Please find below a list of Used Test (ATE) Automatic Test Equipment for sale by fabsurplus.com .Click on any listed item of Test (ATE) Automatic Test Equipment to see further data.
| SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time |
|---|---|---|---|---|---|---|---|---|
| 54226 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 7 | as is where is | immediately |
| 95398 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 1 | as is where is | immediately |
| 95399 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 1 | as is where is | immediately |
| 95400 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 1 | as is where is | immediately |
| 95401 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 1 | as is where is | immediately |
| 95402 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 1 | as is where is | immediately |
| 95403 | Accretech TSK | MHF300L | Test head manipulators | 200 mm | 31.05.1999 | 1 | as is where is | immediately |
| 78639 | Advantest | T5335P (Spares) | Spare Boards from test system (See attached list for details) | TEST | 01.11.1997 | 1 | as is where is | immediately |
| 87652 | Advantest | T5371 | Test system (With a single test head ) | Test | 1 | as is where is | immediately | |
| 89909 | Advantest | Hifix for PQFP80 (14 x 20) | Hi-fix for Advantest T5371 package type PQFP80 (14 x 20) | Spares | 31.05.2005 | 1 | as is where is | immediately |
| 94490 | Advantest | T5375 | Automated Test Equipment | TEST | 2 | as is where is | immediately | |
| 99379 | ADVANTEST | T5375 | High-Speed Flash Memory tester | TEST | 1 | as is where is | immediately | |
| 99380 | ADVANTEST | T5771ES | Automated Test Equipment for laboratory or office use | TEST | 1 | as is where is | immediately | |
| 99388 | Advantest | Versatest V4000 | Automated Test Equipment for laboratory or office use | TEST | 01.06.2006 | 1 | as is where is | immediately |
| 99389 | Advantest | V4000 | Automated Test Equipment | TEST | 1 | as is where is | immediately | |
| 99390 | Advantest | V4000 | Automated Test Equipment | TEST | 1 | as is where is | immediately | |
| 100668 | Advantest | V3300 | Memory Tester | TEST | 1 | as is where is | ||
| 103812 | Advantest | T5335P | Automated Test System | test | 1 | as is where is | immediately | |
| 106570 | ADVANTEST | T5371 | Memory Tester | TEST | 01.06.2000 | 1 | as is where is | |
| 106571 | ADVANTEST | T5371 | Memory Tester | TEST | 01.06.2000 | 1 | as is where is | |
| 106572 | ADVANTEST | T5585 | Memory Tester | TEST | 01.06.2001 | 1 | as is where is | |
| 106573 | ADVANTEST | T5585 | Memory Tester | TEST | 1 | as is where is | ||
| 108048 | Advantest | T5371 | Automated test equipment | TEST | 5 | as is where is | ||
| 108050 | Advantest | T5585 | Automated test equipment | TEST | 1 | as is where is | ||
| 108057 | Advantest | T5381ES | ATE Tester | TEST | 3 | as is where is | ||
| 108058 | Advantest | T5585 | ATE Tester | TEST | 1 | as is where is | ||
| 108242 | Advantest | T5371 | AUTOMATED TEST EQUIPMENT | TEST | 01.06.2001 | 1 | as is where is | |
| 108243 | Advantest | T5376 | AUTOMATED TEST EQUIPMENT | TEST | 01.06.2004 | 1 | as is where is | |
| 108244 | Advantest | T5376 | AUTOMATED TEST EQUIPMENT | TEST | 01.06.2004 | 1 | as is where is | |
| 108245 | Advantest | T5376 | AUTOMATED TEST EQUIPMENT | TEST | 01.06.2004 | 1 | as is where is | |
| 108246 | Advantest | T5376 | AUTOMATED TEST EQUIPMENT | TEST | 01.06.2004 | 1 | as is where is | |
| 108247 | Advantest | T5376 | AUTOMATED TEST EQUIPMENT | TEST | 01.06.2003 | 1 | as is where is | |
| 108248 | Advantest | T5376 | AUTOMATED TEST EQUIPMENT | TEST | 01.06.2002 | 1 | as is where is | |
| 108249 | Advantest | T5376 | AUTOMATED TEST EQUIPMENT | TEST | 01.06.2001 | 1 | as is where is | |
| 108250 | Advantest | T5376 | AUTOMATED TEST EQUIPMENT | TEST | 01.06.2003 | 1 | as is where is | |
| 108549 | ADVANTEST | T5382A1 | Test System | TEST | 1 | as is where is | immediately | |
| 108550 | ADVANTEST | T5585 | Test System | 200 mm | 1 | as is where is | immediately | |
| 109022 | Advantest | Versatest V6000 | Test Engineering Workstation for Office or Laboratory Use | Test | 01.05.2008 | 1 | as is where is | immediately |
| 109120 | Advantest | V5000 | Automated Test equipment | TEST | 01.06.2010 | 11 | as is where is | immediately |
| 109131 | Advantest | T5585 | Memory Tester | TEST | 1 | as is where is | ||
| 109132 | Advantest | T5585 | Memory Tester | TEST | 1 | as is where is | ||
| 109538 | ADVANTEST | 93000 PS1600 | Automated Test Equipment for SOC testing | TEST | 01.02.2020 | 1 | as is where is | immediately |
| 109575 | ADVANTEST | T5377 | Automated test Equipment | Test | 01.06.2010 | 6 | as is where is | immediately |
| 109576 | ADVANTEST | T5593 | Automated test Equipment | Test | 01.06.2004 | 1 | as is where is | immediately |
| 109577 | ADVANTEST | T5585 | Automated test Equipment | Test | 01.06.2001 | 1 | as is where is | immediately |
| 108555 | Agilent | 16702A | LOGIC ANALISYS SYSYEM | TEST | 1 | as is where is | immediately | |
| 108897 | Agilent / Verigy | 4073B | PARAMETRIC TEST SYSTEM | TEST | 01.05.2011 | 1 | as is where is | immediately |
| 108899 | Agilent / Verigy | 4073A | PARAMETRIC TEST SYSTEM | TEST | 01.05.2001 | 1 | as is where is | |
| 87089 | Credence | Personal Kalos I | Test system | TEST | 31.10.2002 | 1 | as is where is | immediately |
| 110616 | HP / Agilent | 4062 | Automated Test equipment | TEST | 1 | as is where is | immediately | |
| 86677 | InTest | Test Head | CPIT TEP8 / STFLASH EPROM / 1792 Test Head | Spares | 31.05.2007 | 1 | as is where is | immediately |
| 108970 | IsMeca | NX16 | TEST SYSTEM | TEST | 01.06.2011 | 1 | as is where is | immediately |
| 109189 | Keysight / Agilent / Hewlett-Packard (HP) | 4073A | Parametric Tester | TEST | 1 | as is where is | ||
| 109190 | Keysight / Agilent / Hewlett-Packard (HP) | 4073B | Parametric Tester | TEST | 1 | as is where is | ||
| 108028 | MOSAID | M4205 | Memory Tester | TEST | 1 | as is where is | immediately | |
| 108767 | MOSAID | MS4155 | Memory Test System | TEST | 1 | as is where is | immediately | |
| 108031 | NEXTEST | MAGNUM II EV ICP | Memory Tester | TEST | 01.11.2011 | 1 | as is where is | |
| 99382 | NexTest / Teradyne | MAVERICK PT II | Automated Test Equipment | TEST | 1 | as is where is | immediately | |
| 99383 | NexTest / Teradyne | MAVERICK PT II | Automated Test Equipment | TEST | 1 | as is where is | immediately | |
| 109045 | NexTest / Teradyne | Maverick-II PT | Bitmap Tester | TEST | 01.05.2003 | 1 | as is where is | immediately |
| 109046 | NexTest / Teradyne | Maverick-II PT | Bitmap Tester | TEST | 01.05.2004 | 1 | as is where is | immediately |
| 108030 | Nextest Systems Corporation | MAGNUM ICP 1280 | Memory Tester | TEST | 01.05.2010 | 1 | as is where is | immediately |
| 108032 | Nextest Systems Corporation | MAGNUM II ICP 1280 | Memory Tester | TEST | 01.04.2010 | 1 | as is where is | immediately |
| 108054 | Shibasoku | S230 | Automated test equipment | TEST | 1 | as is where is | ||
| 71904 | ST Automation | test head | test head for Eprom U 1835 | 1 | as is where is | |||
| 71908 | ST Automation | PTM1 | Flash Memory Tester | Test | 3 | as is where is | immediately | |
| 71910 | ST Automation | MT32SX | Flash Memory Test System for 256 MB memory testing | TEST | 31.05.2008 | 1 | as is where is | immediately |
| 78133 | ST Automation | QT200 | Test System | test | 31.05.2007 | 1 | as is where is | immediately |
| 78137 | ST Automation | QT200 | Tester System with monitor | test | 1 | as is where is | immediately | |
| 78138 | ST Automation | R.S.V. | ST Memory Test System Electronic Automation | test | 31.03.2007 | 1 | as is where is | immediately |
| 80177 | ST Automation | QT200 | Automated Tester System with monitor | test | 01.10.2007 | 1 | as is where is | immediately |
| 80178 | ST Automation | QT200 | Automated Tester System with monitor | test | 01.10.2007 | 1 | as is where is | immediately |
| 80179 | ST Automation | QT200 | Automated Tester System with monitor | test | 01.10.2007 | 1 | as is where is | immediately |
| 80180 | ST Automation | QT200 | Automated Tester System with monitor | test | 01.10.2007 | 1 | as is where is | immediately |
| 80181 | ST Automation | QT200 | Automated Tester System with monitor | test | 01.10.2007 | 1 | as is where is | immediately |
| 80182 | ST Automation | QT200 | Automated Tester System with monitor | test | 01.10.2007 | 1 | as is where is | immediately |
| 80183 | ST Automation | QT200 | Automated Tester System with monitor | test | 01.10.2007 | 1 | as is where is | immediately |
| 80184 | ST Automation | QT EPR16 DD | Automated Flash Memory Tester System with monitor | TEST | 30.09.2007 | 1 | as is where is | immediately |
| 86279 | ST Automation | MT32SX | Flash Memory testing System | TEST | 30.06.2005 | 1 | as is where is | immediately |
| 86280 | ST Automation | PT-M1 | Automated Test System | Test | 1 | as is where is | immediately | |
| 86670 | ST Automation | QT200 | Automated Test System | TEST | 31.05.2005 | 1 | as is where is | immediately |
| 93822 | ST Automation | EPR88 | Automated Test System | TEST | 31.05.2005 | 1 | as is where is | immediately |
| 93865 | ST Automation | QT 200 epr 88 | Flash Memory Testing System | Test | 31.05.2005 | 1 | as is where is | immediately |
| 95233 | ST Automation | MT 32 SX | Fully Automated Memory Test System for BIST and NAND Memories | TEST | 30.11.2005 | 1 | inquire | immediately |
| 99969 | ST Automation | QT200 | Automated Tester System with monitor | test | 31.05.2005 | 1 | as is where is | immediately |
| 101848 | ST Automation | MT32SX | Automated Flash Memory Testing System | test | 31.05.2007 | 1 | as is where is | immediately |
| 102494 | ST Automation | MT32SX | Automated Flash Memory Testing System FOR TESTING 256 MB MEMORY | TEST | 30.09.2007 | 1 | as is where is | immediately |
| 84022 | Sun | Ultrasparc 60 | Unix computer from Teradyne J994 | Test | 31.12.1996 | 1 | as is where is | immediately |
| 84023 | Sun | Ultrasparc 60 (Hard Disk Drive) | Hard Disk from Unix computer from Teradyne J994 | Test | 01.01.1997 | 1 | as is where is | immediately |
| 33413 | SYNAX | SX3100 | Fully Automated test Handler, ambient and hot configured. | TEST | 01.05.2006 | 1 | as is all rebuilt | immediately |
| 33414 | SYNAX | SX3100 | Fully Automated test Handler, ambient and hot configured. | test | 01.05.2006 | 1 | as is all rebuilt | immediately |
| 78136 | Sytrama | MTM 32 V01 | ST Test Head Manipulator QT 124 | 30.11.2005 | 1 | as is where is | immediately | |
| 80089 | Sytrama | MTM 32 V01 | ST Test Head Manipulator QT 124 | 30.11.2005 | 1 | as is where is | immediately | |
| 54232 | Teradyne | J994 | Memory Tester | test | 01.05.2000 | 1 | as is where is | immediately |
| 82231 | Teradyne | 961-061-00 | Teradyne J971 Power Supply | 01.07.1997 | 1 | as is where is | immediately | |
| 82232 | Teradyne | 961-128-00 | Teradyne J971 Power Supply | 01.07.1997 | 1 | as is where is | immediately | |
| 106752 | TERADYNE | CATALYST | AUTOMATED TEST EQUIPMENT | 200 mm,300 mm | 01.06.1998 | 1 | as is where is | |
| 106753 | TERADYNE | CATALYST | AUTOMATED TEST EQUIPMENT | 200 mm,300 mm | 01.06.2000 | 1 | as is where is | |
| 106754 | TERADYNE | CATALYST | AUTOMATED TEST EQUIPMENT | 200 mm,300 mm | 1 | as is where is | ||
| 108213 | TERADYNE | CATALYST | EDS/ TEST | test | 1 | as is where is | ||
| 108301 | Teradyne | Catalyst | Mixed SIGNAL TEST SYSTEM | TEST | 01.06.2000 | 1 | as is where is | |
| 108607 | TERADYNE | IP750EX | AUTOMATED TEST EQUIPMENT For CMOS Image Sensor testing | TEST | 01.06.2012 | 1 | as is where is | immediately |
| 108912 | Teradyne | UltraFLEX | Automated Test System | TEST | 01.05.2011 | 1 | as is where is | immediately |
| 100692 | Yokogawa | ST6730A | Logic Tester | TEST | 2 | as is where is | ||
| 102577 | Yokogawa | TS670 | Tester | TEST | 3 | inquire | immediately | |
| 106757 | YOKOGAWA | TS6700 | LCD DRIVER TESTER | TEST | 01.06.2003 | 1 | as is where is | |
| 108056 | Yokogawa | AL6095 | Automated test equipment | TEST | 1 | as is where is |