Please find below an alphabetically ordered list of used semiconductor manufacturing equipment , test equipment, assembly equipment and SMT equipment we have for sale, updated in real time on fabsurplus.com via the SDI worldwide "DataNET".
| SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time |
|---|---|---|---|---|---|---|---|---|
| 91526 | NANOMETRICS | Caliper Mosaic | Overlay | 300 mm | 31.05.2003 | 1 | as is where is | immediately |
| 91529 | NANOMETRICS | Caliper Mosaic | Overlay | 300 mm | 28.02.2010 | 1 | as is where is | immediately |
| 91530 | NANOMETRICS | NANOMETRICS 9-7200-0195E | Mask & Wafer Inspection | 200 mm | 1 | as is where is | ||
| 98289 | NANOMETRICS | CALIPER ULTRA | Mask & Wafer Inspection | 300 mm | 31.05.2005 | 1 | as is where is | |
| 98290 | NANOMETRICS | CALIPER ULTRA | Mask & Wafer Inspection | 300 mm | 31.05.2005 | 1 | as is where is | |
| 98291 | NANOMETRICS | CALIPER ULTRA | Mask & Wafer Inspection | 300 mm | 30.06.2006 | 1 | as is where is | immediately |
| 98480 | Nanometrics | 8000X | film thickness measurement | 150 mm | 2 | as is where is | immediately | |
| 98481 | Nanometrics | 8000Xse | film thickness measurement | 200 mm | 2 | as is where is | immediately | |
| 98482 | Nanometrics | Caliper Mosaic (Parts) | EFEM Module, including a Brooks Razor robot | 300 mm | 1 | as is where is | immediately | |
| 98483 | Nanometrics | Lynx EFEM | EFEM including a Kawasaki robot | 300 mm | 1 | as is where is | immediately | |
| 101585 | NANOMETRICS | CALIPER-ULTRA | Overlay Measurement | 300 mm | 30.06.2006 | 1 | as is where is | |
| 103544 | NANOMETRICS | CALIPER ELAN | Overlay | 300 mm | 31.05.2004 | 1 | as is where is | |
| 106179 | Nanometrics | 9000 | Nanospec Wafer Metrology film thickness measurement tool | 200 mm | 01.06.2005 | 1 | as is all rebuilt | immediately |
| 106706 | NANOMETRICS | CALIPER_ULTRA | Mask & Wafer Inspection | 300 mm | 01.06.2006 | 1 | as is where is | |
| 106823 | Nanometrics | Nanospec 9100 | Oxide film thickness measurement (PC missing) | 200 mm | 1 | as is where is | immediately | |
| 106959 | Nanometrics | 9000 (Spare Parts) | Spectroscopic Reflectometer | Spares | 01.06.2005 | 1 | as is where is | immediately |
| 106960 | Nanometrics | 9000 (Spare Parts) | Computer Nanometrics P/n 7200-2432 | Spares | 01.06.2005 | 1 | as is where is | immediately |
| 107027 | NANOMETRICS | Caliper Mosaic | Overlay measurement System | 300 mm | 01.08.2010 | 1 | inquire | immediately |
| 108186 | NANOMETRICS | CALIPER_MOSAIC | Overlay | 300 mm | 01.06.2001 | 1 | as is where is | |
| 108467 | Nanometrics | Tevet Trajectory T3 | Film Thickness Measurement System | 300 mm | 1 | as is where is | ||
| 109113 | Nanometrics | LynX 9010T | Optical CD Measurement (Scatterometry) system | 300 mm | 01.09.2008 | 1 | as is where is | immediately |