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Electroglas Horizon 4085X Fully Automatic Prober with Optem microscope and an inker for Sale


SDI fabsurplus.com is pleased to announce the availability of the following listed used Electroglas Horizon 4085X Fully Automatic Prober with Optem microscope and an inker.
Please click on the "Get Quote" button at the end of the Horizon 4085X description, if you'd like to get a quotation, photos and specifications of this Fully Automatic Prober with Optem microscope and an inker, and your request for this equipment will be forwarded to our SDI sales representatives automatically.
This Electroglas Horizon 4085X Fully Automatic Prober with Optem microscope and an inker is available for immediate sale.
Crating, refurbishment and delivery for this equipment can be quoted on request.


Electroglas Horizon 4085X Equipment Details

SDI ID: 78132
Manufacturer: Electroglas
Model: Horizon 4085X
Description: Fully Automatic Prober with Optem microscope and an inker
Version: 125 mm, 150 mm and 200 mm
Vintage: 01.01.1998
Quantity: 1
Sales Condition: as is where is
Lead Time: immediately
Sales Price: Inquire
Comments:

The Electroglas Horizon 4085X Automatic Wafer Prober System is a precision manufacturing
machine which moves wafers through the test process quickly, accurately, and safely. It is designed
to probe high-pin-count devices, performing with high accuracy in an enclosed clean
environment. Probing accuracy is certified to +/- 0.25 mil, required for probing small, densely
packed bond pads. Figure 1-1 illustrates the Horizon 4085X Wafer Prober System.
The Horizon 4085X is an operational Basic Unit and includes the components listed below.
The Basic Unit can operate alone, or it may be enhanced by adding any of the optional
equipment listed.

BASIC UNIT PARTS
Platen
Forcer Assembly
Z Drive Assembly
Standard Chuck
8" Ring Carrier
Power Control Module
Monitor Console, Keyboard,
and Joystick
Prober Vision Software
Material Handler Module
External Control I/O Interface
Auto Align Module
NonContact Edge Sensor
Disk Based System
Real Time Mapping
Wafer Mapping & SECS
Multi-Die Probing
Ink Dot Inspection
Probe Mark Inspection

OPTIONS
Thermal (Hot) Chuck
Ring Inserts
Clean Air Management System
Standard Machine Interface
Microscope
Optical Character Reader
Backside Bar Code Reader

SN: W493110074/153702

Ce marked

Dimensions: 160/180

Weight: 1000 kg

Chuck has temperature control.

 TRANS Component Tag – Standard

Has docking hardware to fit to an

AGILENT Tech 4062 Parametric Tester E-Test (The switching matrix is included - see photos)

Includes an optional "Optem"  HF Video Microscope with mount allowing for precise mechanical positioning in x and y , OPTEM P/N 28-90-77 mounted onto the HP4062 switching matrix unit situated on top of the prober. Microscope Optem P/N 28-90-39. Power supply/ Control units qty 2 Optem P/N 29-60-02.

-Has a wafer loader for dual 5, 6 or 8 inch cassettes, and also a single wafer loader for manually loading of single wafers.

Location: Avezzano (AQ) 67051 Italy

The prober is also fitted with an inker, which marks bad dies during the inspection.

Electrical units include: System 386 PC Controller RMHM4, Display Control Module DCM3, Prober Control Module PCM, Vision Module PRM3.


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The data provided herein is not an offer capable of acceptance.
The information contained on this page is, to our knowledge and information, accurate, but it may contain errors and therefore we do not warrant the completeness or accuracy of the information contained on this page.
Any offer by you to purchase the equipment described on this page shall be subject to our standard terms and conditions of sale.

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