Please find below a list of Used Probers for sale by fabsurplus.com .Click on any listed Prober to see further data.
SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time |
---|---|---|---|---|---|---|---|---|
108222 | Accretech | MHF300L | Manipulator for prober | 200 mm | 01.06.2000 | 1 | as is where is | |
108223 | Accretech | UF200 | Fully Automatic Prober | 200 mm | 01.06.1999 | 1 | as is where is | |
108224 | Accretech | UF200 | Fully Automatic Prober | 200 mm | 01.06.1999 | 1 | as is where is | |
108225 | Accretech | UF200 | Fully Automatic Prober | 200 mm | 01.06.2000 | 1 | as is where is | |
108226 | Accretech | UF200 | Fully Automatic Prober | 200 mm | 01.06.2000 | 1 | as is where is | |
108227 | Accretech | UF200 | Fully Automatic Prober | 200 mm | 01.06.2000 | 1 | as is where is | |
108228 | Accretech | UF2000 | Fully Automatic Prober | 200 mm | 01.06.2006 | 1 | as is where is | |
108229 | Accretech | UF200A | Fully Automatic Prober | 200 mm | 01.06.2004 | 1 | as is where is | |
108230 | Accretech | UF200A | Fully Automatic Prober | 200 mm | 01.06.2005 | 1 | as is where is | |
108232 | Accretech | UF3000EX-e | Fully Automatic Prober | 300 mm | 01.06.2012 | 1 | as is where is | |
108942 | Accretech | UF3000 | Prober | 300 mm | 01.05.2005 | 6 | as is where is | immediately |
54226 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 7 | as is where is | immediately |
95398 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 1 | as is where is | immediately |
95399 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 1 | as is where is | immediately |
95400 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 1 | as is where is | immediately |
95401 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 1 | as is where is | immediately |
95402 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 1 | as is where is | immediately |
95403 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 1 | as is where is | immediately |
102843 | Accretech TSK | UF200SA | Automatic Wafer Prober/Probe Station | 200 mm | 1 | as is where is | immediately | |
102844 | Accretech TSK | UF200SA | Automatic Wafer Prober/Probe Station | 200 mm | 1 | as is where is | ||
102845 | Accretech TSK | UF200SA | Automatic Wafer Prober/Probe Station | 200 mm | 1 | as is where is | ||
102846 | Accretech TSK | UF200SA | Automatic Wafer Prober/Probe Station | 200 mm | 1 | as is where is | ||
102847 | Accretech TSK | UF200SA | Automatic Wafer Prober/Probe Station | 200 mm | 1 | as is where is | ||
102848 | Accretech TSK | UF200SA | Automatic Wafer Prober/Probe Station | 200 mm | 1 | as is where is | ||
102849 | Accretech TSK | UF200SA | Automatic Wafer Prober/Probe Station | 200 mm | 1 | as is where is | ||
102850 | Accretech TSK | UF200SA | Automatic Wafer Prober/Probe Station | 200 mm | 1 | as is where is | ||
102851 | Accretech TSK | UF200SA | Automatic Wafer Prober/Probe Station | 200 mm | 1 | as is where is | ||
102852 | Accretech TSK | UF200SA | Automatic Wafer Prober/Probe Station | 200 mm | 1 | as is where is | ||
102853 | Accretech TSK | UF200SA | Automatic Wafer Prober/Probe Station | 200 mm | 1 | as is where is | ||
102854 | Accretech TSK | UF200SA | Automatic Wafer Prober/Probe Station | 200 mm | 1 | as is where is | ||
108332 | Accretech/TSK | FP3000 | Wafer Frame Prober | 300 mm | 8 | as is where is | ||
108333 | Accretech/TSK | UF3000 | Production Wafer Prober | 300 mm | 7 | as is where is | ||
108334 | Accretech/TSK | UF3000EX | Production Wafer Prober | 300 mm | 1 | as is where is | ||
108335 | Accretech/TSK | UF3000EX-e | Production Wafer Prober | 300 mm | 1 | as is where is | ||
106418 | Alessi | REL-4100A | Manual Prober | 150 mm/200 mm | 01.06.2000 | 1 | as is where is | immediately |
108726 | ALESSI | REL-4500 | Analytical Wafer Prober with 6" (dia.) Gold Plated Chuck | 150 mm | 1 | inquire | immediately | |
108798 | ALESSI | REL- Series 5000 | Analytical Prober with Mitutoyo FS-70 Zoom Microscope with LWD Objective Lenses, New Wave QuikLaze 532/355 Laser with 50X Lens, Missing Computer | 1 | inquire | |||
108799 | ALESSI | REL-4100A | Analytical Prober | 1 | inquire | |||
108976 | Cascade | Summit 12000 | Semi-automatic probe station with Shield Box, Temptronic thermal chuck -65C to 200 C | 200 mm | 01.06.2005 | 1 | as is where is | immediately |
78132 | Electroglas | Horizon 4085X | Fully Automatic Prober with Optem microscope and an inker | 125 mm, 150 mm and 200 mm | 01.01.1998 | 1 | as is where is | immediately |
91591 | ELECTROGLAS | EG5300 | Prober | 300 mm | 1 | as is where is | ||
91592 | ELECTROGLAS | EG5/300 A | Prober | 300 mm | 31.12.2004 | 1 | as is where is | immediately |
91593 | ELECTROGLAS | EG5300 | Prober | 300 mm | 1 | as is where is | ||
99397 | KARL SUSS | PM 8 | Manual Prober | 1 | as is where is | immediately | ||
108835 | KARL SUSS | PM-8 | Analytical Wafer Prober | 1 | inquire | |||
86304 | KLA | 1007 | Chuck, prober, 6" gold chuck assembly | 200 mm | 1 | inquire | immediately | |
71902 | Microcontrol | MWE Plus | UV Wafer Eraser with cassette loading | 200 mm , 150 mm, 125 mm | 31.05.2000 | 1 | as is where is | immediately |
108580 | Micromanipulator | Probe Station 1 | Manual Prober with hot and cold chuck | 200 mm | 1 | as is where is | immediately | |
108847 | MICRONICS JAPAN CO. | MP-10 | Manual Probe Station with B&L StereoZoom 7 Microscope & 2ea Micropositioners | 1 | inquire | |||
91040 | RUCKER & KOLLS | 683A | PROBER | 200 mm | 1 | as is where is | immediately | |
106740 | SECRON | IP 300 | Prober | 300 mm | 1 | as is where is | ||
108588 | SEMICS | OPUS2 | FULLY AUTOMATED PROBER | 300mm | 01.06.2007 | 1 | as is where is | immediately |
108589 | SEMICS | OPUS2 | FULLY AUTOMATED PROBER | 300mm | 01.06.2007 | 1 | as is where is | immediately |
108590 | SEMICS | OPUS2 | FULLY AUTOMATED PROBER | 300mm | 01.06.2007 | 1 | as is where is | immediately |
108591 | SEMICS | OPUS2 | FULLY AUTOMATED PROBER | 300mm | 01.06.2007 | 1 | as is where is | immediately |
108592 | SEMICS | OPUS3 | FULLY AUTOMATED PROBER | 300mm | 01.06.2011 | 1 | as is where is | immediately |
108593 | SEMICS | OPUS3 | FULLY AUTOMATED PROBER | 300mm | 01.06.2011 | 1 | as is where is | immediately |
71904 | ST Automation | test head | test head for Eprom U 1835 | 1 | as is where is | |||
106669 | SUSS MICROTECH | PM8 | Prober | 200 mm | 01.06.1996 | 1 | as is where is | |
102941 | TEL Tokyo Electron | P12XL | Automatic Wafer Prober/Probe Station | 300 mm | 1 | as is where is | ||
102942 | TEL Tokyo Electron | P12XL | Automatic Wafer Prober/Probe Station | 300 mm | 1 | as is where is | ||
106290 | TEL TOKYO ELECTRON | P-8XL | Prober | 200 mm | 1 | as is where is | immediately | |
106291 | TEL TOKYO ELECTRON | P-8 | Prober | 200 mm | 1 | as is where is | immediately | |
106292 | TEL TOKYO ELECTRON | P-12XLm | Prober | 300 mm | 1 | as is where is | immediately | |
106293 | TEL TOKYO ELECTRON | P-12XLm | Prober | 300 mm | 1 | as is where is | immediately | |
108495 | TEL Tokyo Electron | Cellcia | Production Wafer Prober | 300 mm | 20 | as is where is | ||
108503 | TEL Tokyo Electron | P-12XLn+ | Production Wafer Prober | 300 mm | 1 | as is where is | ||
108599 | TEL TOKYO ELECTRON | P12XLM | Prober | 300 mm | 01.05.2006 | 1 | inquire | immediately |
108603 | TEL Tokyo Electron | P12XLM | Prober | 300 mm | 01.05.2006 | 1 | as is where is | immediately |
108604 | TEL TOKYO ELECTRON | Precio Nano | FULLY AUTOMATED PROBER | 300 mm | 01.06.2012 | 1 | as is where is | immediately |
108614 | TEL Tokyo Electron | P8XL | Fully Automated Prober | 200 mm | 01.06.2001 | 1 | as is where is | immediately |
108943 | TEL Tokyo Electron | Precio | Fully Automatic prober | 300 mm | 1 | as is where is | immediately | |
108890 | ULTRACISION | 860 | Manual Wafer Prober, for up to 200mm Wafers | 200 MM | 1 | inquire |