Please find below a list of Used Test (ATE) Automatic Test Equipment for sale by fabsurplus.com .Click on any listed item of Test (ATE) Automatic Test Equipment to see further data.
| SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time |
|---|---|---|---|---|---|---|---|---|
| 54226 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 7 | as is where is | immediately |
| 95398 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 1 | as is where is | immediately |
| 95399 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 1 | as is where is | immediately |
| 95400 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 1 | as is where is | immediately |
| 95401 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 1 | as is where is | immediately |
| 95402 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 1 | as is where is | immediately |
| 95403 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 1 | as is where is | immediately |
| 78639 | Advantest | T5335P (Spares) | Spare Boards from test system (See attached list for details) | TEST | 30.11.1997 | 1 | as is where is | immediately |
| 79035 | ADVANTEST | T5585 | Test System | 200 mm | 1 | as is where is | immediately | |
| 86055 | ADVANTEST | T5382A1 | Test System | TEST | 1 | as is where is | immediately | |
| 86060 | Advantest | T5383 | Automated Test System | test | 1 | inquire | immediately | |
| 86062 | Advantest | T5371 | Automated Test System | test | 1 | inquire | immediately | |
| 86063 | Advantest | T5585 | Automated Test System | test | 1 | inquire | immediately | |
| 86701 | Advantest | T5383 | TEST SYSTEM | TEST | 31.12.2005 | 1 | as is where is | immediately |
| 87652 | Advantest | T5371 | Test system (With a single test head ) | Test | 1 | as is where is | immediately | |
| 88386 | Advantest | T5365P (some boards are missing) | Automated Test Equipment | TEST | 1 | inquire | ||
| 88387 | Advantest | T5375 mother boards | Mother boards | TEST | 1 | inquire | ||
| 88388 | Advantest | T5377 mother boards | Mother boards | TEST | 1 | inquire | ||
| 88389 | Advantest | T5581 | Automated Test Equipment | TEST | 1 | as is where is | immediately | |
| 88390 | Advantest | T5581 mother boards | Mother boards | TEST | 1 | inquire | ||
| 88391 | Advantest | T5585 with M6300 | Automated Test Equipment | TEST | 1 | inquire | ||
| 88392 | Advantest | T5585 with M6541AD. | Automated Test Equipment | TEST | 1 | inquire | ||
| 88393 | Advantest | T5592 with M6541AD. | Automated Test Equipment | TEST | 1 | inquire | ||
| 88395 | Advantest | T5593 with M6542AD | Automated Test Equipment | TEST | 1 | inquire | immediately | |
| 88744 | ADVANTEST | T5585 | Memory TESTER | 31.05.2000 | 1 | inquire | ||
| 88746 | ADVANTEST | T5371 | Memory TESTER | 1 | inquire | |||
| 88748 | ADVANTEST | T5581H | Memory TESTER | 31.05.2002 | 1 | inquire | ||
| 89909 | Advantest | Hifix for PQFP80 (14 x 20) | Hi-fix for Advantest T5371 package type PQFP80 (14 x 20) | Spares | 31.05.2005 | 1 | as is where is | immediately |
| 91643 | ADVANTEST | T3326A | Memory Tester | TEST | 1 | as is where is | ||
| 91644 | ADVANTEST | T5362 | Memory Tester | TEST | 1 | as is where is | ||
| 91645 | ADVANTEST | T5371 | Memory Tester | TEST | 1 | as is where is | ||
| 91646 | ADVANTEST | T5371 | Memory Tester | TEST | 31.05.2000 | 1 | as is where is | |
| 91647 | ADVANTEST | T5371 | Memory Tester | TEST | 31.05.2000 | 1 | as is where is | |
| 91648 | ADVANTEST | T5371 | Memory Tester | TEST | 31.05.2000 | 1 | as is where is | |
| 91649 | ADVANTEST | T5592 | Memory Tester | TEST | 31.05.2002 | 1 | as is where is | |
| 91650 | ADVANTEST | T5592 | Memory Tester | TEST | 1 | as is where is | ||
| 91651 | ADVANTEST | T5592 | Memory Tester | TEST | 1 | as is where is | ||
| 91652 | ADVANTEST | T7332 | Tester | TEST | 1 | as is where is | ||
| 91653 | ADVANTEST | T7332 | Tester | TEST | 1 | as is where is | ||
| 91654 | ADVANTEST | T7332 | Tester | TEST | 1 | as is where is | ||
| 92448 | Advantest | T5593 ( single head ) | Automated Test System | 1 | inquire | |||
| 92449 | Advantest | T5501 | Automated Test System | 1 | inquire | |||
| 92450 | Advantest | T5383 | Automated Test System | 1 | inquire | |||
| 92451 | Advantest | T5335 | Automated Test System | test | 1 | inquire | immediately | |
| 92452 | Advantest | T5371 | Automated Test System | 1 | inquire | |||
| 92453 | Advantest | T5581H | Automated Test System | 2 | as is where is | immediately | ||
| 92454 | Advantest | T5585 | Automated Test System | 1 | inquire | |||
| 92455 | Advantest | T5592 with M6541AD. | Automated Test System | 1 | inquire | |||
| 92456 | Advantest | T5593 ( afm board ) PARTS | Automated Test System (Parts) | 1 | inquire | |||
| 92458 | Advantest | T5585 with M6541AD. | Automated Test System | 1 | inquire | |||
| 92464 | Advantest | T5581 mother boards. | Test System (Parts) | 1 | inquire | |||
| 92465 | Advantest | T5377 mother boards. | Test System (Parts) | 1 | inquire | |||
| 92466 | Advantest | T5375 mother boards. | Test System (Parts) | 1 | inquire | |||
| 94024 | ADVANTEST | T5371 | Test System | Test | 31.05.2000 | 1 | as is where is | immediately |
| 94433 | ADVANTEST | T7332 | Tester | 1 | as is where is | |||
| 94489 | Advantest | T5371 | Automated Test Equipment | TEST | 56 | as is where is | ||
| 94490 | Advantest | T5375 | Automated Test Equipment | TEST | 2 | as is where is | immediately | |
| 94491 | Advantest | T5581P | Automated Test Equipment | TEST | 5 | as is where is | ||
| 94492 | Advantest | T5581H | Automated Test Equipment | TEST | 32 | as is where is | ||
| 94493 | Advantest | T5585 | Automated Test Equipment | TEST | 5 | as is where is | ||
| 96684 | ADVANTEST | T5581H | Memory TESTER | TEST | 31.05.2002 | 1 | inquire | |
| 96685 | ADVANTEST | T5581H | Memory TESTER | TEST | 1 | inquire | ||
| 98221 | ADVANTEST | T5585 | Tester | TEST | 0 | inquire | ||
| 99379 | ADVANTEST | T5375 | Automated Test Equipment | TEST | 1 | as is where is | immediately | |
| 99380 | ADVANTEST | T5771ES | Automated Test Equipment | TEST | 1 | as is where is | immediately | |
| 99843 | ADVANTEST | T5588 | Single Head Tester | TEST | 2 | as is where is | immediately | |
| 100662 | Advantest | T5592 | Memory Tester | TEST | 2 | as is where is | ||
| 100668 | Advantest | V3300 | Memory Tester | TEST | 1 | as is where is | ||
| 102062 | Advantest | 83000 | Electrical test | 31.05.2000 | 1 | as is where is | ||
| 102063 | Advantest | 83000 | Electrical test | 31.05.2000 | 1 | as is where is | ||
| 102064 | Advantest | 83000 | Electrical test | 31.05.2000 | 1 | as is where is | ||
| 102065 | Advantest | 83000 | Tester | 31.05.2000 | 1 | as is where is | ||
| 102066 | Advantest | 83000 | Tester | 1 | as is where is | |||
| 102067 | Advantest | 83000 | Tester | 1 | as is where is | |||
| 102068 | Advantest | M6300 | AUTO HANDLER | 1 | as is where is | |||
| 102506 | ADVANTEST | T5375-0040 | Tester | 1 | as is where is | immediately | ||
| 102565 | Advantest | T5581D | Tester | TEST | 3 | inquire | ||
| 102566 | Advantest | T6573 | Tester | TEST | 2 | inquire | ||
| 102945 | ADVANTEST | HP83000 | TESTER | TEST | 31.01.2012 | 1 | as is where is | |
| 102946 | ADVANTEST | M6542AD | TEST HANDLER | TEST | 31.08.2005 | 1 | as is where is | |
| 103710 | ADVANTEST | T5585 | Tester | Test | 31.05.2001 | 1 | as is where is | |
| 103711 | ADVANTEST | T5593 | Tester | Test | 31.05.2003 | 9 | as is where is | |
| 103712 | ADVANTEST | T5592 | Tester | Test | 31.05.2000 | 1 | as is where is | |
| 103713 | ADVANTEST | T5592 | Tester | Test | 31.05.2003 | 1 | as is where is | |
| 103714 | ADVANTEST | T5592 | Tester | Test | 31.05.2003 | 1 | as is where is | |
| 103738 | ADVANTEST | T5781ES | Tester | 31.05.1996 | 3 | as is where is | immediately | |
| 103812 | Advantest | T5335P | Automated Test System | test | 1 | inquire | immediately | |
| 103813 | Advantest | T5588 | Automated Test System | Test | 30.09.2007 | 1 | inquire | immediately |
| 105796 | Advantest | T5771 | Flash Memory Testing System | 300 mm | 1 | as is where is | ||
| 103681 | Advantest / アドバンテスト | T5371 | Tester | TEST | 31.05.2001 | 1 | as is where is | |
| 100994 | Advantest Nextest Verigy | Various | Mini-Batch of Automated Test Equipment | TEST | 12 | as is where is | immediately | |
| 64251 | Agilent | 16702A | LOGIC ANALISYS SYSYEM | TEST | 1 | as is where is | immediately | |
| 98062 | Agilent | 4073B | Parametric Tester | TEST | 31.05.2005 | 1 | as is where is | |
| 98219 | Agilent | HP 83000 | Tester (Parts Machine) | TEST | 0 | inquire | ||
| 98220 | Agilent | 93000 | Tester (Parts Machine) | TEST | 0 | inquire | ||
| 102509 | Agilent | HP4073A | Parametric TESTER | TEST | 31.05.2000 | 1 | inquire | |
| 79840 | Agilent / HP | 83000 F330T | test system | test | 1 | as is where is | immediately | |
| 98546 | Agilent / HP / Verigy | 4071A | Parametric Tester | Test | 1 | as is where is | immediately | |
| 98704 | Agilent / HP / Verigy | 4071A | Parametric Tester | Test | 1 | as is where is | immediately | |
| 92444 | Agilent / Keysight | HP4062C | Automated Test System | 1 | inquire | |||
| 92445 | Agilent / Keysight | HP4072A with P12XL | Automated Test System | 1 | inquire | |||
| 92446 | Agilent / Keysight | HP4072A with P8LC | Automated Test System | 1 | inquire | |||
| 88679 | Agilent / Verigy | 4073A | PARAMETRIC TEST SYSTEM | TEST | 31.05.2001 | 1 | as is where is | |
| 88680 | Agilent / Verigy | 4073B | PARAMETRIC TEST SYSTEM | TEST | 31.05.2011 | 1 | as is where is | immediately |
| 99082 | Agilent / Verigy | 41000 | Parametric Tester | 1 | as is where is | |||
| 87651 | Agilent / Verigy / Keysight | V6000e | Test system | Test | 31.05.2008 | 1 | as is where is | immediately |
| 100030 | Agilent/Verigy | HP83000 | Tester | Test | 31.01.2012 | 1 | as is where is | |
| 101378 | Applied Materials | P5000 | Sputter Etch Mark II Chamber | 200 mm | 1 | as is where is | immediately | |
| 76996 | ASM | SLS 230 | LED SORTER | 01.05.2011 | 1 | |||
| 56897 | Credence | ASL 1000 | Tester | TEST | 30.04.2003 | 2 | as is all rebuilt | immediately |
| 78638 | Credence | Duo SX (Spare Parts) | SPARE PARTS FROM AUTOMATED TEST SYSTEM | test | 1 | as is where is | immediately | |
| 81920 | CREDENCE | ASL3000 | Tester | 1 | as is where is | immediately | ||
| 83978 | Credence | Kalos Hex | Automated test system | 200 mm | 1 | as is where is | immediately | |
| 83979 | Credence | Kalos Hex | Automated test system | 200 mm | 1 | as is where is | immediately | |
| 83980 | Credence | Quartet | Automated test system | 200 MM | 1 | as is where is | immediately | |
| 87089 | Credence | Personal Kalos I | Test system | TEST | 31.10.2002 | 1 | as is where is | immediately |
| 88732 | Credence | Kalos XW | Memory TESTER | TEST | 31.05.2004 | 1 | inquire | immediately |
| 92460 | Credence | ASL 1000 | Automated Test System | 1 | inquire | |||
| 93885 | Credence | ASL1000 | test system | TEST | 1 | as is where is | immediately | |
| 95558 | Credence | Sapphire | Automated Test System | Test | 1 | as is where is | immediately | |
| 96697 | Credence | Kalos Hex | Memory TESTER | TEST | 31.05.2003 | 1 | inquire | immediately |
| 96698 | Credence | Kalos XW | Memory TESTER | TEST | 31.05.2004 | 1 | inquire | |
| 96699 | Credence | Kalos XW | Memory TESTER | TEST | 31.05.2004 | 1 | inquire | |
| 96700 | Credence | Kalos XW | Memory TESTER | TEST | 31.05.2004 | 1 | inquire | |
| 96701 | Credence | Kalos XW | Memory TESTER | TEST | 31.05.2004 | 1 | inquire | |
| 96702 | Credence | Kalos XW | Memory TESTER | TEST | 31.05.2004 | 1 | inquire | |
| 96703 | Credence | Kalos XW | Memory TESTER | TEST | 31.05.2004 | 1 | inquire | |
| 96704 | Credence | Kalos XW | Memory TESTER | TEST | 31.05.2004 | 1 | inquire | |
| 96705 | Credence | Kalos XW | Memory TESTER | TEST | 31.05.2004 | 1 | inquire | |
| 98224 | Credence | Quartet One Plus | Tester | TEST | 28.02.2002 | 1 | inquire | immediately |
| 98507 | Credence | Trillium Deltamaster | TESTER, 256 pin, 2 Meg DPMY, | 200 mm | 1 | as is where is | ||
| 88822 | Credence / Epro | 142 AX | Memory Test system | test | 2 | as is where is | immediately | |
| 101695 | DAGE | MF-22U | Microtester | 1 | inquire | immediately | ||
| 95380 | Eagle Test Systems | ETS-546 | Tester | 31.01.1999 | 1 | as is where is | ||
| 95381 | Eagle Test Systems | ETS-546 | Tester | 30.06.2000 | 1 | as is where is | ||
| 95382 | Eagle Test Systems | ETS-546 | Tester | 31.05.1999 | 1 | as is where is | ||
| 102567 | EXICON | S3000A | Memory Tester | TEST | 1 | inquire | ||
| 86680 | IMS | XTS 60E / 256 | Automated Test System | TEST | 1 | as is where is | immediately | |
| 86677 | InTest | Test Head | CPIT TEP8 / STFLASH EPROM / 1792 Test Head | Spares | 31.05.2007 | 1 | as is where is | immediately |
| 103185 | ISMECA | NX16L | Bulk To Tape Taper | ASSEMBLY | 31.05.2010 | 1 | as is where is | |
| 97892 | ITOS | ITOS-750AM | ATE | TEST | 1 | inquire | ||
| 97934 | KEITHLEY | 2700 | MULTIMETER | TEST | 1 | inquire | ||
| 97864 | KeyTek | RCDM | CDM TEST SYSTEM | 1 | as is where is | |||
| 55860 | MOSAID | MS4155 | Memory Test System | TEST | 1 | as is where is | immediately | |
| 100039 | MOSAID | 4205 | BIT MAP TESTER | 1 | as is where is | |||
| 102298 | Mosaid | MS4205 | Memory Test Systems | TEST | 1 | as is where is | ||
| 105812 | Mosaid | 4205 | Manual Memory Tester | 300 mm | 1 | as is where is | ||
| 105813 | Mosaid | 9920 | Manual Memory Tester | 300 mm | 1 | as is where is | ||
| 105814 | Mosaid | 4205 Memory Tester | Manual Memory Tester | 300 mm | 1 | as is where is | ||
| 105815 | Mosaid | 4205 Memory Tester | Manual Memory Tester | 300 mm | 1 | as is where is | ||
| 105816 | Mosaid | 4205 Memory Tester | Manual Memory Tester | 300 mm | 1 | as is where is | ||
| 84205 | Nextest | Maverick 2 PT | Bitmap tester | Test | 31.05.2005 | 2 | as is where is | immediately |
| 96011 | NEXTEST | Maverick-II PT | Bitmap Tester | TEST | 31.05.2003 | 1 | as is where is | |
| 99382 | NEXTEST | MAVERICK PT II | Automated Test Equipment | TEST | 1 | as is where is | immediately | |
| 99383 | NEXTEST | MAVERICK PT II | Automated Test Equipment | TEST | 1 | as is where is | immediately | |
| 99384 | NEXTEST | MAVERICK PT II | Automated Test Equipment | TEST | 1 | as is where is | immediately | |
| 99385 | NEXTEST | MAVERICK PT II | Automated Test Equipment | TEST | 1 | as is where is | immediately | |
| 99386 | NEXTEST | MAVERICK PT I | Automated Test Equipment | TEST | 1 | as is where is | immediately | |
| 101002 | NexTest | Maverick 2 GT, base | Tester | 1 | as is where is | |||
| 99381 | NexTest / Teradyne | MAGNUM I EV | Automated Test Equipment | TEST | 1 | as is where is | immediately | |
| 103389 | Nextest Maverick | Magnum 2x PV-SCM | Automated Memory Test Equipment | 31.01.2011 | 1 | as is where is | immediately | |
| 99271 | Spea | 4040 | Flying Probe | SMT / Test | 31.05.2006 | 1 | as is where is | immediately |
| 100348 | Spea | C430MX ATOP | Dual Site Tester System | TEST | 31.05.2014 | 11 | as is where is | immediately |
| 103178 | SPEA | C320MX | Semiconductor Tester | 31.05.2000 | 1 | inquire | ||
| 79829 | SRM | STV 242 | Test handler | test | 01.06.2000 | 4 | as is where is | immediately |
| 71904 | ST Automation | test head | test head for Eprom U 1835 | 1 | as is where is | |||
| 71908 | ST Automation | PTM1 | Flash Memory Tester | Test | 3 | as is where is | immediately | |
| 71910 | ST Automation | MT32SX | Flash Memory Test System for 256 MB memory testing | TEST | 31.05.2008 | 1 | as is where is | immediately |
| 78133 | ST Automation | QT200 | Test System | test | 31.05.2007 | 1 | as is where is | immediately |
| 78137 | ST Automation | QT200 | Tester System with monitor | test | 1 | as is where is | immediately | |
| 78138 | ST Automation | R.S.V. | ST Memory Test System Electronic Automation | test | 31.03.2007 | 1 | as is where is | immediately |
| 80177 | ST Automation | QT200 | Automated Tester System with monitor | test | 01.10.2007 | 1 | as is where is | immediately |
| 80178 | ST Automation | QT200 | Automated Tester System with monitor | test | 01.10.2007 | 1 | as is where is | immediately |
| 80179 | ST Automation | QT200 | Automated Tester System with monitor | test | 01.10.2007 | 1 | as is where is | immediately |
| 80180 | ST Automation | QT200 | Automated Tester System with monitor | test | 01.10.2007 | 1 | as is where is | immediately |
| 80181 | ST Automation | QT200 | Automated Tester System with monitor | test | 01.10.2007 | 1 | as is where is | immediately |
| 80182 | ST Automation | QT200 | Automated Tester System with monitor | test | 01.10.2007 | 1 | as is where is | immediately |
| 80183 | ST Automation | QT200 | Automated Tester System with monitor | test | 01.10.2007 | 1 | as is where is | immediately |
| 80184 | ST Automation | QT EPR16 DD | Automated Flash Memory Tester System with monitor | TEST | 30.09.2007 | 1 | as is where is | immediately |
| 86279 | ST Automation | MT32SX | Flash Memory testing System | TEST | 30.06.2005 | 1 | as is where is | immediately |
| 86280 | ST Automation | PT-M1 | Automated Test System | Test | 1 | as is where is | immediately | |
| 86670 | ST Automation | QT200 | Automated Test System | TEST | 31.05.2005 | 1 | as is where is | immediately |
| 93822 | ST Automation | EPR88 | Automated Test System | TEST | 31.05.2005 | 1 | as is where is | immediately |
| 93865 | ST Automation | QT 200 epr 88 | Flash Memory Testing System | Test | 31.05.2005 | 1 | as is where is | immediately |
| 95233 | ST Automation | MT 32 SX | Fully Automated Memory Test System for BIST and NAND Memories | TEST | 30.11.2005 | 1 | inquire | immediately |
| 99969 | ST Automation | QT200 | Automated Tester System with monitor | test | 31.05.2005 | 1 | as is where is | immediately |
| 101848 | ST Automation | MT32SX | Automated Flash Memory Testing System | test | 31.05.2007 | 1 | as is where is | immediately |
| 102494 | ST Automation | MT32SX | Automated Flash Memory Testing System FOR TESTING 256 MB MEMORY | TEST | 30.09.2007 | 1 | as is where is | immediately |
| 84022 | Sun | Ultrasparc 60 | Unix computer from Teradyne J994 | Test | 31.12.1996 | 1 | as is where is | immediately |
| 84023 | Sun | Ultrasparc 60 (Hard Disk Drive) | Hard Disk from Unix computer from Teradyne J994 | Test | 01.01.1997 | 1 | as is where is | immediately |
| 33413 | SYNAX | SX3100 | Handler Ambient/Hot | test | 31.05.2006 | 1 | as is where is | immediately |
| 33414 | SYNAX | SX3100 | Fully Automated test Handler | test | 01.05.2006 | 1 | as is where is | immediately |
| 78136 | Sytrama | MTM 32 V01 | ST Test Head Manipulator QT 124 | 30.11.2005 | 1 | as is where is | immediately | |
| 80089 | Sytrama | MTM 32 V01 | ST Test Head Manipulator QT 124 | 30.11.2005 | 1 | as is where is | immediately | |
| 54232 | Teradyne | J994 | Memory Tester | test | 31.05.2000 | 1 | as is where is | immediately |
| 78361 | Teradyne | J971SP (Spares) | Boards from VLSI test system | Test | 31.01.1997 | 1 | as is where is | immediately |
| 82231 | Teradyne | 961-061-00 | Teradyne J971 Power Supply | 01.07.1997 | 1 | as is where is | immediately | |
| 82232 | Teradyne | 961-128-00 | Teradyne J971 Power Supply | 01.07.1997 | 1 | as is where is | immediately | |
| 83983 | Teradyne | A580 | Automated test system | 200 mm | 1 | as is where is | immediately | |
| 88688 | Teradyne | UltraFLEX | Automated Test System | TEST | 31.05.2011 | 1 | as is where is | immediately |
| 90355 | Teradyne | iFlex | Test Systems | Test | 31.07.2017 | 5 | as is where is | immediately |
| 91993 | TERADYNE | J973 | Automatic Test System | TEST | 31.05.2002 | 9 | as is where is | immediately |
| 94422 | Teradyne | J971 | TEST SYSTEM | TEST | 31.05.1997 | 1 | as is where is | immediately |
| 95443 | TERADYNE | Various | Various Items of test equipment | Test | 31 | as is where is | immediately | |
| 98222 | Teradyne | J750 (Parts) | Test head from a Tester(512CH) | TEST | 0 | inquire | immediately | |
| 98509 | Teradyne | A585 | Automated test system, 184 pin, 20MHz | 200 mm | 1 | as is where is | ||
| 98527 | Teradyne | A585 | Automated test system, 184 pin, 20MHz | 200 mm | 1 | as is where is | ||
| 100896 | TERADYNE | Neptune 635-850-00 | Validation Tester | TEST | 31.08.2015 | 1 | as is where is | immediately |
| 100897 | TERADYNE | Neptune 635-850-10 | Validation Tester | TEST | 31.10.2015 | 1 | as is where is | immediately |
| 100901 | TERADYNE | J750E-100 | Test System | Test | 31.05.2004 | 1 | inquire | immediately |
| 102440 | Teradyne | IP750 | Tester | TEST | 31.05.2000 | 1 | as is where is | |
| 102441 | Teradyne | IP750 | Tester | TEST | 31.05.2000 | 1 | as is where is | |
| 102442 | Teradyne | IP750 | Tester | TEST | 31.05.2000 | 1 | as is where is | |
| 102443 | Teradyne | IP750 | Tester | TEST | 31.05.2000 | 1 | as is where is | |
| 102444 | Teradyne | IP750 | Tester | TEST | 31.05.2000 | 1 | as is where is | |
| 102446 | Teradyne | IP750EP | Tester | TEST | 31.05.2002 | 1 | as is where is | |
| 102447 | Teradyne | IP750EX | Tester | TEST | 31.05.2001 | 1 | as is where is | |
| 102448 | Teradyne | IP750EX | Tester | TEST | 31.05.2001 | 1 | as is where is | |
| 102449 | Teradyne | IP750S | Tester | TEST | 1 | as is where is | ||
| 102452 | Teradyne | Magnum 2x GVLC | Electrical Testing | TEST | 1 | as is where is | ||
| 102530 | TERADYNE | J750 | Test System | TEST | 2 | inquire | ||
| 103715 | Teradyne | MicroFlex | TEST SYSTEM | TEST | 31.05.2006 | 1 | as is where is | immediately |
| 103716 | Teradyne | MicroFlex | TEST SYSTEM | TEST | 31.05.2007 | 1 | as is where is | immediately |
| 103717 | Teradyne | MicroFlex | TEST SYSTEM | TEST | 31.05.2008 | 1 | as is where is | immediately |
| 103718 | Teradyne | MicroFlex | TEST SYSTEM | TEST | 31.05.2009 | 1 | as is where is | immediately |
| 103719 | Teradyne | MicroFlex | TEST SYSTEM | TEST | 31.05.2010 | 1 | as is where is | immediately |
| 103720 | Teradyne | MicroFlex | TEST SYSTEM | TEST | 31.05.2010 | 1 | as is where is | immediately |
| 103721 | Teradyne | MicroFlex | TEST SYSTEM | TEST | 31.05.2011 | 1 | as is where is | immediately |
| 103722 | Teradyne | MicroFlex | TEST SYSTEM | TEST | 31.05.2010 | 1 | as is where is | immediately |
| 74064 | Tesec | 8212-TS | SOA Tester | 1 | as is where is | |||
| 74066 | Tesec | 8714 | Handler 8714 (from bowl to 1 from 8 tube sorter) | 1 | as is where is | |||
| 96088 | Verigy | V4000 | Engineering Tester | TEST | 2 | as is where is | ||
| 98204 | Verigy | 93000 C200E | Tester | TEST | 31.05.2001 | 1 | as is where is | |
| 99388 | VERIGY | V4000 | Automated Test Equipment | TEST | 1 | as is where is | immediately | |
| 99389 | VERIGY | V4000 | Automated Test Equipment | TEST | 1 | as is where is | immediately | |
| 99390 | VERIGY | V4000 | Automated Test Equipment | TEST | 1 | as is where is | immediately | |
| 99391 | VERIGY | V6000 | Automated Test Equipment | TEST | 1 | as is where is | immediately | |
| 95431 | Verigy / Agilent | HP4082F | Flash Memory Cell Parametric Testing System | Test | 1 | as is where is | immediately | |
| 103809 | Verigy / Agilent | 4062C | Test System | test | 1 | as is where is | immediately | |
| 92461 | Yokogawa | TS670 | Automated Test System | 1 | inquire | |||
| 92462 | Yokogawa | TS100 | Automated Test System | 11 | inquire | |||
| 92463 | Yokogawa | TS1000 | Automated Test System | 1 | inquire | |||
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