Please find below an alphabetically ordered list of used semiconductor manufacturing equipment , test equipment, assembly equipment and SMT equipment we have for sale, updated in real time on fabsurplus.com via the SDI worldwide "DataNET".
| SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time |
|---|---|---|---|---|---|---|---|---|
| 108645 | 8 inch / 6 inch | Partial | Bumping Wafer Fab Line | 150 mm / 200 mm | 01.06.2005 | 79 | as is where is | immediately |
| 106485 | Leica | LEICA INM20 | Microscope inspection station | 200 mm | 01.06.1995 | 1 | as is where is | immediately |
| 108171 | LEICA | INM100 | Microscope | 1 | as is where is | |||
| 108172 | LEICA | INM100 | Microscope | 1 | as is where is | |||
| 108173 | LEICA | INM100 | Microscope | 1 | as is where is | |||
| 108174 | LEICA | KENSINGTON 300901 | Wafer Inspection Microscope | 1 | as is where is | |||
| 108175 | LEICA | KENSINGTON 300901 | Wafer Inspection Microscope | 1 | as is where is | |||
| 108176 | LEICA | KENSINGTON 300901 | Wafer Inspection Microscope | 1 | as is where is | |||
| 108177 | LEICA | KENSINGTON 300901 | Wafer Inspection Microscope | 1 | as is where is | |||
| 108178 | LEICA | Polyvar SC | POLYVAR SCOPE | 1 | as is where is | |||
| 108179 | LEICA | Reichert POLYVAR SC | Wafer Inspection Microscope | 200 mm/300 mm | 01.06.2002 | 1 | as is where is | |
| 108180 | LEICA | Reichert-Jung, Kensington 300901 | Wafer Inspection Microscope | 1 | as is where is | |||
| 108181 | LEICA | Reichert-Jung, Kensington 300901 | Wafer Inspection Microscope | 1 | as is where is | |||
| 108182 | LEICA | Reichert-Jung, Kensington 300901 | Wafer Inspection Microscope | 1 | as is where is | |||
| 108183 | LEICA | Reichert-Jung, Kensington 300901 | Wafer Inspection Microscope | 1 | as is where is | |||
| 109211 | Leica | INS3300 | Macro-Defect | 300mm | 1 | as is where is | ||
| 109212 | Leica | INS3300 | Macro-Defect | 300mm | 1 | as is where is | ||
| 109213 | Leica | INS3300 | Macro-Defect | 300mm | 1 | as is where is | ||
| 111379 | Leica | INS3000 | Defect Inspection | 1 | as is where is | immediately | ||
| 111399 | Leica | M165C | Reflected light and transmitted light microscope | Assembly | 1 | as is where is | immediately | |
| 98485 | Nikon | Optiphot 150 | Microscope Inspection Station | 100/150mm | 3 | as is where is | immediately | |
| 84101 | Zeiss | Turret | Turret 4 position for Zeiss, Leica and others, good condition | 1 | as is where is | immediately |