Please find below an alphabetically ordered list of used semiconductor manufacturing equipment , test equipment, assembly equipment and SMT equipment we have for sale, updated in real time on fabsurplus.com via the SDI worldwide "DataNET".
SDI ID | Manufacturer | Model | Description | Version | Vintage | Q. ty | Sales Conditions | Lead Time |
---|---|---|---|---|---|---|---|---|
36564 | JEOL | CD-SEM, JSM-6340F | JEOL | 1 | inquire | |||
91422 | JEOL | JSM-5600 | FE SEM | 31.05.1999 | 1 | as is where is | ||
91424 | JEOL | JSM-6700F | FE SEM | 1 | as is where is | |||
106668 | JEOL | JWS-7500E | SCANNING ELECTRON MICROSCOPE | 200 mm | 1 | as is where is | ||
108164 | JEOL | JSM-6340F | FE Sem | 1 | as is where is | |||
108323 | JEOL | JFS-9855S | Focused Ion Beam System | 200mm | 01.05.2000 | 1 | as is where is | immediately |
108324 | JEOL | JWS-7555 | SEM - Defect Review (DR) | 200mm | 1 | as is where is | immediately | |
108822 | JEOL | JSM-6600F | Scanning Electron Microscope | 1 | inquire | |||
108907 | JEOL | JEM3200FS | High Resolution TEM | Laboratory | 01.05.2006 | 1 | as is where is | immediately |
109185 | JEOL | JEM-2010F | TEM | Laboratory | 1 | as is where is | ||
109186 | JEOL | JFS-9815 | Focused Ion Beam System | 200mm | 1 | as is where is | ||
109187 | JEOL | JSM-6400F | FE SEM | Laboratory | 1 | as is where is | ||
109188 | JEOL | JWS-7855S | Mask Inspection & Repair System | RETICLE | 1 | as is where is | ||
109558 | JEOL | JSM-7500F | SEM | Laboratory | 01.05.2009 | 1 | as is where is | immediately |
110627 | JEOL | JSM-6460LV | Scanning Electron Microscope | Laboratory | 1 | as is where is | ||
111356 | JEOL | jbx-3040mv | E-beam lithography system | 200 mm | 01.06.2006 | 1 | as is where is | immediately |