Dear Customers,
This month we are featuring for sale the following items of semiconductor manufacturing equipment.
By clicking the links shown below, you will be able to see the details about each item of equipment via our website.
Applied Materials Centura DPS2 Advantedge Poly etcher, 4 CH , 300 mm, for sale @fabsurplus.com:-
https://www.fabsurplus.com/sdi_catalog/salesItemDetails.do?id=95926
Applied Materials Centura DPS2 Advantedge Poly etcher, 4 CH, 300 mm, for sale @fabsurplus.com:-
https://www.fabsurplus.com/sdi_catalog/salesItemDetails.do?id=95927
Applied Materials Centura Advantedge Carina Mesa, 2 CH, 300 mm, for sale @fabsurplus.com:-
https://www.fabsurplus.com/sdi_catalog/salesItemDetails.do?id=95928
Applied Materials Mirra Ontrak, Refurbished, 200 mm, for sale @fabsurplus.com:-
https://www.fabsurplus.com/sdi_catalog/salesItemDetails.do?id=96537
AKT / Applied Materials NAR 1200 Twin TFB G5 Vertical PVD system for sale @fabsurplus.com:-
https://www.fabsurplus.com/sdi_catalog/salesItemDetails.do?id=95632
AKT / Applied Materials G5 15K PECVD System for FPD amorphous Silicon for sale @fabsurplus.com:-
https://www.fabsurplus.com/sdi_catalog/salesItemDetails.do?id=95119
ASML XT1700Fi Immersion ArF scanner for sale @fabsurplus.com:-
https://www.fabsurplus.com/sdi_catalog/salesItemDetails.do?id=95949
ASM AD 830 Die Bonder for sale @fabsurplus.com:-
https://www.fabsurplus.com/sdi_catalog/salesItemDetails.do?id=95633
Canon MPA 600 Super Mask Aligner for sale @fabsurplus.com:-
https://www.fabsurplus.com/sdi_catalog/salesItemDetails.do?id=50438
FEI Helios Nanolab 450S Dual-Beam FIB-SEM, 300 mm, for sale @fabsurplus.com:-
https://www.fabsurplus.com/sdi_catalog/salesItemDetails.do?id=96385
Hitachi S9380ii CD-SEM, 300 mm, for sale @fabsurplus.com:-
https://www.fabsurplus.com/sdi_catalog/salesItemDetails.do?id=96377
KLA-Tencor AIT UV Darkfield Wafer Inspection System, 200 mm, for sale @fabsurplus.com:-
https://www.fabsurplus.com/sdi_catalog/salesItemDetails.do?id=76682
Karl Suss MA6 Mask Aligner for sale @fabsurplus.com:-
https://www.fabsurplus.com/sdi_catalog/salesItemDetails.do?id=96389
Neutronix / Quintel 7000 Mask Aligner, 150 mm, for sale @fabsurplus.com:-
https://www.fabsurplus.com/sdi_catalog/salesItemDetails.do?id=87509
Phoenix Nanomex 160 X-ray PCB inspection system for sale @fabsurplus.com:-
https://www.fabsurplus.com/sdi_catalog/salesItemDetails.do?id=86340
Rigaku MFM 65 Energy Dispersive X-ray Fluorescence Wafer Inspection System for sale @fabsurplus.com:-
https://www.fabsurplus.com/sdi_catalog/salesItemDetails.do?id=92691
Veeco K465i Turbodisc GaN MOCVD Reactors , 2-6 inch, for sale @fabsurplus.com:-
https://www.fabsurplus.com/sdi_catalog/salesItemDetails.do?id=93402
Veeco D9000 AFM , 200 mm, for sale @fabsurplus.com:-
https://www.fabsurplus.com/sdi_catalog/salesItemDetails.do?id=96383 Next, please find attached a short-notice bidding list of top-of-the-range 300 mm and 200 mm Semiconductor Wafer Fab Equipment.This equipment will be sold to the highest bidder via a process of closed bidding:-
96408 | ACCRETECH | SA2400 | METRO | 1 | 300mm | 01.12.2006 |
96409 | ACCRETECH | SA2500 | METRO | 1 | 300mm | 01.03.2008 |
96410 | ADVANTEST | T5371 | Memory Tester | 1 | 300mm | 01.06.2001 |
96411 | ADVANTEST | T5371 | Tester | 1 | 300mm | 01.04.2000 |
96412 | Applied Materials | DPS | Polysilicon Etch | 1 | 300mm | 01.05.2005 |
96413 | Applied Materials | DPS G5 | Polysilicon Etch | 1 | 300mm | 01.05.2005 |
96414 | Applied Materials | DPS G5 | Polysilicon Etch | 1 | 300mm | 01.06.2010 |
96415 | Applied Materials | DPS G5 | Polysilicon Etch | 1 | 300mm | 01.07.2006 |
96416 | Applied Materials | DPS G5 MESA | Polysilicon Etch | 1 | 300mm | 01.02.2013 |
96417 | Applied Materials | ENABLER E2 | Dielectric Etch Process | 1 | 300mm | 01.11.2009 |
96418 | Applied Materials | ENABLER E5 | Oxide Etcher | 1 | 300mm | 01.11.2010 |
96419 | Applied Materials | ENDURA2 | PVD Sputter | 1 | 300mm | 01.10.2010 |
96420 | Applied Materials | P5000 | Multi Chamber CVD and Etch System | 1 | 200mm | 01.10.1995 |
96421 | Applied Materials | PRODUCER SE | PECVD | 1 | 300mm | 01.08.2006 |
96422 | Applied Materials | PRODUCER SE | PECVD | 1 | 300mm | 01.08.2006 |
96423 | Applied Materials | PRODUCER SE | PECVD | 1 | 300mm | 01.07.2004 |
96424 | Applied Materials | PRODUCER GT | PECVD | 1 | 300mm | 01.01.2009 |
96425 | Applied Materials | RADIANCE | RTP System | 1 | 300mm | 01.05.2003 |
96426 | Applied Materials | RADIANCE | RTP System | 1 | 300mm | 01.05.2003 |
96427 | Applied Materials | ULTIMA X | HDP CVD Oxide Deposition | 1 | 300mm | 01.09.2005 |
96428 | Applied Materials | ULTIMA X | HDP CVD Oxide Deposition | 1 | 300mm | 01.08.2006 |
96429 | Applied Materials | ULTIMA X | HDP CVD Oxide Deposition | 1 | 300mm | 01.07.2004 |
96430 | Applied Materials | UVISION7 | Brightfield Inspection | 1 | 300mm | 01.09.2011 |
96431 | Applied Materials | P5000 | Multi Chamber CVD and Etch System | 1 | 200mm | 01.11.1995 |
96432 | ASM | MIR3000 | ALD Oxide | 1 | 300mm | 01.02.2013 |
96433 | ASM | MIR3000 | ALD Oxide | 1 | 300mm | 01.03.2011 |
96434 | ASM | MIR3000 | ALD Oxide | 1 | 300mm | 01.06.2013 |
96435 | ASM | MIR3000 | ALD Oxide | 1 | 300mm | 01.06.2013 |
96436 | ASML | AT850C | Twin Scan Lithography System | 1 | 300mm | 01.07.2004 |
96437 | ASML | AT850C | Twin Scan Lithography System | 1 | 300mm | 01.07.2004 |
96438 | ASML | AT850C | Twin Scan Lithography System | 1 | 300mm | 01.06.2003 |
96439 | AXCELIS | OPTIMA HD | Medium Current Implanter | 1 | 300mm | 01.07.2007 |
96440 | AXCELIS | PARADIGM XE | High Energy Implanter | 1 | 300mm | 01.03.2005 |
96441 | AXCELIS | PARADIGM XE | High Energy Implanter | 1 | 300mm | 01.09.2007 |
96442 | AXCELIS | PS3 | UV Cure | 1 | 300mm | 01.07.2004 |
96443 | BRUKER | JVX6200 | X-Ray Reflectometer | 1 | 300mm | 01.11.2010 |
96444 | CANON | 5500 IZ | I-Line Stepper | 1 | 200mm | 01.10.2003 |
96445 | CANON | ES6A | KrF Scanner | 1 | 300mm | 01.04.2007 |
96446 | DNS | 80B | Coater/Developer System | 1 | 200mm | 01.10.1995 |
96447 | EBARA | FREX200 | Oxide CMP System | 1 | 200mm | 01.07.2003 |
96448 | GENUS | LYNX3 | CVD | 1 | 300mm | 01.11.2012 |
96449 | GSI | INM300 | Laser Metrology System | 1 | 200mm | 01.03.2005 |
96450 | HIKE | DJ1206VN | Diffusion Furnace | 1 | 300mm | 01.09.2004 |
96451 | HIKE | DJ1223VN CX3 | Diffusion Furnace | 1 | 300mm | 01.08.2004 |
96452 | HIKE | DJ1223VN CX3 | Diffusion Furnace | 1 | 300mm | 01.10.2003 |
96453 | HIKE | DJ1223VN CX3 | Diffusion Furnace | 1 | 300mm | 01.09.2003 |
96454 | HITACHI | I6300 | Defect Inspection and Review System | 1 | 200mm | 01.02.2006 |
96455 | HITACHI | S9380-2 | CD SEM | 1 | 300mm | 01.05.2013 |
96456 | KLA-Tencor | ARCHER10XT | Overlay Measurement | 1 | 300mm | 01.11.2003 |
96457 | KLA-Tencor | ARCHER10XT-PLUS | Overlay Measurement | 1 | 300mm | 01.09.2006 |
96458 | KLA-Tencor | DISCOVERY3 | Defect Inspection and Review System | 1 | 300mm | 01.07.2011 |
96459 | KLA-Tencor | SFX100 | Surface film measurement system | 1 | 300mm | 01.07.2004 |
96460 | KLA-Tencor | P2H | Profileometer | 1 | 200mm | 01.05.1992 |
96461 | LAM Research | 2300FLEX45 | Dielectric Etch Process | 1 | 300mm | 01.07.2007 |
96462 | LAM Research | 2300FLEX45 | Dry Etch | 1 | 300mm | 01.11.2007 |
96463 | LAM Research | 2300FLEX45 | Dry Etch | 1 | 300mm | 01.12.2007 |
96464 | LAM Research | 2300FLEX45 | Dry Etch | 1 | 300mm | 01.12.2008 |
96465 | LAM Research | 2300FLEX45 | Dry Etch | 1 | 300mm | 01.08.2013 |
96466 | LAM Research | 2300FLEX45 | Dry Etch | 1 | 300mm | 01.09.2013 |
96467 | LAM Research | 2300KIYO45 | Dry Etch | 1 | 300mm | 01.01.2011 |
96468 | LAM Research | 2300KIYO45 | Dry Etch | 1 | 300mm | 01.01.2011 |
96469 | LAM Research | 2300KIYO45 | Dry Etch | 1 | 300mm | 01.09.2010 |
96470 | LAM Research | 2300KIYO45 | Dry Etch | 1 | 300mm | 01.05.2013 |
96471 | LAM Research | ALTUS | Tungsten CVD | 1 | 300mm | 01.09.2001 |
96472 | LAM Research | FLEX GX E6 | Dielectric Etch Process | 1 | 300mm | 01.11.2008 |
96473 | LAM Research | FLEX GX E6 | Dielectric Etch Process | 1 | 300mm | 01.11.2008 |
96474 | LAM Research | TORUS300S | Plasma etcher | 1 | 300mm | 01.10.2010 |
96475 | LAM Research | VECTOR-EXTREME | PECVD | 1 | 300mm | 01.07.2010 |
96476 | MATTSON | HELIOS | RTP System | 1 | 300mm | 01.06.2006 |
96477 | MATTSON | HELIOS | RTP System | 1 | 300mm | 01.12.2006 |
96478 | MATTSON | HELIOS | RTP System | 1 | 300mm | 01.10.2006 |
96479 | MATTSON | HELIOS | RTP System | 1 | 300mm | 01.07.2007 |
96480 | MATTSON | PARADIGME SI | Light Etch | 1 | 300mm | 01.05.2011 |
96481 | MATTSON | PARADIGME SI | Light Etch | 1 | 300mm | 01.03.2011 |
96482 | MATTSON | SUPREMA | Plasma Dry Strip | 1 | 300mm | 01.10.2011 |
96483 | MATTSON | SUPREMA IM | Plasma Dry Strip | 1 | 300mm | 01.05.2012 |
96484 | MATTSON | SUPREMA IM | Plasma Dry Strip | 1 | 300mm | 01.09.2011 |
96485 | MATTSON | SUPREMA IM | Plasma Dry Strip | 1 | 300mm | 01.12.2011 |
96486 | MATTSON | SUPREMA IM | Plasma Dry Strip | 1 | 300mm | 01.06.2012 |
96487 | MATTSON | SUPREMA IM | Plasma Dry Strip | 1 | 300mm | 01.06.2012 |
96488 | MATTSON | SUPREMA IM | Plasma Dry Strip | 1 | 300mm | 01.06.2012 |
96489 | NANOMETRICS | ATLAS | Overlay Measurement | 1 | 200mm | 01.03.2005 |
96490 | NANOMETRICS | ATLAS | Overlay Measurement | 1 | 300mm | 01.10.2004 |
96491 | NANOMETRICS | CALIPER-ELAN ULTRA | Overlay Measurement | 1 | 300mm | 01.08.2006 |
96492 | NANOMETRICS | CALIPER-ELAN | Overlay Measurement | 1 | 300mm | 01.06.2005 |
96493 | NANOMETRICS | CALIPER-ELAN | Overlay Measurement | 1 | 300mm | 01.06.2005 |
96494 | NGR | NGR2150 | E-beam Wafer Inspection System | 1 | 300mm | 01.03.2010 |
96495 | NIKON | 2205I11D | I-Line Stepper | 1 | 200mm | 01.10.1995 |
96496 | NIKON | SF100 | I-line wafer scanner | 1 | 200mm | 01.05.2001 |
96497 | NIKON | SF120 | I-line wafer scanner | 1 | 300mm | |
96498 | NOVELLUS | GAMMA EXPRESS | Asher/Stripper | 1 | 300mm | 01.07.2004 |
96499 | NOVELLUS | L3500 | Asher/Stripper | 1 | 200mm | 01.10.1995 |
96500 | NOVELLUS | L3500 | Asher/Stripper | 1 | 200mm | 01.02.1996 |
96501 | NOVELLUS | VECTOR | PECVD | 1 | 300mm | 01.09.2012 |
96502 | PSK | SUPRA3 | Asher/Stripper | 1 | 300mm | 01.11.2006 |
96503 | PSK | TERA21 | Asher/Stripper | 1 | 300mm | 01.06.2004 |
96504 | PSK | TERA21 | Asher/Stripper | 1 | 300mm | 01.11.2004 |
96505 | PSK | TERA21 | Asher/Stripper | 1 | 300mm | 01.07.2005 |
96512 | RUDOLPH | WS2500 | Wafer Inspection System | 1 | 200mm | 01.09.2003 |
96513 | RUDOLPH | WS2500 | Wafer Inspection System | 1 | 200mm | 01.06.2003 |
96506 | RUDOLPH | AXI-S | Macro Wafer Inspection | 1 | 300mm | 01.03.2004 |
96507 | RUDOLPH | MP1-300 | Film thickness measurement | 1 | 300mm | 01.01.2007 |
96508 | RUDOLPH | S3000A | Ellipsometer | 1 | 300mm | 01.05.2012 |
96509 | RUDOLPH | S3000A | Ellipsometer | 1 | 300mm | 01.06.2012 |
96510 | RUDOLPH | WS2500 | Wafer Inspection System | 1 | 200mm | 01.08.2002 |
96511 | RUDOLPH | WS2500 | Wafer Inspection System | 1 | 200mm | 01.03.2006 |
96514 | TEL Tokyo Electron | A303I | Diffusion Furnace | 1 | 300mm | 01.10.2003 |
96515 | TEL Tokyo Electron | ACT12 | Photoresist coater and developer track | 1 | 300mm | 01.03.2004 |
96516 | TEL Tokyo Electron | CERTAS | Single wafer Dry Cleaning System | 1 | 300mm | 01.11.2008 |
96517 | TEL Tokyo Electron | INDY | Diffusion Furnace | 1 | 300mm | 01.11.2004 |
96518 | TEL Tokyo Electron | INDY | Diffusion Furnace | 1 | 300mm | 01.02.2010 |
96519 | TEL Tokyo Electron | INDY | Diffusion Furnace | 1 | 300mm | 01.10.2006 |
96520 | TEL Tokyo Electron | INDY | Diffusion Furnace | 1 | 300mm | 01.03.2010 |
96521 | TEL Tokyo Electron | LITHIUS | Lithography Coater/Developer | 1 | 300mm | 01.07.2008 |
96522 | TEL Tokyo Electron | SCCM SHIN | Oxide Etcher | 1 | 300mm | 01.03.2007 |
96523 | TEL Tokyo Electron | TACTRAS VIGUS0 | Deep Etch Cluster Tool | 1 | 300mm | 01.06.2010 |
96524 | TEL Tokyo Electron | TRIAS HIGH K | Diffusion Furnace | 1 | 300mm | 01.05.2011 |
96525 | TEL Tokyo Electron | TRIAS-EX2 | Metal CVD | 1 | 300mm | 01.03.2014 |
96526 | TEL Tokyo Electron | VESTA | Plasma Etch System | 1 | 300mm | 01.02.2011 |
96527 | TERA SEMICON | TERA300CA | Diffusion Furnace | 1 | 300mm | 01.05.2012 |
96528 | TES | CHALLENGER HT PLUS | CVD | 1 | 300mm | 01.12.2013 |
96529 | WONIK IPS | MAHA | CVD | 1 | 300mm | 01.07.2013 |
96530 | WONIK IPS | AKRA | Metal CVD | 1 | 300mm | 01.01.2014 |
96531 | WONIK IPS | AKRA | Metal CVD | 1 | 300mm | 01.09.2010 |
96532 | WONIK IPS | AKRA | Metal CVD | 1 | 300mm | 01.10.2010 |
96533 | WONIK IPS | MAHA SP | CVD | 1 | 300mm | 01.09.2011 |
Finally for this month, here follows the list of all the equipment owned by SDI_Fabsurplus which we currently have for sale:-
54226 | Accretech TSK | MHF300L | Test head manipulators | 1 | 200 mm | 01.06.1999 |
95398 | Accretech TSK | MHF300L | Test head manipulators | 1 | 200 mm | 01.06.1999 |
95399 | Accretech TSK | MHF300L | Test head manipulators | 1 | 200 mm | 01.06.1999 |
95400 | Accretech TSK | MHF300L | Test head manipulators | 1 | 200 mm | 01.06.1999 |
95401 | Accretech TSK | MHF300L | Test head manipulators | 1 | 200 mm | 01.06.1999 |
95402 | Accretech TSK | MHF300L | Test head manipulators | 1 | 200 mm | 01.06.1999 |
95403 | Accretech TSK | MHF300L | Test head manipulators | 1 | 200 mm | 01.06.1999 |
76604 | ADVANTEST | TR6846 | Digital Multimeter | 1 | 200 mm | |
78639 | Advantest | T5335P (Spares) | Spare Boards from test system (See attached list for details) | 1 | TEST | 01.12.1997 |
87652 | Advantest | T5371 | Test system (With a single test head ) | 1 | Test | |
89909 | Advantest | Hifix for PQFP80 (14 x 20) | Hi-fix for Advantest T5371 package type PQFP80 (14 x 20) | 1 | Spares | 01.06.2005 |
92009 | Advantest | T5335P | Boards from an Advantest T5335P Test system | 18 | spares | |
76605 | Agilent | 41501B | SMU and PGU 2 units | 1 | 200 mm | 01.06.2001 |
79588 | Agilent | 1671G | Logic Analyzer | 1 | test | 01.10.2007 |
79589 | Agilent | 1671G | Logic Analyzer | 1 | test | 01.10.2008 |
2669 | ANGELANTONI | T600 TU5 | BAKE OVEN | 1 | FACILITIES | 01.08.1995 |
10637 | Angelantoni | T600 TUS | Clean Room Oven | 1 | FACILITIES | 01.06.1995 |
34740 | AP & S | TwinStep-B H3P04 | Semi-Automatic H3PO4 2 stage Megasonic QDR | 1 | 200 mm | 01.11.2005 |
3419 | Applied Materials | P5000 | CVD System, 2 Chamber TEOS Oxide CVD | 1 | 200 MM | 01.01.1994 |
11568 | Applied Materials | 0020-0323 REV H | Heat Exchanger | 1 | FACILITIES | |
83514 | Applied Materials | Opal 7830i Enhanced | CD-SEM | 1 | 200 mm | 01.06.1997 |
84765 | Asyst | 1150-V1315S | SMIF Load port 150mm | 1 | 150 MM | |
95404 | Asyst | 1150-V1315S | SMIF Load port 150mm | 1 | 150 MM | |
54859 | Baccini | 35MW Solar Cell Line | Solar Cell Print line for Mono or Poly Crystalline Solar Cells | 1 | 156 mm | 01.12.2005 |
77009 | Baccini | Screen Printer 2 | screen printer | 1 | 156 mm | 01.06.2001 |
77010 | Baccini | Screen Printer 3 | screen printer | 1 | 156 mm | 01.11.2001 |
77013 | Baccini | CHIP AND CRACK CAMERA | Chip and Crack camera | 1 | 156 mm | 01.06.2007 |
77017 | Baccini | Cell electrical tester | Electrical Cell tester | 1 | 156 mm | 01.06.2006 |
77021 | Baccini | Dryer 1 | Dryer 1 | 1 | 156 mm | 01.11.2001 |
77022 | Baccini | Dryer 2 | Dryer 1 | 1 | 156 mm | 01.11.2001 |
52164 | Canon | FPA 3000 (Spares) | ALS System for FPA 3000 series | 1 | spares | 01.07.1999 |
68025 | Canon | FPA 5000 ES2+ | 248 nm lithography exposure system | 1 | 200 mm (300 mm also possible with conversion kit) | 01.06.2000 |
56140 | CentroTherm | DO 12.000-200-FF-HTO-CAN-NT4.0 | Fast Firing Funace with Dryer | 1 | 156mm | 01.06.2001 |
56144 | Centrotherm | Centronic E2000 | Horizontal diffusion furnace for POCl3 doping | 1 | 156 mm | 01.06.2003 |
80083 | COLUSSI | UG 50 E | AUTOCLAVE FOR STERILIZATION | 1 | Laboratory | 01.06.2000 |
78638 | Credence | Duo SX (Spare Parts) | SPARE PARTS FROM AUTOMATED TEST SYSTEM | 1 | test | |
87089 | Credence | Personal Kalos I | Test system | 1 | TEST | 01.11.2002 |
79586 | DATA IO | UNISITE 68 | EPROM PROGRAMMER WITH USPIN 84 | 1 | test | 01.06.2005 |
77666 | Digital Analysis | PH10 Adjustment system | PH Adjustment system | 1 | ||
79394 | Ebara | A30W | Vacuum Pump | 1 | Pump | |
79395 | Ebara | A30W | Vacuum Pump | 1 | Pump | |
89967 | Ebara | ET300WS | Turbo pump | 1 | Pump | 01.06.1997 |
95410 | Ebara | 305W | Turbo pump controller | 1 | Pump | 01.06.1996 |
95411 | Ebara | 305W | Turbo pump controller | 1 | Pump | 01.06.1996 |
95413 | Ebara | ET300WS | Turbo pump | 1 | Pump | 01.06.1997 |
95414 | Ebara | ET300WS | Turbo pump | 1 | Pump | 01.06.1997 |
95415 | Ebara | ET300WS | Turbo pump | 1 | Pump | 01.06.1997 |
95416 | Ebara | ET300WS | Turbo pump | 1 | Pump | 01.06.1997 |
95417 | Ebara | ET300WS | Turbo pump | 1 | Pump | 01.06.1997 |
95418 | Ebara | ET300WS | Turbo pump | 1 | Pump | 01.06.1997 |
95419 | Ebara | 306W | Turbo pump controller | 1 | Pump | 01.06.1997 |
95420 | Ebara | 306W | Turbo pump controller | 1 | Pump | 01.06.1997 |
95421 | Ebara | 305W | Turbo pump controller | 1 | Pump | 01.06.1997 |
80052 | EDA Industries | PCBA 05568 REV 1.3 | Pattern test Driver module for BIB oven with 3 x PSU | 1 | Reliability | |
54214 | Edwards | iQDP80 / QMB1200 | Dry Vacuum Pump combo | 1 | pump | 01.06.2000 |
54216 | Edwards | iQDP80 / QMB1200 | Dry Vacuum Pump combo | 1 | pump | 01.06.2000 |
54217 | Edwards | iQDP80 / QMB1200 | Dry Vacuum Pump combo | 1 | pump | 01.04.2007 |
54218 | Edwards | iQDP80 / QMB1200 | Dry Vacuum Pump combo | 1 | pump | 01.04.2007 |
54219 | Edwards | iQDP80 / QMB1200 | Dry Vacuum Pump combo | 1 | pump | 01.04.2007 |
54220 | Edwards | QDP80 + QMB 250F | Dry Vacuum Pump combo | 1 | pump | 01.06.2000 |
54221 | Edwards | QDP80 + QMB 250F | Dry Vacuum Pump combo | 1 | pump | 01.06.2000 |
54222 | Edwards | QDP80 | Dry Vacuum Pump | 1 | pump | 01.06.2000 |
54524 | Edwards | iQDP80 | Dry Vacuum Pump | 1 | pump | 01.01.2000 |
81822 | Edwards | E2M40 FSPX | Rotary Vacuum Pump with oil filter | 1 | Pump | 01.06.1989 |
89969 | Edwards | D150 | Dual GRC unit | 1 | Facilities | 01.06.1996 |
95412 | Edwards | D150 | Dual GRC unit | 1 | Facilities | 01.06.1996 |
95559 | Edwards | iQDP40 | Dry Mechanical Pump | 1 | Pump | 01.06.2000 |
95560 | Edwards | iQDP80 | Dry Mechanical Pump | 1 | Pump | 01.06.2000 |
78132 | Electroglas | Horizon 4085X | Prober with an inker | 1 | 200 mm | 01.02.1998 |
92047 | ELES | ART 200 | Burn In Board testing system | 1 | Reliability | 01.06.2011 |
79596 | Elind | KL 1200W | Laboratory Power supply | 8 | Electronics Test and Measurement | 01.06.2000 |
79885 | Elind | 3232 | power supply 0-3,2A current adj – 0 – 32 V voltage adj | 1 | Electronics Test and Measurement | |
79887 | elind | 328 | power supply 0-0,8A current adj – 0 – 32 V voltage adj | 1 | Lab Equipment | 01.06.1995 |
83513 | Entegris | RSPX-EUV-036 | EUV Reticle stocker | 1 | Facilities | 01.08.2010 |
83739 | ESI | 44 | LASER TRIMMER SPARE PARTS | 1 | SPARES | |
83515 | Extraction Systems | TMB 150 | Photoresist Contamination Monitor System / Total Amine Analyzer | 1 | Facilities | 01.06.2004 |
1557 | FORTREND | F6000QS | 6 INCH WAFER TRANSFER | 1 | 6 INCH | 01.06.1992 |
95405 | Fortrend | F6000QS | 6 INCH WAFER TRANSFER | 1 | 6 INCH | 01.06.1992 |
83516 | FSI | Polaris 3500 (Spares) | Spares for DUV photoresist coater / developer track | 1 | spares | 01.06.2000 |
79600 | Gigi Molina Brevetti Plastici SpA | Custom | Manual wet hood | 1 | UP TO 200 mm | 01.06.2000 |
95406 | Gigi Molina Brevetti Plastici SpA | Custom | Manual wet hood | 1 | UP TO 200 mm | 01.06.2000 |
95407 | Gigi Molina Brevetti Plastici SpA | Custom | Manual wet bench | 1 | UP TO 200 mm | 01.06.2000 |
76735 | GL Automation | IDSCOPE | Wafer bar code reader | 1 | 200 mm | 01.07.2004 |
76736 | GL Automation | IDSCOPE | Wafer bar code reader | 1 | 200 mm | 01.07.2004 |
76737 | GL Automation | IDSCOPE | Wafer bar code reader | 1 | 200 mm | 01.07.2004 |
76738 | GL Automation | IDSCOPE | Wafer bar code reader | 1 | 200 mm | 01.07.2004 |
76739 | GL Automation | IDSCOPE | Wafer bar code reader | 1 | 200 mm | 01.09.2004 |
79892 | Gossen Konstanter | IEC625 | Power supply Gossen Konstanter UOP | 1 | Electronics Test and Measurement | |
71907 | Hamamatsu | C7103 | PC Controlled IC Back-side Lapping and Wafer Grinding System | 1 | 200 mm and packages | 01.10.2001 |
36259 | HITACHI | S-9300 | SEM – CD (CRITICAL DIMENSION) | 1 | 200 mm | 01.06.2005 |
95722 | HITACHI | S9300 | SEM – CD (CRITICAL DIMENSION) | 1 | 300 mm | 01.06.2005 |
56141 | Innolas | ILS 700P | Laser Edge Isolation | 1 | 156mm | 01.06.2005 |
56310 | Jonas and Redmann | Q2 WHD A | Loader for Centrotherm E2000 furnace | 1 | 156 mm and 125 mm | 01.06.2003 |
79595 | K Tech Engineering | BK04A | Blister tape applicator for microelectronic components | 1 | Assembly | 01.06.2010 |
76802 | KEITHLEY | 487 | PICO AMMETER | 1 | Electronics Test and Measurement | |
90664 | KLA-TENCOR | Candela CS20 | Wafer Inspection System | 1 | 200 mm | 01.12.2006 |
1680 | KLA-TENCOR | 2132 | bright-field WAFER INSPECTION | 1 | 200 mm | 01.08.1995 |
71632 | KLA-TENCOR | 2122 | WAFER DEFECT INSPECTION | 1 | 200 mm | |
76682 | KLA-TENCOR | AIT UV | Dark field wafer particle inspection system | 1 | 200 mm | 01.10.2003 |
2873 | LAM RESEARCH | 4520 (spares) | REMOTE CART | 1 | FACILITIES | 01.01.1995 |
95408 | LAM RESEARCH /ONTRACK | 4520 (spares) | REMOTE CART | 1 | FACILITIES | 01.01.1995 |
15066 | LAMBDA PHYSIK | Novaline K2005 | EXCIMER LASER | 1 | facilities | 01.07.2002 |
33542 | Liebherr | FKV 3610 | Fridge for photoresist | 1 | facilities | |
79571 | Mazzali | Climatest C320G5 | Temperature and humidity testing chamber | 1 | Reliability | 01.06.1993 |
79572 | Mazzali | Climatest C320G5 | Temperature and humidity testing chamber | 1 | Reliability | 01.06.1993 |
80038 | MDA Scientific | System 16 | Toxic Gas Monitor | 1 | 01.07.2001 | |
4007 | MDC (Materials Development Corp.) | DUO CHUCK CSM16 | CV Measurement system | 1 | 150 mm | 01.06.1995 |
71902 | Microcontrol | MWE Plus | UV Wafer Eraser with cassette loading | 1 | 200 mm , 150 mm, 125 mm | 01.06.2000 |
79592 | Minato Electronics | 1940 | EPROM Programmer with additional memory | 1 | Electronics Test and Measurement | 01.06.2007 |
79593 | Minato Electronics | 1940 | EPROM Programmer | 1 | Electronics Test and Measurement | 01.06.2005 |
72156 | MRL | Black Max | Black max heater element, 850 celcius | 1 | Spares | 01.12.2006 |
77665 | Neslab | HX-2000 | 75 KW Recirculating Chiller | 1 | chiller | 01.09.2001 |
71760 | Oxford Plasma Technology | DP80 | PE CVD | 1 | 01.12.1989 | |
31246 | PMS | Liquitrack 776200 | Non volatile residual Monitor | 1 | facilities | 01.11.1999 |
54210 | Poly Design Inc. | Custom | Heated Quartz Boat storage / drying system | 1 | 200 mm | 01.06.2005 |
77670 | Rasco | BCU-750 | Brine Chiller | 1 | ||
57773 | Rena | Etcher | In-Line Etching System | 1 | Solar | 01.06.2005 |
53053 | Rorze | RR04L90 | Robot | 1 | spares | 01.07.1995 |
56813 | Roth & Rau | SiNA Plus | PECVD – Deposition of Silicon Nitride | 1 | 156 mm SQUARE/125 MM | 01.06.2005 |
76973 | Roth & Rau | Chiller | Chiller | 1 | 01.06.2005 | |
79602 | Salon Teknopaja OY | PWB | Printed Wire Board Level Drop Tester with Solder Joint Reliability tester | 1 | SMT | 01.06.2004 |
79889 | Sanitas EG | Multilevel | EPROM Programmer | 1 | Electronics Test and Measurement | |
86303 | Sankei Giken | TCW-12000 CV | Process Module Chiller | 1 | Facilities | 01.08.1996 |
69878 | SEIKO SEIKI | STP 1000C | TURBO PUMP TMP 100C 250 ISO-K/KF40 | 1 | VACUUM PUMP | 01.11.1999 |
20268 | SEKISUI | VANTEC SIGMA 200 K1 | Antistatic 200 MM Wafer shipping box | 9500 | 200 mm | 01.07.2006 |
54208 | Seminet | Infinity SACS 251216-120-CE | Semi-Automatic Carousel Boxed Reticle Stocker | 1 | facilities | 01.11.2007 |
84342 | Semitool | ST-921R-AA | Spin Rinse Dryer | 1 | ||
84351 | Semitool | ST-240 | Spin Rinse Dryer | 1 | ||
84364 | Semitool | PA7230M | SRD Rotor | 1 | ||
84365 | Semitool | A72-20M | SRD Rotor | 1 | ||
76610 | SHOWA | 341 | Laboratory Power Supply – 4 channel | 1 | 200 mm | 01.06.1998 |
76611 | SHOWA ELECTRONICS | 511-16 | REGURATED DC POWER SUPPLY | 1 | laboratory | |
87607 | SMC | INR-341-59A | DUAL CHILLER | 1 | Facilities | 01.05.1996 |
89968 | SMC | INR-341-61A | Triple Loop Chiller | 1 | Facilities | |
73208 | Solitec | 5110 | Spin Coater | 1 | 3 to 6 inch | 01.10.1998 |
83505 | SORENSEN | 220 VOLTS | POWER SUPPLY | 3 | 220 VOLTS | 01.12.1994 |
71904 | ST Automation | test head | test head for Eprom U 1835 | 1 | ||
71908 | ST Automation | PTM1 | Flash Memory Tester | 3 | Test | |
71910 | ST Automation | MT32 | Flash Memory Test System | 1 | TEST | 01.06.2008 |
78133 | ST Automation | QT200 | Test System | 1 | test | 01.06.2007 |
78137 | ST Automation | QT200 | Tester System with monitor | 1 | test | |
78138 | ST Automation | R.S.V. | ST Memory Test System Electronic Automation | 1 | test | 01.04.2007 |
80177 | ST Automation | QT200 | Automated Tester System with monitor | 1 | test | 01.10.2007 |
80178 | ST Automation | QT200 | Automated Tester System with monitor | 1 | test | 01.10.2007 |
80179 | ST Automation | QT200 | Automated Tester System with monitor | 1 | test | 01.10.2007 |
80180 | ST Automation | QT200 | Automated Tester System with monitor | 1 | test | 01.10.2007 |
80181 | ST Automation | QT200 | Automated Tester System with monitor | 1 | test | 01.10.2007 |
80182 | ST Automation | QT200 | Automated Tester System with monitor | 1 | test | 01.10.2007 |
80183 | ST Automation | QT200 | Automated Tester System with monitor | 1 | test | 01.10.2007 |
80184 | ST Automation | QT200 | Automated Tester System with monitor | 1 | test | 01.10.2007 |
86281 | ST Automation | QT200 (spares) | boards from qt 200 test system – see attached list | 1 | Spare Parts | |
95233 | ST Automation | MT 32 SX | Fully Automated Memory Test System for BIST and NAND Memories | 1 | TEST | 01.12.2005 |
79584 | STS | 320 PC | Reactive Ion Etcher | 1 | 200 mm | 01.06.1995 |
33413 | SYNAX | SX3100 | Handler Ambient/Hot | 1 | test | 01.06.2006 |
33414 | SYNAX | SX3100 | Handler | 1 | test | 01.06.2006 |
79888 | System General | T9600 | Universal Device Programmer | 1 | Electronics Test and Measurement | 01.06.2003 |
78136 | Sytrama | MTM 32 V01 | ST Test Head Manipulator QT 124 | 1 | 01.12.2005 | |
80089 | Sytrama | MTM 32 V01 | ST Test Head Manipulator QT 124 | 1 | 01.12.2005 | |
76613 | Tektronix | TDS694C | Digital 3 GHz real-time oscilloscope | 1 | Electronics Test and Measurement | 01.08.2007 |
79590 | Tektronix | TDS 544A | Color 4 channel digitizing oscilloscope | 1 | Electronics Test and Measurement | 01.06.2006 |
79597 | Tektronix | PS 280 | DC Power supply | 1 | Electronics Test and Measurement | 01.06.2007 |
79599 | Tektronix | 11801C | Digital Sampling Oscilloscope | 1 | Electronics Test and Measurement | 01.02.2001 |
79601 | Tektronix | 2432A | Digital Oscilloscope, 2 channel, with GPIB | 1 | Electronics Test and Measurement | |
2181 | TEL TOKYO ELECTRON | TE 5480 | Nitride Plasma Reactive Ion Etch | 1 | 150 mm | 01.12.1992 |
21064 | TEL TOKYO ELECTRON | MB2 730 HT HT | CVD SYSTEM, 2 CHAMBER WSi Process | 1 | 200 mm | 01.09.1996 |
21270 | TEL TOKYO ELECTRON | MB2 730HT | CVD SYSTEM, 3 CHAMBER WSi Process | 1 | 200 mm | 01.09.1996 |
78124 | TEL TOKYO ELECTRON | P8 | Wafer Prober | 1 | 200 MM | 01.09.1996 |
78131 | TEL TOKYO ELECTRON | P8XL | Fully Automatic Wafer Prober (Gold Chuck) | 1 | 200 MM | 01.09.2000 |
54232 | Teradyne | J994 | Memory Tester | 1 | test | 01.06.2000 |
78361 | Teradyne | J971SP (Spares) | Boards from VLSI test system | 1 | Test | 01.02.1997 |
87615 | United Detector Technology, Inc. | 40X | Laser Power Meter | 1 | Test | 01.06.1992 |
84082 | Varian | Turbo-V 250 MacroTorr | Turbo Pump DN ISO 100 Type | 1 | Pump | 01.06.1999 |
92468 | Varian | E11040440 Rev 7 | Secondary workstation for implanter | 1 | Spares | 01.08.1995 |
95409 | Varian | Turbo-V 250 MacroTorr | Turbo Pump DN ISO 100 Type | 1 | Pump | 01.06.1999 |
87651 | Verigy / Agilent | V6000e | Test system | 1 | Test | 01.06.2008 |
15619 | VERTEQ | FLUOROCARBON RD4500 CLASSIC | SRD | 2 | 100 mm | 01.05.1986 |
79594 | Vision Engineering | Dynascope | Inspection Microscope | 1 | Assembly | 01.06.1995 |
80238 | Weiss | TS130 | Thermal shock testing chamber | 1 | Reliability | 01.06.1995 |
Wanted Items:-
-ASML 1900i immersion scanner
-Biorad QS 500
-KLA-Tencor RS 75
-Whole TFT line for Glass Size 1100 x 1250 mm
Yours sincerely,
SDI Fabsurplus Group
Stephen Howe
Company Owner
email: info@fabsurplus.com
Mobile (USA) : +1 830-388-1071
Mobile (Italy) : +39 335-710-7756
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