Please find below an alphabetically ordered list of used semiconductor manufacturing equipment , test equipment, assembly equipment and SMT equipment we have for sale, updated in real time on fabsurplus.com via the SDI worldwide "DataNET".
SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time |
---|---|---|---|---|---|---|---|---|
108645 | 8 inch / 6 inch | Partial | Bumping Wafer Fab Line | 150 mm / 200 mm | 01.06.2005 | 79 | as is where is | immediately |
91559 | RUDOLPH | AXI_S | Macro Inspection System | 300 mm | 31.05.2005 | 1 | as is where is | |
91560 | RUDOLPH | AXI_S | Macro Inspection System | 300 mm | 31.05.2005 | 1 | as is where is | |
91561 | RUDOLPH | AXI_S | Macro Inspection System | 300 mm | 31.05.2006 | 1 | as is where is | |
91563 | RUDOLPH | Meta Pulse | Film Metrology | 200 mm | 31.05.2005 | 1 | as is where is | |
91566 | Rudolph | WS3840 | 3D Bump Metrology | 300 mm | 31.05.2010 | 1 | as is where is | immediately |
91567 | RUDOLPH | META PULSE 200 | Surface Film Metrology | 200 mm | 31.05.2002 | 1 | as is where is | immediately |
94478 | RUDOLPH | FE-3 | Focus Ellipsometer | 200 mm | 1 | as is where is | ||
94479 | RUDOLPH | FE-4D | Focus Ellipsometer | 200 mm | 1 | as is where is | ||
98296 | RUDOLPH | Meta Pulse 300 | Film thickness measurement | 300 mm | 1 | as is where is | ||
98297 | RUDOLPH | Meta Pulse 300 | Film thickness measurement | 300 mm | 1 | as is where is | ||
98298 | RUDOLPH | MP1-300 | Film thickness measurement | 300 mm | 31.05.2007 | 1 | as is where is | |
98835 | RUDOLPH | AXI-S | Macro Wafer Inspection | 300 mm | 01.06.2004 | 1 | as is where is | immediately |
98837 | RUDOLPH | MP1-300XCU | Film Thickness Measurement System | 300 mm | 30.04.2008 | 1 | as is where is | immediately |
100928 | RUDOLPH | AXI-S | Macro Inspection System | 300 mm | 31.05.2003 | 1 | as is where is | |
100929 | RUDOLPH | FE-7 | Ellipsometer | 200 mm | 31.05.1996 | 1 | as is where is | |
100930 | RUDOLPH | MP300 | Film thickness measurement | 200 mm | 31.05.2007 | 1 | as is where is | |
100931 | RUDOLPH | MP300 | Film thickness measurement | 200 mm | 31.05.2009 | 1 | as is where is | |
100932 | RUDOLPH | S3000A | Focused Beam Ellipsometer | 200 mm | 31.05.2012 | 1 | as is where is | |
103553 | RUDOLPH | AXI-S | Macro Inspection | 300 mm | 31.05.2004 | 1 | as is where is | |
103554 | RUDOLPH | AXI935D | AVI | 300 mm | 1 | as is where is | ||
103555 | RUDOLPH | MP3 300XCU | FLIM THICKNESS MEASUREMENT SYSTEM | 300 mm | 1 | as is where is | immediately | |
106420 | Rudolph | NSX 115 | Automated Defect Inspection | 200 mm | 1 | as is where is | immediately | |
106421 | Rudolph | NSX 95 | Automated Macro Defect Inspection | 150 mm/200 mm | 1 | as is where is | immediately | |
106422 | Rudolph | NSX-105 | Automated Defect Inspection | 150 mm/200 mm | 1 | as is where is | immediately | |
106424 | Rudolph | NSX-95 | Automated Macro Defect Inspection | 150 mm/200 mm | 1 | as is where is | immediately | |
106425 | Rudolph | NSX-95 | Manual Macro Wafer Defect Inspection | 150 mm/200 mm | 1 | as is where is | immediately | |
106715 | RUDOLPH | MP3_300A | METAL THICKNESS MEASUREMENT | 300 mm | 01.06.2012 | 1 | as is where is | |
106716 | RUDOLPH | MP-300 | Film thickness measurement | 300 mm | 01.06.2005 | 1 | as is where is | |
106717 | RUDOLPH | MP1-300 | Film Thickness Measurement | 300 mm | 01.06.2003 | 1 | as is where is | |
106718 | RUDOLPH | MP1-300 | Film Thickness Measurement | 300 mm | 1 | as is where is | ||
106719 | RUDOLPH | MP1-300XCU | Film thickness measurement system | 300 mm | 01.06.2008 | 1 | as is where is | |
106720 | RUDOLPH | NSX 105 | MACRO DEFECT INSPECTION SYSTEM | 300 mm | 01.06.2008 | 1 | as is where is | immediately |
106721 | RUDOLPH | S3000A | FBE(focused beam laser ellipsometry) | 300 mm | 01.06.2010 | 1 | as is where is | |
106722 | RUDOLPH | S3000A | FBE(focused beam laser ellipsometry) | 300 mm | 01.06.2011 | 1 | as is where is | |
106723 | RUDOLPH | S3000A | FBE(focused beam laser ellipsometry) | 300 mm | 1 | as is where is | ||
106724 | RUDOLPH | S3000A | FBE(focused beam laser ellipsometry) | 300 mm | 01.06.2011 | 1 | as is where is | |
106725 | RUDOLPH | S3000S | FBE(focused beam laser ellipsometry) | 300 mm | 01.06.2010 | 1 | as is where is | |
106726 | RUDOLPH | S3000S | FBE(focused beam laser ellipsometry) | 300 mm | 1 | as is where is | ||
106727 | RUDOLPH | WS2500 | Wafer Inspection System | 200 mm | 01.06.2003 | 1 | as is where is | |
106728 | RUDOLPH | WS2500 | Wafer Inspection System | 200 mm | 01.06.2003 | 1 | as is where is | |
106729 | RUDOLPH | WS2500 | Wafer Inspection System | 200 mm | 01.06.2006 | 1 | as is where is | |
106730 | RUDOLPH | WS2500 | Wafer Inspection System | 200 mm | 01.06.2002 | 1 | as is where is | |
106731 | RUDOLPH | WV320 | Macro Inspection | 300 mm | 01.06.2006 | 1 | as is where is | |
106732 | RUDOLPH | MP200 | Film thickness measurement | 200 mm | 01.06.2003 | 1 | as is where is | |
106733 | RUDOLPH | MP200 | Film thickness measurement | 200 mm | 01.06.1999 | 1 | as is where is | |
106734 | RUDOLPH | WV320 | Macro Defect Inspection System | 300 mm | 1 | as is where is | ||
106735 | RUDOLPH | WV320 | Macro Defect Inspection System | 300 mm | 1 | as is where is | ||
106831 | Rudolph | MP200XCU | Cu Film thickness measurement | 200mm | 1 | inquire | ||
106832 | Rudolph | MP300 | Metal Film thickness measurement | 300mm | 1 | inquire | ||
106833 | Rudolph | MP300 XCu | Cu Film thickness measurement | 300mm | 2 | inquire | ||
106871 | RUDOLPH | NSX 105 | Automated Wafer, Die and Bump Inspection System | 300 mm | 01.06.2008 | 1 | as is where is | immediately |
108034 | RUDOLPH | AXI-S930B | Macro Defect Inspection | 300 mm | 01.01.2007 | 1 | as is where is | |
108195 | RUDOLPH | META PULSE 200 | Film thickness measurement | 200 mm | 01.06.1999 | 1 | as is where is | |
108196 | RUDOLPH | META PULSE 200 | Film thickness measurement | 200 mm | 01.06.2005 | 1 | as is where is | |
108197 | RUDOLPH | META PULSE 200X CU | Film thickness measurement (Including HDD) | 200 mm | 01.06.2003 | 1 | as is where is | |
108198 | RUDOLPH | META PULSE 200X CU | Film thickness measurement (Including HDD) | 200 mm | 01.06.2001 | 1 | as is where is | |
108199 | RUDOLPH | META PULSE II 200X CU | Film thickness measurement | 200 mm | 01.06.2008 | 1 | as is where is | |
108200 | RUDOLPH | MP200 | Film thickness measurement | 200 mm | 01.06.2002 | 1 | as is where is | |
108482 | Rudolph | Axi 935 | Macro-Defect | 1 | as is where is | |||
108483 | Rudolph | Matrix S-300 | Ellipsometer | 300 mm | 1 | as is where is | ||
108484 | Rudolph | MetaPULSE 300 | Film Thickness Measurement System | 300 mm | 3 | as is where is | ||
108485 | Rudolph | NSX 105 | Macro-Defect | 300 mm | 8 | as is where is | ||
108587 | RUDOLPH | WV320 | Wafer Inspection System | 300mm | 1 | as is where is | immediately | |
108711 | Rudolph | Sonus 7800 | Acoustic Metrology and Defect Detection System | 300 MM | 01.06.2015 | 1 | inquire | |
109550 | Rudolph | AXI-S | Macro Defect Inspection System | 300 mm | 01.06.2006 | 1 | as is where is | immediately |
109570 | Rudolph | WaferView 320 | Macro Wafer Defect Inspection System | 300 mm | 1 | as is where is | immediately | |
110735 | Rudolph | MetaPulse 200 | Metal film measurement system | 150-200 mm | 01.06.2006 | 1 | as is where is | immediately |
110736 | Rudolph | MetaPulse 200X Cu | Metal film measurement system | 150-200 mm | 01.06.2006 | 1 | as is where is | immediately |
110759 | Rudolph | S300 Ultra II | METROLOGY | 300 mm | 1 | as is where is | immediately | |
110795 | Rudolph | S300D Ultra II | Thin Film Measurement Tool / Ellipsometer | 300 mm | 01.05.2005 | 1 | as is where is | immediately |