet Bench, used for H3PO4 with a 2 stage Megasonic and QDR | 200 mm | 01.10.2005 | 1 | as is where is | immediately |
| 83514 | Applied Materials | Opal 7830i Enhanced | CD MEASUREMENT SEM FOR 200 mm / 150 mm wafers | 100 mm to 200 mm | 01.05.1997 | 1 | as is where is | immediately |
| 101768 | Applied Materials | 0010-00557 REV A | Heat Exchanger | FACILITIES | 31.08.1988 | 1 | as is where is | immediately |
| 77009 | Baccini | Screen Printer 2 | screen printer | 156 mm | 31.05.2001 | 1 | as is where is | immediately |
| 77010 | Baccini | Screen Printer 3 | screen printer | 156 mm | 31.10.2001 | 1 | as is where is | immediately |
| 77013 | Baccini | CHIP AND CRACK CAMERA | Chip and Crack camera | 156 mm | 31.05.2007 | 1 | as is where is | immediately |
| 77017 | Baccini | Cell electrical tester | Electrical Cell tester | 156 mm | 31.05.2006 | 1 | as is where is | immediately |
| 77021 | Baccini | Dryer 1 | Dryer 1 | 156 mm | 31.10.2001 | 1 | as is where is | immediately |
| 77022 | Baccini | Dryer 2 | Dryer 1 | 156 mm | 31.10.2001 | 1 | as is where is | immediately |
| 98708 | Baccini | Furnace 1 | Drying Furnace | Solar | 31.05.2008 | 1 | as is where is | immediately |
| 98709 | Baccini | Furnace 2 | Drying Furnace | Solar | 31.05.2008 | 1 | as is where is | |
| 98710 | Baccini | Test 1 | Solar Cell Inspection | Solar | 31.05.2008 | 1 | as is where is | immediately |
| 98711 | Baccini | Test 2 | Icos Solar Cell Inspection | Solar | 31.05.2008 | 1 | as is where is | immediately |
| 98712 | Baccini | Test 3 | Automatic Cell Sorter | Solar | 31.05.2008 | 1 | as is where is | immediately |
| 98715 | Baccini | Printer 1 | Screen Printer | Solar | 31.05.2008 | 1 | as is where is | immediately |
| 98716 | Baccini | Printer 2 | Screen Printer | Solar | 31.05.2008 | 1 | as is where is | immediately |
| 98717 | Baccini | Printer 3 | Screen Printer | Solar | 31.05.2008 | 1 | as is where is | immediately |
| 100888 | Baccini | Furnace 3 | Drying Furnace | Solar | 31.05.2008 | 1 | as is where is | immediately |
| 103388 | Baccini | Oven 3 Unload Buffer FFF | Unload buffer unit from Oven 3 and FFF loader | Solar | 31.05.2008 | 1 | as is where is | immediately |
| 98718 | Berger | PSS10 | Pulsed Solar Simulator | Solar | 31.05.2008 | 1 | as is where is | immediately |
| 56140 | CentroTherm | DO 12.000-200-FF-HTO-CAN-NT4.0 | Belt Reflow Furnace for solar cell production (Fast Firing Furnace) with Dryer | Solar | 01.05.2001 | 1 | as is where is | immediately |
| 56144 | Centrotherm | Centronic E2000 | Horizontal diffusion furnace for POCl3 doping | 156 mm | 01.05.2003 | 1 | as is where is | immediately |
| 98721 | Centrotherm | E 2000 HT 300-4 | Horizontal Diffusion Furnace for POCl3 doping | Solar | 01.05.2008 | 1 | as is where is | immediately |
| 98722 | Centrotherm | E 2000 HT 320-4 | Nitride Diffusion Furnace for Anti-refective coating PECVD | Up to 300 mm | 01.05.2008 | 1 | as is where is | immediately |
| 98725 | Centrotherm | Loader | Furnace Loader | Solar | 31.05.2008 | 1 | as is where is | immediately |
| 103801 | Centrotherm | DO-FF-8600-300 | Belt Reflow Furnace for solar cell production (Fast Firing Furnace) | Solar | 01.05.2008 | 1 | as is where is | immediately |
| 80083 | COLUSSI | UG 50 E | AUTOCLAVE FOR STERILIZATION | Laboratory | 01.06.2000 | 1 | as is where is | immediately |
| 87089 | Credence | Personal Kalos I | Test system | TEST | 31.10.2002 | 1 | as is where is | immediately |
| 79394 | Ebara | A30W | Vacuum Pump | Pump | 1 | as is where is | immediately | |
| 79395 | Ebara | A30W | Vacuum Pump | Pump | 1 | as is where is | immediately | |
| 54217 | Edwards | iQDP80 / QMB1200 | Dry Vacuum Pump combo | pump | 01.03.2007 | 3 | as is where is | immediately |
| 54218 | Edwards | iQDP80 / QMB1200 | Dry Vacuum Pump combo | pump | 01.03.2007 | 1 | as is where is | immediately |
| 54219 | Edwards | iQDP80 / QMB1200 | Dry Vacuum Pump combo | pump | 01.03.2007 | 1 | as is where is | immediately |
| 54220 | Edwards | QDP80 + QMB 250F | Dry Vacuum Pump combo | pump | 31.05.2000 | 1 | as is where is | immediately |
| 54221 | Edwards | QDP80 + QMB 250F | Dry Vacuum Pump combo | pump | 31.05.2000 | 1 | as is where is | immediately |
| 54222 | Edwards | QDP80 | Dry Vacuum Pump | pump | 31.05.2000 | 1 | as is where is | immediately |
| 95559 | Edwards | iQDP40 | Dry Mechanical Pump | Pump | 01.05.2000 | 1 | as is where is | immediately |
| 106919 | Edwards | STP-A1303C | TURBOMOLECULAR PUMP | PUMP | 01.06.2002 | 1 | as is where is | immediately |
| 106972 | Edwards | QDP80 Drystar | Dry Vacuum pump with power box | pump | 01.06.1995 | 1 | as is where is | immediately |
| 106973 | Edwards | QDP80 + QMB250F | Dry Vacuum pump combo with power box | pump | 01.06.1995 | 1 | as is where is | immediately |
| 106974 | Edwards | QDP40 + QMB250F | Dry Vacuum pump combo with power box | pump | 01.06.1995 | 1 | as is where is | immediately |
| 106975 | Edwards | QDP80 + QMB250F | Dry Vacuum pump combo with power box | pump | 01.06.1995 | 1 | as is where is | immediately |
| 69878 | Edwards / Seiko Seiki | STP 1000C | TURBO PUMP TMP 100C 250 ISO-K/KF40 | VACUUM PUMP | 01.10.1999 | 1 | as is where is | immediately |
| 78132 | Electroglas | Horizon 4085X | Fully Automatic Prober with Optem microscope and an inker | 125 mm, 150 mm and 200 mm | 01.01.1998 | 1 | as is where is | immediately |
| 99387 | ELES | ART 200 | Debug Station for Reliability Test System | RELIABILITY | 1 | as is where is | immediately | |
| 83513 | Entegris | RSPX-EUV-036 | Reticle Direct Purge Cabinet | Facilities | 01.07.2010 | 1 | as is where is | immediately |
| 83515 | Extraction Systems | TMB 150 | Photoresist Contamination Monitor System / Total Amine Analyzer | Facilities | 31.05.2004 | 1 | as is where is | immediately |
| 76735 | GL Automation | IDSCOPE | Wafer bar code reader | 200 mm | 30.06.2004 | 1 | as is where is | immediately |
| 76736 | GL Automation | IDSCOPE | Wafer bar code reader | 200 mm | 30.06.2004 | 1 | as is where is | immediately |
| 76737 | GL Automation | IDSCOPE | Wafer bar code reader | 200 mm | 30.06.2004 | 1 | as is where is | immediately |
| 76738 | GL Automation | IDSCOPE | Wafer bar code reader | 200 mm | 30.06.2004 | 1 | as is where is | immediately |
| 76739 | GL Automation | IDSCOPE | Wafer bar code reader | 200 mm | 31.08.2004 | 1 | as is where is | immediately |
| 71907 | Hamamatsu | C7103 | PC Controlled IC Back-side Lapping and Wafer Grinding System | 200 mm and packages | 30.09.2001 | 1 | as is where is | immediately |
| 56141 | Innolas | ILS 700P | Laser Edge Isolation | 156 mm | 01.11.2006 | 1 | as is where is | immediately |
| 56310 | Jonas and Redmann | Q2 WHD A | Loader for Centrotherm E2000 furnace | 156 mm and 125 mm | 31.05.2003 | 1 | as is where is | immediately |
| 98726 | Jonas and Redmann | SDB | Automated Loader for Baccini Printing Line | Solar | 31.05.2008 | 1 | as is where is | immediately |
| 98727 | Jonas and Redmann | WHD (Wafer Handling Diffusion) | Automated Loader for Centrotherm E2000 Furnace | Solar | 01.05.2008 | 1 | as is where is | immediately |
| 98728 | Jonas and Redmann | WHP (Wafer Handling Plasm) | Automated Loader for Anti Reflection Coating System | Solar | 01.05.2008 | 1 | as is where is | immediately |
| 79595 | K Tech Engineering | BK04A | Blister tape applicator for microelectronic components | Assembly | 31.05.2010 | 1 | as is where is | immediately |
| 103208 | Keller | VARIO-T 1.0-SC8-B30-HD | Scrubber / Compact Dust Separator for Baccini laser unit exhaust air | Facilities | 31.10.2011 | 1 | as is where is | immediately |
| 71632 | KLA-TENCOR | 2122 | Brightfield Wafer Defect Inspection System | 200 mm | 01.04.1996 | 1 | as is where is | immediately |
| 108716 | KLA-Tencor | Surfscan 4500 | Unpatterned Wafer Surface Inspection | 2 inch to 6 inch | 01.11.1989 | 1 | as is where is | immediately |
| 15066 | LAMBDA PHYSIK | Novaline K2005 | 248 nm excimer laser for ASML /300 | facilities | 01.06.2002 | 1 | as is where is | immediately |
| 33542 | Liebherr | FKV 3610 | Fridge for the safe storage of photoresist | facilities | 1 | as is where is | immediately | |
| 98730 | LOTUS | Spray Cleaner | WET Clean for parts | Facilities | 01.10.2007 | 1 | as is where is | immediately |
| 79571 | Mazzali | Climatest C320G5 | Temperature and humidity testing chamber | Reliability | 31.05.1993 | 1 | as is where is | immediately |
| 79572 | Mazzali | Climatest C320G5 | Temperature and humidity testing chamber | Reliability | 31.05.1993 | 1 | as is where is | immediately |
| 4007 | MDC (Materials Development Corp.) | DUO CHUCK CSM16 | CV Measurement system | 150 mm | 31.05.1995 | 1 | inquire | immediately |
| 71902 | Microcontrol | MWE Plus | UV Wafer Eraser with cassette loading | 200 mm , 150 mm, 125 mm | 01.05.2000 | 1 | as is where is | immediately |
| 79592 | Minato Electronics | 1940 | EPROM Programmer with additional memory | Electronics Test and Measurement | 31.05.2007 | 1 | as is where is | immediately |
| 79593 | Minato Electronics | 1940 | EPROM Programmer | Electronics Test and Measurement | 31.05.2005 | 1 | as is where is | immediately |
| 99382 | NexTest / Teradyne | MAVERICK PT II | Automated Test Equipment | TEST | 1 | as is where is | immediately | |
| 99383 | NexTest / Teradyne | MAVERICK PT II | Automated Test Equipment | TEST | 1 | as is where is | immediately | |
| 31246 | PMS | Liquitrack 776200 | Non volatile residual Monitor for water-quality checking | facilities | 01.10.1999 | 1 | as is where is | immediately |
| 54210 | Poly Design Inc. | Custom | Heated Quartz Boat storage / drying system | 200 mm | 31.05.2005 | 1 | as is where is | immediately |
| 98731 | Rofin | PowerLine D-100 (RSM, Sx) | Fiber Laser for solar cell edge isolation | Solar | 01.06.2008 | 1 | as is where is | immediately |
| 79602 | Salon Teknopaja OY | PWB | Printed Wire Board Level Drop Tester with Solder Joint Reliability tester | SMT | 31.05.2004 | 1 | as is where is | immediately |
| 79889 | Sanitas EG | Multilevel | EPROM Programmer | Electronics Test and Measurement | 1 | as is where is | immediately | |
| 86303 | Sankei Giken | TCW-12000 CV | Process Module Chiller | Facilities | 01.07.1996 | 1 | as is where is | immediately |
| 54208 | SemiNet Automation | Infinity SACS 251216-120-CE | Semi-Automatic Carousel Boxed Wafer Stocker | 200 mm | 01.10.2007 | 1 | as is where is | immediately |
| 84342 | Semitool | ST-921R-AA | Spin Rinse Dryer | 1 | as is where is | immediately | ||
| 84351 | Semitool | ST-240 | Spin Rinse Dryer | 1 | as is where is | immediately | ||
| 106946 | Semitool | ST-921R-AA | Spin Rinse Dryer | 100 mm | 2 | as is where is | immediately | |
| 73208 | Solitec | 5110C | Manually loading Photoresist Spin Coater | 3 to 9 inch | 01.09.1998 | 1 | as is where is | immediately |
| 102623 | SPTS | Omega 201 | Plasma Dry etcher (For spares use) | 200 mm | 01.05.2010 | 1 | as is where is | immediately |
| 71904 | ST Automation | test head | test head for Eprom U 1835 | 1 | as is where is | |||
| 71908 | ST Automation | PTM1 | Flash Memory Tester | Test | 3 | as is where is | immediately | |
| 71910 | ST Automation | MT32SX | Flash Memory Test System for 256 MB memory testing | TEST | 31.05.2008 | 1 | as is where is | immediately |
| 78133 | ST Automation | QT200 | Test System | test | 31.05.2007 | 1 | as is where is | immediately |
| 78137 | ST Automation | QT200 | Tester System with monitor | test | 1 | as is where is | immediately | |
| 78138 | ST Automation | R.S.V. | ST Memory Test System Electronic Automation | test | 31.03.2007 | 1 | as is where is | immediately |
| 80177 | ST Automation | QT200 | Automated Tester System with monitor | test | 01.10.2007 | 1 | as is where is | immediately |
| 80178 | ST Automation | QT200 | Automated Tester System with monitor | test | 01.10.2007 | 1 | as is where is | immediately |
| 80179 | ST Automation | QT200 | Automated Tester System with monitor | test | 01.10.2007 | 1 | as is where is | immediately |
| 80180 | ST Automation | QT200 | Automated Tester System with monitor | test | 01.10.2007 | 1 | as is where is | immediately |
| 80181 | ST Automation | QT200 | Automated Tester System with monitor | test | 01.10.2007 | 1 | as is where is | immediately |
| 80182 | ST Automation | QT200 | Automated Tester System with monitor | test | 01.10.2007 | 1 | as is where is | immediately |
| 80183 | ST Automation | QT200 | Automated Tester System with monitor | test | 01.10.2007 | 1 | as is where is | immediately |
| 80184 | ST Automation | QT EPR16 DD | Automated Flash Memory Tester System with monitor | TEST | 30.09.2007 | 1 | as is where is | immediately |
| 95233 | ST Automation | MT 32 SX | Fully Automated Memory Test System for BIST and NAND Memories | TEST | 30.11.2005 | 1 | inquire | immediately |
| 99969 | ST Automation | QT200 | Automated Tester System with monitor | test | 31.05.2005 | 1 | as is where is | immediately |
| 101848 | ST Automation | MT32SX | Automated Flash Memory Testing System | test | 31.05.2007 | 1 | as is where is | immediately |
| 102494 | ST Automation | MT32SX | Automated Flash Memory Testing System FOR TESTING 256 MB MEMORY | TEST | 30.09.2007 | 1 | as is where is | immediately |
| 33413 | SYNAX | SX3100 | Fully Automated test Handler, ambient and hot configured. | TEST | 01.05.2006 | 1 | as is all rebuilt | immediately |
| 33414 | SYNAX | SX3100 | Fully Automated test Handler, ambient and hot configured. | test | 01.05.2006 | 1 | as is all rebuilt | immediately |
| 79888 | System General | T9600 | Universal Device Programmer | Electronics Test and Measurement | 31.05.2003 | 1 | as is where is | immediately |
| 78136 | Sytrama | MTM 32 V01 | ST Test Head Manipulator QT 124 | 30.11.2005 | 1 | as is where is | immediately | |
| 80089 | Sytrama | MTM 32 V01 | ST Test Head Manipulator QT 124 | 30.11.2005 | 1 | as is where is | immediately | |
| 76613 | Tektronix | TDS694C | Digital 3 GHz real-time oscilloscope | Electronics Test and Measurement | 31.07.2007 | 1 | as is where is | immediately |
| 79590 | Tektronix | TDS 544A | Color 4 channel digitizing oscilloscope | Electronics Test and Measurement | 31.05.2006 | 1 | as is where is | immediately |
| 79597 | Tektronix | PS 280 | DC Power supply (Working condition) | Electronics Test and Measurement | 01.05.2007 | 1 | as is where is | immediately |
| 79599 | Tektronix | 11801C | Digital Sampling Oscilloscope | Electronics Test and Measurement | 31.01.2001 | 1 | as is where is | immediately |
| 79601 | Tektronix | 2432A | Digital Oscilloscope, 2 channel, with GPIB | Electronics Test and Measurement | 1 | as is where is | immediately | |
| 2181 | TEL TOKYO ELECTRON | TE 5480 | Nitride Plasma Reactive Ion Etch | 150 mm | 01.11.1992 | 1 | as is where is | immediately |
| 54232 | Teradyne | J994 | Memory Tester | test | 01.05.2000 | 1 | as is where is | immediately |
| 84082 | Varian | Turbo-V 250 MacroTorr | Turbo Pump DN ISO 100 Type | Pump | 01.05.1999 | 1 | as is where is | immediately |
| 95409 | Varian | Turbo-V 250 MacroTorr | Turbo Pump DN ISO 100 Type | Pump | 01.05.1999 | 1 | as is where is | immediately |
| 15619 | VERTEQ | FLUOROCARBON RD4500 CLASSIC | SRD | 100 mm | 01.04.1986 | 2 | as is where is | immediately |